{"id":"https://openalex.org/W4386763792","doi":"https://doi.org/10.1109/dac56929.2023.10247670","title":"RQ-DNN: Reliable Quantization for Fault-tolerant Deep Neural Networks","display_name":"RQ-DNN: Reliable Quantization for Fault-tolerant Deep Neural Networks","publication_year":2023,"publication_date":"2023-07-09","ids":{"openalex":"https://openalex.org/W4386763792","doi":"https://doi.org/10.1109/dac56929.2023.10247670"},"language":"en","primary_location":{"id":"doi:10.1109/dac56929.2023.10247670","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dac56929.2023.10247670","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 60th ACM/IEEE Design Automation Conference (DAC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089569520","display_name":"In\u2010Su Choi","orcid":"https://orcid.org/0000-0001-7002-6853"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Insu Choi","raw_affiliation_strings":["Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea","Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101244882","display_name":"Jae-Youn Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae-Youn Hong","raw_affiliation_strings":["Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea","Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111040520","display_name":"JaeHwa Jeon","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"JaeHwa Jeon","raw_affiliation_strings":["Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea","Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026627679","display_name":"Joon-Sung Yang","orcid":"https://orcid.org/0000-0002-1502-5353"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joon-Sung Yang","raw_affiliation_strings":["Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea","Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","Department of Systems Semiconductor Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Department of Systems Semiconductor Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.3641,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.66664026,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7635811567306519},{"id":"https://openalex.org/keywords/quantization","display_name":"Quantization (signal processing)","score":0.746887743473053},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.624320387840271},{"id":"https://openalex.org/keywords/clipping","display_name":"Clipping (morphology)","score":0.6014410853385925},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5515673756599426},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4859298765659332},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.4658423662185669},{"id":"https://openalex.org/keywords/deep-neural-networks","display_name":"Deep neural networks","score":0.4588196575641632},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.44523295760154724},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4034231901168823},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.29073697328567505},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.11939626932144165}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7635811567306519},{"id":"https://openalex.org/C28855332","wikidata":"https://www.wikidata.org/wiki/Q198099","display_name":"Quantization (signal processing)","level":2,"score":0.746887743473053},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.624320387840271},{"id":"https://openalex.org/C2776848632","wikidata":"https://www.wikidata.org/wiki/Q853463","display_name":"Clipping (morphology)","level":2,"score":0.6014410853385925},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5515673756599426},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4859298765659332},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.4658423662185669},{"id":"https://openalex.org/C2984842247","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep neural networks","level":3,"score":0.4588196575641632},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.44523295760154724},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4034231901168823},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.29073697328567505},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.11939626932144165},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dac56929.2023.10247670","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dac56929.2023.10247670","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 60th ACM/IEEE Design Automation Conference (DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2809188712","https://openalex.org/W2946747688","https://openalex.org/W3006249601","https://openalex.org/W3201365832","https://openalex.org/W4280488201","https://openalex.org/W4287867064"],"related_works":["https://openalex.org/W2035130982","https://openalex.org/W2031972612","https://openalex.org/W2956000802","https://openalex.org/W3198227724","https://openalex.org/W3198205105","https://openalex.org/W2124718873","https://openalex.org/W110878719","https://openalex.org/W2098726873","https://openalex.org/W3183431084","https://openalex.org/W4285818394"],"abstract_inverted_index":{"Deep":[0],"Neural":[1],"Networks":[2],"(DNNs)":[3],"are":[4],"deployed":[5],"in":[6,41,48],"many":[7],"real-time":[8],"and":[9,16,31,51,111],"safety-critical":[10],"applications":[11],"such":[12,20,86],"as":[13,87],"autonomous":[14],"vehicles":[15],"medical":[17],"diagnosis.":[18],"In":[19],"applications,":[21],"quantization":[22,53,69],"is":[23],"used":[24],"to":[25,91],"compress":[26],"the":[27,73,76,122,126,129,141],"model":[28,58,68],"for":[29],"storage":[30],"computation":[32],"reduction.":[33],"However,":[34],"recent":[35],"research":[36],"has":[37],"shown":[38],"that":[39,66,102,121],"faults":[40],"memory":[42],"can":[43,79,133],"cause":[44],"a":[45,63,113],"significant":[46],"drop":[47],"DNN":[49],"accuracy":[50,106],"conventional":[52,142],"methods":[54],"focus":[55],"only":[56],"on":[57],"compression.":[59],"This":[60],"paper":[61],"proposes":[62],"novel":[64,114],"method":[65,97,124],"performs":[67],"while":[70],"remarkably":[71],"improving":[72],"fault-tolerance":[74,127],"of":[75,128],"model.":[77],"It":[78],"be":[80],"incorporated":[81],"with":[82],"other":[83],"hardware":[84],"approaches":[85],"Error":[88],"Correcting":[89],"Code":[90],"further":[92],"improve":[93],"fault-tolerance.":[94],"The":[95],"proposed":[96,123],"reduces":[98],"possible":[99],"error":[100,138],"patterns":[101],"negatively":[103],"impact":[104],"classification":[105],"by":[107],"modifying":[108],"weight":[109],"distributions":[110],"applying":[112],"masking-based":[115],"clipping":[116],"function.":[117],"Experimental":[118],"results":[119],"show":[120],"enhances":[125],"quantized":[130],"DNN,":[131],"which":[132],"tolerate":[134],"1803\u00d7":[135],"higher":[136],"bit":[137],"rates":[139],"than":[140],"method.":[143]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}