{"id":"https://openalex.org/W4414197000","doi":"https://doi.org/10.1109/dac63849.2025.11133011","title":"PiSPICE: Accelerating Post-Layout SPICE Simulation via Essential Parasitic Identification","display_name":"PiSPICE: Accelerating Post-Layout SPICE Simulation via Essential Parasitic Identification","publication_year":2025,"publication_date":"2025-06-22","ids":{"openalex":"https://openalex.org/W4414197000","doi":"https://doi.org/10.1109/dac63849.2025.11133011"},"language":"en","primary_location":{"id":"doi:10.1109/dac63849.2025.11133011","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dac63849.2025.11133011","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 62nd ACM/IEEE Design Automation Conference (DAC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052815761","display_name":"Jin Zhou","orcid":"https://orcid.org/0000-0003-2993-6235"},"institutions":[{"id":"https://openalex.org/I4210124274","display_name":"Fraunhofer Institute for Integrated Circuits","ror":"https://ror.org/024ape423","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210124274","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Zhou Jin","raw_affiliation_strings":["Zhejiang University,College of Integrated Circuits,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University,College of Integrated Circuits,China","institution_ids":["https://openalex.org/I4210124274"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100747643","display_name":"Jing\u2010Feng Li","orcid":"https://orcid.org/0000-0002-0185-0512"},"institutions":[{"id":"https://openalex.org/I204553293","display_name":"China University of Petroleum, Beijing","ror":"https://ror.org/041qf4r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I204553293"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Li","raw_affiliation_strings":["China University of Petroleum-Beijing,SSSLab,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China University of Petroleum-Beijing,SSSLab,China","institution_ids":["https://openalex.org/I204553293"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048854656","display_name":"Xin Jian","orcid":"https://orcid.org/0000-0003-1140-1339"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Xin","raw_affiliation_strings":["Tsinghua University,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University,China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085657539","display_name":"Tianjia Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianjia Zhou","raw_affiliation_strings":["Tsinghua University,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University,China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111726884","display_name":"Xiao Wu","orcid":"https://orcid.org/0009-0000-9255-7540"},"institutions":[{"id":"https://openalex.org/I4210093776","display_name":"DHC Software (China)","ror":"https://ror.org/00kn8e190","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210093776"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao Wu","raw_affiliation_strings":["Huada Empyrean Software Co. Ltd,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Huada Empyrean Software Co. Ltd,China","institution_ids":["https://openalex.org/I4210093776"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102500224","display_name":"Dan Niu","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dan Niu","raw_affiliation_strings":["Southeast University,School of Automation,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,School of Automation,China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112436964","display_name":"Zuochang Ye","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zuochang Ye","raw_affiliation_strings":["Tsinghua University,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University,China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.28638806,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.777400016784668,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.777400016784668,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.7566999793052673,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"Parasitic extraction","score":0.9143999814987183},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7142999768257141},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.6460000276565552},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6187000274658203},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6108999848365784},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5461999773979187},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4909000098705292},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.47119998931884766}],"concepts":[{"id":"https://openalex.org/C159818811","wikidata":"https://www.wikidata.org/wiki/Q7135947","display_name":"Parasitic extraction","level":2,"score":0.9143999814987183},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7142999768257141},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.6460000276565552},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6187000274658203},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6144000291824341},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6108999848365784},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5461999773979187},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4909000098705292},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4726000130176544},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.47119998931884766},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4417000114917755},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.43529999256134033},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4246000051498413},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.3431999981403351},{"id":"https://openalex.org/C38677869","wikidata":"https://www.wikidata.org/wiki/Q724168","display_name":"Petri net","level":2,"score":0.3158999979496002},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.3151000142097473},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.3111000061035156},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.30959999561309814},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.30730000138282776},{"id":"https://openalex.org/C179799912","wikidata":"https://www.wikidata.org/wiki/Q205084","display_name":"Computational complexity theory","level":2,"score":0.29809999465942383},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2759000062942505},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.2754000127315521},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.27239999175071716},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.27219998836517334}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dac63849.2025.11133011","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dac63849.2025.11133011","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 62nd ACM/IEEE Design Automation Conference (DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1952921853","https://openalex.org/W1976231008","https://openalex.org/W2132850565","https://openalex.org/W2137755681","https://openalex.org/W2144506055","https://openalex.org/W2163288592","https://openalex.org/W2166370644","https://openalex.org/W2772121594","https://openalex.org/W3084233321","https://openalex.org/W3092045500","https://openalex.org/W3150176780","https://openalex.org/W3162484224","https://openalex.org/W3175617909","https://openalex.org/W3211783727","https://openalex.org/W3212893044","https://openalex.org/W4212836324","https://openalex.org/W4232853208","https://openalex.org/W4243048573","https://openalex.org/W4245942234","https://openalex.org/W4291202462","https://openalex.org/W4293025176","https://openalex.org/W4312913580","https://openalex.org/W4323022540","https://openalex.org/W4378804788","https://openalex.org/W4386764095","https://openalex.org/W4388662066","https://openalex.org/W4391940428","https://openalex.org/W4393168968","https://openalex.org/W4401414632","https://openalex.org/W4401568186","https://openalex.org/W4401568257","https://openalex.org/W4401568400","https://openalex.org/W4401568698","https://openalex.org/W4401861724","https://openalex.org/W4404102244"],"related_works":[],"abstract_inverted_index":{"As":[0],"process":[1],"nodes":[2],"scale":[3,80],"to":[4,19,50,68,123,137,151],"more":[5,31],"advanced":[6],"technologies,":[7],"post-layout":[8,35,44],"simulations":[9],"for":[10,41],"integrated":[11],"circuits":[12,45],"have":[13],"become":[14],"increasingly":[15],"complex,":[16],"involving":[17],"billions":[18],"trillions":[20],"of":[21,104,135,146],"nodes.":[22],"The":[23],"growing":[24],"design":[25],"complexity":[26],"and":[27,33,72,81,87,100,118],"transistor":[28],"integration":[29],"require":[30],"accurate":[32],"efficient":[34],"SPICE":[36],"simulations.":[37],"However,":[38],"existing":[39],"methods":[40],"solving":[42],"large-scale":[43,109],"face":[46],"significant":[47],"challenges":[48],"due":[49],"high":[51],"computational":[52,98],"costs.":[53],"In":[54],"this":[55],"paper,":[56],"we":[57,94],"propose":[58],"a":[59,133],"new":[60],"approach,":[61],"PiSPICE,":[62],"which":[63],"utilizes":[64],"adjoint":[65],"sensitivity":[66,89],"analysis":[67,90],"identify":[69],"critical":[70,116],"parasitics":[71,86,117],"eliminate":[73],"non-critical":[74,129],"ones,":[75],"effectively":[76],"reducing":[77],"the":[78,97,102,115,152],"simulation":[79,141],"improving":[82],"speed.":[83],"By":[84,112],"modeling":[85],"performing":[88],"on":[91],"pre-layout":[92],"circuits,":[93],"significantly":[95],"reduce":[96],"burden":[99],"avoid":[101],"overhead":[103],"directly":[105],"analyzing":[106],"sensitivities":[107],"in":[108,140],"postlayout":[110],"circuits.":[111],"retaining":[113],"only":[114],"applying":[119],"model":[120],"order":[121],"reduction":[122],"minimize":[124],"their":[125],"impact,":[126],"while":[127],"eliminating":[128],"parasitics,":[130],"PiSPICE":[131],"achieves":[132],"speedup":[134],"up":[136],"17.27":[138],"x":[139],"with":[142],"an":[143],"error":[144],"margin":[145],"less":[147],"than":[148],"0.78%":[149],"compared":[150],"commercial":[153],"simulator":[154],"Spectre.":[155]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}