{"id":"https://openalex.org/W3212633509","doi":"https://doi.org/10.1109/dac18074.2021.9586286","title":"Fault-free: A Fault-resilient Deep Neural Network Accelerator based on Realistic ReRAM Devices","display_name":"Fault-free: A Fault-resilient Deep Neural Network Accelerator based on Realistic ReRAM Devices","publication_year":2021,"publication_date":"2021-11-08","ids":{"openalex":"https://openalex.org/W3212633509","doi":"https://doi.org/10.1109/dac18074.2021.9586286","mag":"3212633509"},"language":"en","primary_location":{"id":"doi:10.1109/dac18074.2021.9586286","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dac18074.2021.9586286","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 58th ACM/IEEE Design Automation Conference (DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073278616","display_name":"Hyein Shin","orcid":"https://orcid.org/0000-0003-0382-4032"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hyein Shin","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047372993","display_name":"Myeonggu Kang","orcid":"https://orcid.org/0000-0003-3557-8526"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Myeonggu Kang","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052390471","display_name":"Lee\u2010Sup Kim","orcid":"https://orcid.org/0000-0001-9585-4591"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Lee-Sup Kim","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5073278616"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":1.2143,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.79144063,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1039","last_page":"1044"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9240680932998657},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.747821569442749},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5208547711372375},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4698656499385834},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.4600067436695099},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4586683511734009},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.44276943802833557},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.43925753235816956},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39107999205589294},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3378298282623291},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2392463982105255},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.198043555021286},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19352787733078003},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10287335515022278},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.073964923620224}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9240680932998657},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.747821569442749},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5208547711372375},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4698656499385834},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.4600067436695099},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4586683511734009},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.44276943802833557},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.43925753235816956},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39107999205589294},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3378298282623291},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2392463982105255},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.198043555021286},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19352787733078003},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10287335515022278},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.073964923620224},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dac18074.2021.9586286","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dac18074.2021.9586286","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 58th ACM/IEEE Design Automation Conference (DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1591801644","https://openalex.org/W1686810756","https://openalex.org/W1971319818","https://openalex.org/W2048266589","https://openalex.org/W2108598243","https://openalex.org/W2194775991","https://openalex.org/W2219888463","https://openalex.org/W2508602506","https://openalex.org/W2518281301","https://openalex.org/W2525332836","https://openalex.org/W2525778437","https://openalex.org/W2605350416","https://openalex.org/W2626719825","https://openalex.org/W2760656271","https://openalex.org/W2768104155","https://openalex.org/W2884687835","https://openalex.org/W2921329602","https://openalex.org/W2946047477","https://openalex.org/W2946522000","https://openalex.org/W2949674408","https://openalex.org/W2962835968","https://openalex.org/W2970971581","https://openalex.org/W3013309020","https://openalex.org/W3091885635","https://openalex.org/W3111989171","https://openalex.org/W4295312788","https://openalex.org/W4298422451","https://openalex.org/W6637373629","https://openalex.org/W6687483927","https://openalex.org/W6766978945"],"related_works":["https://openalex.org/W2054635671","https://openalex.org/W2545245183","https://openalex.org/W2017425642","https://openalex.org/W2350916061","https://openalex.org/W1970117475","https://openalex.org/W3161624601","https://openalex.org/W2078381924","https://openalex.org/W4206468571","https://openalex.org/W4298011929","https://openalex.org/W4381388454"],"abstract_inverted_index":{"Energy-efficient":[0],"Resistive":[1],"RAM":[2],"(ReRAM)":[3],"based":[4,46],"deep":[5],"neural":[6],"network":[7],"(DNN)":[8],"accelerator":[9,45],"suffers":[10],"from":[11,90],"severe":[12],"Stuck-At-Fault":[13],"(SAF)":[14],"problem":[15,24,56],"that":[16],"drastically":[17],"degrades":[18],"the":[19,38,54,77,91],"inference":[20],"accuracy.":[21],"The":[22,73],"SAF":[23,55],"gets":[25],"even":[26],"worse":[27],"in":[28,57],"realistic":[29,48,59],"ReRAM":[30,49,60],"devices":[31],"with":[32,82],"low":[33],"cell":[34],"resolution.":[35],"To":[36],"address":[37],"issue,":[39],"we":[40],"propose":[41,63],"a":[42,58,64],"fault-resilient":[43,67],"DNN":[44,81,94],"on":[47],"devices.":[50],"We":[51],"first":[52],"analyze":[53],"device":[61],"and":[62,69,86],"3-stage":[65],"offline":[66],"compilation":[68],"lightweight":[70],"online":[71],"compensation.":[72],"proposed":[74],"work":[75],"enables":[76],"reliable":[78],"execution":[79],"of":[80],"only":[83],"5%":[84],"area":[85],"0.8%":[87],"energy":[88],"overhead":[89],"ideal":[92],"ReRAM-based":[93],"accelerator.":[95]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}