{"id":"https://openalex.org/W4386764951","doi":"https://doi.org/10.1109/dac56929.2023.10247824","title":"Design Automation for Cryogenic CMOS Circuits","display_name":"Design Automation for Cryogenic CMOS Circuits","publication_year":2023,"publication_date":"2023-07-09","ids":{"openalex":"https://openalex.org/W4386764951","doi":"https://doi.org/10.1109/dac56929.2023.10247824"},"language":"en","primary_location":{"id":"doi:10.1109/dac56929.2023.10247824","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dac56929.2023.10247824","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 60th ACM/IEEE Design Automation Conference (DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027765192","display_name":"Victor M. van Santen","orcid":"https://orcid.org/0000-0002-6629-4713"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Victor M. van Santen","raw_affiliation_strings":["University of Stuttgart,Germany","University of Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"University of Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008488084","display_name":"Marcel Walter","orcid":"https://orcid.org/0000-0001-5660-9518"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marcel Walter","raw_affiliation_strings":["Technical University of Munich,Germany","Technical University of Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Technical University of Munich,Germany","institution_ids":["https://openalex.org/I62916508"]},{"raw_affiliation_string":"Technical University of Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083905801","display_name":"Florian Klemme","orcid":"https://orcid.org/0000-0002-0148-0523"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Florian Klemme","raw_affiliation_strings":["University of Stuttgart,Germany","University of Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"University of Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032329214","display_name":"Shivendra Singh Parihar","orcid":"https://orcid.org/0000-0001-7104-2396"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]},{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["DE","IN"],"is_corresponding":false,"raw_author_name":"Shivendra Singh Parihar","raw_affiliation_strings":["University of Stuttgart,Germany","IIT Kanpur, India","University of Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"University of Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"IIT Kanpur, India","institution_ids":["https://openalex.org/I94234084"]},{"raw_affiliation_string":"University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088409866","display_name":"Girish Pahwa","orcid":"https://orcid.org/0000-0003-2094-858X"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Girish Pahwa","raw_affiliation_strings":["University of California,Berkeley,USA","University of California, Berkeley, USA"],"affiliations":[{"raw_affiliation_string":"University of California,Berkeley,USA","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"University of California, Berkeley, USA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077371510","display_name":"Yogesh Singh Chauhan","orcid":"https://orcid.org/0000-0002-3356-8917"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Yogesh S. Chauhan","raw_affiliation_strings":["IIT Kanpur,India","IIT Kanpur, India"],"affiliations":[{"raw_affiliation_string":"IIT Kanpur,India","institution_ids":["https://openalex.org/I94234084"]},{"raw_affiliation_string":"IIT Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004214923","display_name":"Robert Wille","orcid":"https://orcid.org/0000-0002-4993-7860"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]},{"id":"https://openalex.org/I4210126338","display_name":"Software Competence Center Hagenberg (Austria)","ror":"https://ror.org/02ks3nr96","country_code":"AT","type":"company","lineage":["https://openalex.org/I4210126338"]}],"countries":["AT","DE"],"is_corresponding":false,"raw_author_name":"Robert Wille","raw_affiliation_strings":["Technical University of Munich,Germany","Software Competence Center Hagenberg GmbH, Austria","Technical University of Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Technical University of Munich,Germany","institution_ids":["https://openalex.org/I62916508"]},{"raw_affiliation_string":"Software Competence Center Hagenberg GmbH, Austria","institution_ids":["https://openalex.org/I4210126338"]},{"raw_affiliation_string":"Technical University of Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]},{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["University of Stuttgart,Germany","University of Stuttgart, Germany","Technical University of Munich, Germany"],"affiliations":[{"raw_affiliation_string":"University of Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Technical University of Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5027765192"],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":null,"apc_paid":null,"fwci":1.4709,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.82257395,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7437486052513123},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.714820921421051},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.7084985971450806},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.6593128442764282},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5565351247787476},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5459222197532654},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5282458662986755},{"id":"https://openalex.org/keywords/computer-automated-design","display_name":"Computer-automated design","score":0.4649563729763031},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.4635101854801178},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.447486937046051},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.4383698105812073},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.43140149116516113},{"id":"https://openalex.org/keywords/cryogenics","display_name":"Cryogenics","score":0.42711713910102844},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4042288064956665},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35036343336105347},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33855128288269043},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2544988691806793},{"id":"https://openalex.org/keywords/systems-design","display_name":"Systems design","score":0.16747260093688965},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.14221304655075073},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1288662552833557},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12426039576530457},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.08166807889938354}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7437486052513123},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.714820921421051},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.7084985971450806},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.6593128442764282},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5565351247787476},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5459222197532654},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5282458662986755},{"id":"https://openalex.org/C205976826","wikidata":"https://www.wikidata.org/wiki/Q5157390","display_name":"Computer-automated design","level":3,"score":0.4649563729763031},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.4635101854801178},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.447486937046051},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.4383698105812073},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.43140149116516113},{"id":"https://openalex.org/C179725390","wikidata":"https://www.wikidata.org/wiki/Q192116","display_name":"Cryogenics","level":2,"score":0.42711713910102844},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4042288064956665},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35036343336105347},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33855128288269043},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2544988691806793},{"id":"https://openalex.org/C31352089","wikidata":"https://www.wikidata.org/wiki/Q3750474","display_name":"Systems design","level":2,"score":0.16747260093688965},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.14221304655075073},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1288662552833557},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12426039576530457},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.08166807889938354},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dac56929.2023.10247824","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dac56929.2023.10247824","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 60th ACM/IEEE Design Automation Conference (DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4399999976158142}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334678","display_name":"European Research Council","ror":"https://ror.org/0472cxd90"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W35668030","https://openalex.org/W37385247","https://openalex.org/W1518100416","https://openalex.org/W1528837436","https://openalex.org/W1631356911","https://openalex.org/W1985457698","https://openalex.org/W1993932586","https://openalex.org/W2007701500","https://openalex.org/W2037703867","https://openalex.org/W2056238571","https://openalex.org/W2113585976","https://openalex.org/W2158892671","https://openalex.org/W2162517322","https://openalex.org/W2242458479","https://openalex.org/W2294851045","https://openalex.org/W2346205343","https://openalex.org/W2781227501","https://openalex.org/W2982169647","https://openalex.org/W3089495739","https://openalex.org/W3107649711","https://openalex.org/W3124658597","https://openalex.org/W3143290261","https://openalex.org/W3163303881","https://openalex.org/W3184465909","https://openalex.org/W4241530675","https://openalex.org/W6601553556"],"related_works":["https://openalex.org/W2059530328","https://openalex.org/W3011978806","https://openalex.org/W2743305891","https://openalex.org/W3205162826","https://openalex.org/W3207169898","https://openalex.org/W2019954703","https://openalex.org/W3198354237","https://openalex.org/W2148101730","https://openalex.org/W2951650892","https://openalex.org/W2331259470"],"abstract_inverted_index":{"Cryogenic":[0],"CMOS":[1,46,70],"circuits":[2,33],"operate":[3],"at":[4,34],"temperatures":[5,36],"close":[6],"to":[7,89,95],"absolute":[8],"zero":[9],"and":[10,58,97,123,146,156],"are":[11,115],"essential":[12],"in":[13],"many":[14],"applications":[15],"such":[16],"as":[17],"controllers":[18],"for":[19,68,105,141],"quantum":[20],"computing":[21],"but":[22,138],"also":[23],"medical":[24],"engineering,":[25],"space":[26],"technology,":[27,107],"or":[28],"physical":[29],"instruments.":[30],"However,":[31],"operating":[32],"cryogenic":[35,69,142],"fundamentally":[37],"changes":[38],"the":[39,45,60,78,93,99,118,154,159],"underlying":[40],"semiconductor":[41],"physics":[42],"that":[43,64,114,132],"governs":[44],"transistor\u2014rendering":[47],"existing":[48,119],"design":[49,66,135,162],"automation":[50,67,136,163],"approaches":[51],"infeasible.":[52],"In":[53],"this":[54,73],"work,":[55],"we":[56,75],"propose":[57,125],"implement":[59],"first":[61,100],"end-to-end":[62],"approach":[63,131],"enables":[65],"circuits.":[71],"To":[72],"end,":[74],"(1)":[76],"perform":[77],"first-of-its-kind":[79],"measurements":[80],"of":[81,148,158],"commercial":[82],"5nm":[83],"FinFET":[84,106],"transistors":[85],"from":[86],"300K":[87],"down":[88],"10K,":[90],"(2)":[91],"use":[92],"results":[94],"validate":[96],"calibrate":[98],"cryogenic-aware":[101,110,128,161],"industrial-standard":[102],"compact":[103],"model":[104],"(3)":[108],"create":[109],"standard":[111],"cell":[112],"libraries":[113],"compatible":[116],"with":[117],"EDA":[120],"tool":[121],"flows,":[122],"(4)":[124],"an":[126],"initial":[127],"logic":[129],"synthesis":[130],"re-uses":[133],"established":[134],"expertise":[137],"optimizes":[139],"it":[140],"purposes.":[143],"Evaluations,":[144],"comparisons,":[145],"discussions":[147],"all":[149],"these":[150],"novel":[151],"contributions":[152],"confirm":[153],"applicability":[155],"validity":[157],"resulting":[160],"flow.":[164]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}