{"id":"https://openalex.org/W4229802981","doi":"https://doi.org/10.1109/date.2004.1268909","title":"Early SEU fault injection in digital, analog and mixed signal circuits: a global flow","display_name":"Early SEU fault injection in digital, analog and mixed signal circuits: a global flow","publication_year":2004,"publication_date":"2004-06-21","ids":{"openalex":"https://openalex.org/W4229802981","doi":"https://doi.org/10.1109/date.2004.1268909"},"language":"en","primary_location":{"id":"doi:10.1109/date.2004.1268909","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268909","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108087265","display_name":"R\u00e9gis Leveugle","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"R. Leveugle","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036137792","display_name":"A. Ammari","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Ammari","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5108087265"],"corresponding_institution_ids":["https://openalex.org/I4210087012"],"apc_list":null,"apc_paid":null,"fwci":2.4525,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.88501519,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"590","last_page":"595"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.7517631649971008},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.7316403388977051},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.6949453353881836},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6753275394439697},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6097182035446167},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.560736358165741},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5283183455467224},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5016345977783203},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.47910311818122864},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.47666293382644653},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47587934136390686},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.45151519775390625},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.44874072074890137},{"id":"https://openalex.org/keywords/signal-flow-graph","display_name":"Signal-flow graph","score":0.41693365573883057},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28210192918777466},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23921498656272888},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10268270969390869}],"concepts":[{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.7517631649971008},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.7316403388977051},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.6949453353881836},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6753275394439697},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6097182035446167},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.560736358165741},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5283183455467224},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5016345977783203},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47910311818122864},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.47666293382644653},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47587934136390686},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.45151519775390625},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.44874072074890137},{"id":"https://openalex.org/C166501922","wikidata":"https://www.wikidata.org/wiki/Q1786523","display_name":"Signal-flow graph","level":2,"score":0.41693365573883057},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28210192918777466},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23921498656272888},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10268270969390869},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/date.2004.1268909","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268909","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00015036v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00015036","pdf_url":null,"source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proceedings.-Design,-Automation-and-Test-in-Europe-Conference-and-Exhibition, 2004, Paris, France. pp.590-5 /Vol.1, ⟨10.1109/DATE.2004.1268909⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","score":0.699999988079071,"display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1603601577","https://openalex.org/W1912583643","https://openalex.org/W2017627876","https://openalex.org/W2030501553","https://openalex.org/W2097106306","https://openalex.org/W2129998589","https://openalex.org/W2132280722","https://openalex.org/W2135764108","https://openalex.org/W2154480584","https://openalex.org/W4229995190","https://openalex.org/W4231164902","https://openalex.org/W4233983565","https://openalex.org/W4235799760","https://openalex.org/W6682696943"],"related_works":["https://openalex.org/W2007222089","https://openalex.org/W4242258007","https://openalex.org/W2155285526","https://openalex.org/W1630910375","https://openalex.org/W2394022884","https://openalex.org/W2185815555","https://openalex.org/W2071235072","https://openalex.org/W1917800633","https://openalex.org/W2357284929","https://openalex.org/W1862020018"],"abstract_inverted_index":{"Fault":[0],"injection":[1,118],"techniques":[2],"have":[3,20],"been":[4,22],"proposed":[5],"for":[6],"years":[7],"to":[8,24,54,93,112],"early":[9],"analyze":[10],"the":[11,26,42,57,70,89,98,114,117],"dependability":[12],"characteristics":[13],"of":[14,45,88,116],"digital":[15,58],"circuits.":[16],"Very":[17],"few":[18],"attempts":[19,34],"however":[21],"reported":[23,111],"perform":[25],"same":[27],"task":[28],"in":[29,69,97,119],"analog":[30,60,120],"parts.":[31],"Furthermore,":[32],"these":[33],"are":[35,110],"all":[36],"based":[37,83],"on":[38,84,106],"parametric":[39],"variations.":[40],"With":[41],"increasing":[43],"number":[44],"mixed":[46],"signal":[47],"circuits,":[48],"a":[49,77,85,107],"unified":[50],"approach":[51],"becomes":[52],"mandatory":[53],"globally":[55],"validate":[56],"and":[59],"parts,":[61],"while":[62],"taking":[63],"into":[64],"account":[65],"real":[66],"faults":[67,96],"occurring":[68],"field,":[71],"e.g.":[72],"SEUs.":[73],"In":[74],"this":[75],"paper,":[76],"global":[78],"analysis":[79],"flow":[80],"is":[81,101],"proposed,":[82],"high-level":[86],"model":[87],"circuit.":[90],"The":[91,103],"possibility":[92],"inject":[94],"transient":[95],"different":[99],"parts":[100],"discussed.":[102],"results":[104],"obtained":[105],"case":[108],"study":[109],"show":[113],"feasibility":[115],"blocks.":[121]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-03-28T08:17:26.163206","created_date":"2025-10-10T00:00:00"}