{"id":"https://openalex.org/W4254777046","doi":"https://doi.org/10.1109/date.2004.1268827","title":"Level of similarity: a metric for fault collapsing","display_name":"Level of similarity: a metric for fault collapsing","publication_year":2004,"publication_date":"2004-06-21","ids":{"openalex":"https://openalex.org/W4254777046","doi":"https://doi.org/10.1109/date.2004.1268827"},"language":"en","primary_location":{"id":"doi:10.1109/date.2004.1268827","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268827","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032651920","display_name":"Irith Pomeranz","orcid":"https://orcid.org/0000-0002-5491-7282"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"I. Pomeranz","raw_affiliation_strings":["School of Electrical & Computer Engineering, Purdue University, West Lafayette, IN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical & Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077101123","display_name":"S.M. Reddy","orcid":"https://orcid.org/0000-0001-9208-8262"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.M. Reddy","raw_affiliation_strings":["Electrical & Computer Engineering Department, University of Iowa, Iowa, IA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical & Computer Engineering Department, University of Iowa, Iowa, IA, USA","institution_ids":["https://openalex.org/I126307644"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"56","last_page":"61"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5947944521903992},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.572123110294342},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.49105238914489746},{"id":"https://openalex.org/keywords/equivalence","display_name":"Equivalence (formal languages)","score":0.4338359832763672},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.38631072640419006},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3512426018714905},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.350265771150589},{"id":"https://openalex.org/keywords/discrete-mathematics","display_name":"Discrete mathematics","score":0.2155957818031311},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16654524207115173},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1535239815711975},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.10304352641105652}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5947944521903992},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.572123110294342},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.49105238914489746},{"id":"https://openalex.org/C2780069185","wikidata":"https://www.wikidata.org/wiki/Q7977945","display_name":"Equivalence (formal languages)","level":2,"score":0.4338359832763672},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.38631072640419006},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3512426018714905},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.350265771150589},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.2155957818031311},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16654524207115173},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1535239815711975},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10304352641105652},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2004.1268827","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268827","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","score":0.46000000834465027,"display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1873600165","https://openalex.org/W2099249829","https://openalex.org/W2109508018","https://openalex.org/W2159880265","https://openalex.org/W2546264495","https://openalex.org/W4302458519"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2053286651","https://openalex.org/W2181743346","https://openalex.org/W2187401768","https://openalex.org/W2181413294","https://openalex.org/W2989452537","https://openalex.org/W2052122378","https://openalex.org/W2544423928","https://openalex.org/W2062023542"],"abstract_inverted_index":{"We":[0,107],"describe":[1,108],"a":[2,25,34,44,49,59,109],"new":[3,20],"approach":[4,21],"to":[5,40,43,103],"fault":[6,10,14,17,35,45,112],"collapsing":[7,11,113],"that":[8],"extends":[9],"based":[12,23,114],"on":[13,24,92,115],"equivalence":[15],"and":[16,90,120],"dominance.":[18],"The":[19],"is":[22,38,76],"metric":[26],"called":[27],"level":[28,50,117],"of":[29,51,63,87,118],"similarity":[30,52],"between":[31],"faults.":[32],"Informally,":[33],"f/sub":[36,46,67,71,82,96,105],"j/":[37,83],"said":[39],"be":[41],"similar":[42],"i/":[47,68,97],"with":[48],"SL/sub":[53,61,74],"i,j/":[54,62,75],"/spl":[55],"les/":[56],"1":[57],"if":[58],"fraction":[60],"the":[64,85,93,116],"tests":[65,99],"for":[66,95,100,111],"also":[69],"detect":[70,104],"j/.":[72,106],"If":[73],"high":[77],"enough,":[78],"one":[79],"may":[80],"exclude":[81],"from":[84],"set":[86],"target":[88],"faults":[89],"rely":[91],"test":[94],"(and":[98],"other":[101],"faults)":[102],"procedure":[110],"similarity,":[119],"study":[121],"its":[122],"effectiveness":[123],"experimentally.":[124]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}