{"id":"https://openalex.org/W3091858780","doi":"https://doi.org/10.1109/dac18072.2020.9218623","title":"TYMER: A Yield-based Performance Model for Timing-speculation SRAM","display_name":"TYMER: A Yield-based Performance Model for Timing-speculation SRAM","publication_year":2020,"publication_date":"2020-07-01","ids":{"openalex":"https://openalex.org/W3091858780","doi":"https://doi.org/10.1109/dac18072.2020.9218623","mag":"3091858780"},"language":"en","primary_location":{"id":"doi:10.1109/dac18072.2020.9218623","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dac18072.2020.9218623","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 57th ACM/IEEE Design Automation Conference (DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078618657","display_name":"Shan Shen","orcid":"https://orcid.org/0000-0003-1383-463X"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shan Shen","raw_affiliation_strings":["Nation ASIC System Engineering Technology Research Center, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nation ASIC System Engineering Technology Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012061013","display_name":"Liang Pang","orcid":"https://orcid.org/0000-0002-1535-8975"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Pang","raw_affiliation_strings":["Nation ASIC System Engineering Technology Research Center, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nation ASIC System Engineering Technology Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057372251","display_name":"Tianxiang Shao","orcid":"https://orcid.org/0000-0003-4593-7756"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianxiang Shao","raw_affiliation_strings":["Nation ASIC System Engineering Technology Research Center, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nation ASIC System Engineering Technology Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078395317","display_name":"Ming Ling","orcid":"https://orcid.org/0000-0002-8866-7189"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Ling","raw_affiliation_strings":["Nation ASIC System Engineering Technology Research Center, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nation ASIC System Engineering Technology Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Xiao Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiao Shi","raw_affiliation_strings":["Electrical and Computer Engineering Dept., University of California, Los Angeles, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Dept., University of California, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I161318765"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101499715","display_name":"Longxing Shi","orcid":"https://orcid.org/0000-0002-0629-7154"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longxing Shi","raw_affiliation_strings":["Nation ASIC System Engineering Technology Research Center, Southeast University, Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nation ASIC System Engineering Technology Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3122,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.57895114,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9635697603225708},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.706445038318634},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.6457523703575134},{"id":"https://openalex.org/keywords/speculation","display_name":"Speculation","score":0.6191166639328003},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5805276036262512},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.4995877742767334},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.48151716589927673},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4555938243865967},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.44781142473220825},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4026854634284973},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.38795003294944763},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3623870611190796},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2451339066028595},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23937904834747314},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21054968237876892},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11348745226860046},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.10532647371292114},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07288050651550293},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.06217184662818909},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05518659949302673}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9635697603225708},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.706445038318634},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.6457523703575134},{"id":"https://openalex.org/C47941915","wikidata":"https://www.wikidata.org/wiki/Q107885","display_name":"Speculation","level":2,"score":0.6191166639328003},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5805276036262512},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.4995877742767334},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.48151716589927673},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4555938243865967},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.44781142473220825},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4026854634284973},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.38795003294944763},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3623870611190796},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2451339066028595},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23937904834747314},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21054968237876892},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11348745226860046},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.10532647371292114},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07288050651550293},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.06217184662818909},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05518659949302673},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dac18072.2020.9218623","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dac18072.2020.9218623","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 57th ACM/IEEE Design Automation Conference (DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7699999809265137,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1974982221","https://openalex.org/W1998525920","https://openalex.org/W2018341838","https://openalex.org/W2101328080","https://openalex.org/W2114810610","https://openalex.org/W2123592628","https://openalex.org/W2132621842","https://openalex.org/W2154477062","https://openalex.org/W2166176901","https://openalex.org/W2289910803","https://openalex.org/W2806278919","https://openalex.org/W2809533575","https://openalex.org/W2966870437","https://openalex.org/W2972279655","https://openalex.org/W2986266962","https://openalex.org/W4238460662","https://openalex.org/W4255246482"],"related_works":["https://openalex.org/W2089002058","https://openalex.org/W1909296377","https://openalex.org/W3185029353","https://openalex.org/W3116379964","https://openalex.org/W2915176329","https://openalex.org/W2793465010","https://openalex.org/W2967161359","https://openalex.org/W2208608937","https://openalex.org/W2766443086","https://openalex.org/W2032691814"],"abstract_inverted_index":{"In":[0,27],"low":[1,46],"power":[2],"designs,":[3],"timing-speculative":[4,25],"techniques":[5],"are":[6],"proposed":[7],"to":[8,57],"boost":[9],"the":[10,29,50,54,63,80],"SRAM":[11,44,86],"frequency":[12],"and":[13,62],"throughput.":[14],"This":[15],"paper":[16],"proposes":[17],"TYMER,":[18,28],"a":[19,41],"unified":[20],"yield-based":[21],"performance":[22],"model":[23],"for":[24,40,67],"SRAM.":[26,69],"first":[30],"sub-model":[31],"evaluates":[32],"access-time":[33],"yield":[34,55],"at":[35],"different":[36,95],"worldline":[37],"enable":[38],"time":[39,61],"general":[42],"6T":[43],"under":[45,94],"supply":[47],"voltages,":[48],"while":[49],"second":[51],"one":[52],"uses":[53],"results":[56,77,93],"estimate":[58],"optimal":[59],"sensing":[60],"overall":[64],"read":[65],"latency":[66],"speculative":[68,85],"TYMER":[70],"is":[71],"not":[72],"only":[73],"compared":[74],"with":[75],"simulation":[76],"but":[78],"also":[79],"measurements":[81],"from":[82],"28nm":[83],"fabricated":[84],"chips.":[87],"Both":[88],"cases":[89],"show":[90],"precise":[91],"evaluation":[92],"operating":[96],"conditions.":[97]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}