{"id":"https://openalex.org/W4246488548","doi":"https://doi.org/10.1109/date.2003.1186393","title":"A new simulation technique for periodic small-signal analysis","display_name":"A new simulation technique for periodic small-signal analysis","publication_year":2003,"publication_date":"2003-12-22","ids":{"openalex":"https://openalex.org/W4246488548","doi":"https://doi.org/10.1109/date.2003.1186393"},"language":"en","primary_location":{"id":"doi:10.1109/date.2003.1186393","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2003.1186393","pdf_url":null,"source":{"id":"https://openalex.org/S4363607952","display_name":"2003 Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2003 Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012551688","display_name":"M.A. Gourary","orcid":null},"institutions":[{"id":"https://openalex.org/I4210096404","display_name":"Institute for Design Problems in Microelectronics","ror":"https://ror.org/00t7t9a43","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210096404"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"M.A. Gourary","raw_affiliation_strings":["IPPM, Russian Academy of Science, Moscow, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IPPM, Russian Academy of Science, Moscow, Russia","institution_ids":["https://openalex.org/I4210096404"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079348082","display_name":"\u0421.\u0413. \u0420\u0443\u0441\u0430\u043a\u043e\u0432","orcid":"https://orcid.org/0000-0001-6107-2866"},"institutions":[{"id":"https://openalex.org/I4210096404","display_name":"Institute for Design Problems in Microelectronics","ror":"https://ror.org/00t7t9a43","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210096404"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"S.G. Rusakov","raw_affiliation_strings":["IPPM, Russian Academy of Science, Moscow, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IPPM, Russian Academy of Science, Moscow, Russia","institution_ids":["https://openalex.org/I4210096404"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064067452","display_name":"S.L. Ulyanov","orcid":null},"institutions":[{"id":"https://openalex.org/I4210096404","display_name":"Institute for Design Problems in Microelectronics","ror":"https://ror.org/00t7t9a43","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210096404"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"S.L. Ulyanov","raw_affiliation_strings":["IPPM, Russian Academy of Science, Moscow, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IPPM, Russian Academy of Science, Moscow, Russia","institution_ids":["https://openalex.org/I4210096404"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062186595","display_name":"M.M. Zharov","orcid":null},"institutions":[{"id":"https://openalex.org/I4210096404","display_name":"Institute for Design Problems in Microelectronics","ror":"https://ror.org/00t7t9a43","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210096404"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"M.M. Zharov","raw_affiliation_strings":["IPPM, Russian Academy of Science, Moscow, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IPPM, Russian Academy of Science, Moscow, Russia","institution_ids":["https://openalex.org/I4210096404"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006749091","display_name":"B.J. Mulvaney","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B.J. Mulvaney","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9886000156402588,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/harmonic-balance","display_name":"Harmonic balance","score":0.7772065997123718},{"id":"https://openalex.org/keywords/krylov-subspace","display_name":"Krylov subspace","score":0.7228929996490479},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6851400136947632},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.597318172454834},{"id":"https://openalex.org/keywords/harmonic-analysis","display_name":"Harmonic analysis","score":0.5711920857429504},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4393068552017212},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.4307589828968048},{"id":"https://openalex.org/keywords/numerical-analysis","display_name":"Numerical analysis","score":0.4240257740020752},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4137880206108093},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35331857204437256},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.2674703598022461},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21693548560142517},{"id":"https://openalex.org/keywords/iterative-method","display_name":"Iterative method","score":0.15413451194763184},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1511179506778717},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09094560146331787},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08569630980491638}],"concepts":[{"id":"https://openalex.org/C121758426","wikidata":"https://www.wikidata.org/wiki/Q5659248","display_name":"Harmonic balance","level":3,"score":0.7772065997123718},{"id":"https://openalex.org/C147060835","wikidata":"https://www.wikidata.org/wiki/Q1757151","display_name":"Krylov subspace","level":3,"score":0.7228929996490479},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6851400136947632},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.597318172454834},{"id":"https://openalex.org/C131770355","wikidata":"https://www.wikidata.org/wiki/Q876215","display_name":"Harmonic analysis","level":2,"score":0.5711920857429504},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4393068552017212},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.4307589828968048},{"id":"https://openalex.org/C48753275","wikidata":"https://www.wikidata.org/wiki/Q11216","display_name":"Numerical analysis","level":2,"score":0.4240257740020752},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4137880206108093},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35331857204437256},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.2674703598022461},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21693548560142517},{"id":"https://openalex.org/C159694833","wikidata":"https://www.wikidata.org/wiki/Q2321565","display_name":"Iterative method","level":2,"score":0.15413451194763184},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1511179506778717},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09094560146331787},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08569630980491638},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2003.1186393","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2003.1186393","pdf_url":null,"source":{"id":"https://openalex.org/S4363607952","display_name":"2003 Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2003 Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1495851026","https://openalex.org/W1506342804","https://openalex.org/W2072558413","https://openalex.org/W2103301676","https://openalex.org/W2115477597","https://openalex.org/W2144232723","https://openalex.org/W2151142798","https://openalex.org/W2162810287","https://openalex.org/W2172185550","https://openalex.org/W2892151252","https://openalex.org/W4235854529","https://openalex.org/W4237651784"],"related_works":["https://openalex.org/W1821799314","https://openalex.org/W2085094229","https://openalex.org/W1820322865","https://openalex.org/W2735732156","https://openalex.org/W1999325515","https://openalex.org/W3166824220","https://openalex.org/W4320085521","https://openalex.org/W2331226942","https://openalex.org/W2166662224","https://openalex.org/W1519211136"],"abstract_inverted_index":{"A":[0],"new":[1,48],"numerical":[2,18],"technique":[3],"for":[4,50,56],"periodic":[5],"small":[6,53],"signal":[7,54],"analysis,":[8],"based":[9,20],"on":[10,21],"the":[11,29,44,47,52],"harmonic":[12],"balance":[13],"method,":[14],"is":[15],"proposed.":[16],"Special-purpose":[17],"procedures,":[19],"Krylov":[22],"subspace":[23],"methods,":[24],"are":[25,40],"developed":[26],"that":[27],"reduce":[28],"computational":[30],"efforts":[31],"of":[32,46],"solving":[33],"linear":[34],"problems":[35],"under":[36],"frequency":[37],"sweeping.":[38],"Examples":[39],"given":[41],"to":[42],"show":[43],"efficiency":[45],"algorithm":[49],"computing":[51],"characteristics":[55],"typical":[57],"RF":[58],"circuits.":[59]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}