{"id":"https://openalex.org/W4387914234","doi":"https://doi.org/10.1109/codit58514.2023.10284391","title":"Area Filtering Methods (AFM) are Used to Control and Improve Contour Detection of Shapes in Images","display_name":"Area Filtering Methods (AFM) are Used to Control and Improve Contour Detection of Shapes in Images","publication_year":2023,"publication_date":"2023-07-03","ids":{"openalex":"https://openalex.org/W4387914234","doi":"https://doi.org/10.1109/codit58514.2023.10284391"},"language":"en","primary_location":{"id":"doi:10.1109/codit58514.2023.10284391","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/codit58514.2023.10284391","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 9th International Conference on Control, Decision and Information Technologies (CoDIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022171532","display_name":"Boulbaba Guedri","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Boulbaba Guedri","raw_affiliation_strings":["Université de Tunis. Laboratoire dIngénierie des Systèmes Industriels et d'Energies Renouvelables, Ecole Nationale Supcéricure d'Ingénieurs de Tunis,Tunis,Tunisia,1008"],"affiliations":[{"raw_affiliation_string":"Université de Tunis. Laboratoire dIngénierie des Systèmes Industriels et d'Energies Renouvelables, Ecole Nationale Supcéricure d'Ingénieurs de Tunis,Tunis,Tunisia,1008","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020441321","display_name":"Naji Guedri","orcid":"https://orcid.org/0000-0001-6622-0274"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Naji Guedri","raw_affiliation_strings":["Université de Tunis. Laboratoire dIngénierie des Systèmes Industriels et d'Energies Renouvelables, Ecole Nationale Supcéricure d'Ingénieurs de Tunis,Tunis,Tunisia,1008"],"affiliations":[{"raw_affiliation_string":"Université de Tunis. Laboratoire dIngénierie des Systèmes Industriels et d'Energies Renouvelables, Ecole Nationale Supcéricure d'Ingénieurs de Tunis,Tunis,Tunisia,1008","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086866128","display_name":"R. Gharbi","orcid":"https://orcid.org/0000-0001-7833-3145"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Rached Gharbi","raw_affiliation_strings":["Université de Tunis. Laboratoire dIngénierie des Systèmes Industriels et d'Energies Renouvelables, Ecole Nationale Supcéricure d'Ingénieurs de Tunis,Tunis,Tunisia,1008"],"affiliations":[{"raw_affiliation_string":"Université de Tunis. Laboratoire dIngénierie des Systèmes Industriels et d'Energies Renouvelables, Ecole Nationale Supcéricure d'Ingénieurs de Tunis,Tunis,Tunisia,1008","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5022171532"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2076,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.59788235,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"253","issue":null,"first_page":"1191","last_page":"1194"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10052","display_name":"Medical Image Segmentation Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.5809581279754639},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5544421672821045},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5353192687034607},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.457952618598938},{"id":"https://openalex.org/keywords/filtering-theory","display_name":"Filtering theory","score":0.42119142413139343},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40505683422088623},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3454286754131317},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.13275602459907532}],"concepts":[{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.5809581279754639},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5544421672821045},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5353192687034607},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.457952618598938},{"id":"https://openalex.org/C2988922011","wikidata":"https://www.wikidata.org/wiki/Q5449244","display_name":"Filtering theory","level":2,"score":0.42119142413139343},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40505683422088623},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3454286754131317},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.13275602459907532}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/codit58514.2023.10284391","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/codit58514.2023.10284391","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 9th International Conference on Control, Decision and Information Technologies (CoDIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2059122306","https://openalex.org/W4206641157","https://openalex.org/W4281643744","https://openalex.org/W4312255352","https://openalex.org/W4318002969","https://openalex.org/W4321020753","https://openalex.org/W6849611695"],"related_works":["https://openalex.org/W2058170566","https://openalex.org/W2772917594","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398","https://openalex.org/W2775347418"],"abstract_inverted_index":{"Edge":[0],"detection":[1],"in":[2,9,48,59,90,147,174,183,225],"images":[3],"is":[4,23,56,107,126,152,165,237],"the":[5,10,21,26,43,46,49,57,60,70,77,84,87,99,102,113,119,123,130,142,148,168,171,179,184,194,197,205,210,220,223,226,240,256],"widely":[6],"used":[7],"technique":[8,177],"field":[11],"of":[12,45,86,98,101,115,122,144,170,181,187,196,222],"computer":[13],"vision.":[14],"There":[15],"are":[16,29,34],"many":[17],"different":[18],"ways":[19],"but":[20],"problem":[22,52],"always":[24],"that":[25,53,140],"contour":[27,124,145],"algorithms":[28],"very":[30,262],"precise":[31],"so":[32],"they":[33,40],"inefficient":[35],"for":[36],"some":[37,91],"applications":[38],"because":[39,219],"discover":[41,111],"all":[42,112],"features":[44],"shapes":[47,224,246],"image.":[50,117,149],"The":[51,163,214,235],"sometimes":[54],"exists":[55],"noise":[58],"image,":[61,68,103],"and":[62,104,158,209,259],"if":[63],"we":[64,93,135,200,260],"process":[65],"this":[66,116,133,202],"noisy":[67],"then":[69],"algorithm":[71,121,125,139,215],"needs":[72],"more":[73],"time":[74],"to":[75,110,128,233,238],"finish":[76],"image":[78,227,232],"processing.":[79],"This":[80,150,176,190],"delay":[81],"can":[82],"affect":[83],"operation":[85],"system.":[88],"Additionally":[89],"applications,":[92],"need":[94],"a":[95,137],"specific":[96],"size":[97,221],"shape":[100,172],"therefore":[105],"it":[106],"not":[108],"necessary":[109,127],"sizes":[114],"Therefore,":[118],"complementary":[120,138],"reduce":[129],"losses.":[131],"In":[132],"research,":[134],"suggest":[136],"plays":[141],"role":[143],"filtration":[146],"filter":[151],"called":[153],"\u201cArea":[154],"Filtering":[155],"Method":[156],"(AFM)\u201d":[157],"depends":[159],"on":[160,167],"Python":[161],"programming.":[162],"idea":[164],"based":[166],"measurement":[169],"area":[173,195,207,212],"pixels.":[175],"counts":[178],"number":[180,191],"pixels":[182],"internal":[185],"zone":[186],"each":[188],"shape.":[189,198],"obtained":[192],"represents":[193],"Then,":[199],"compare":[201],"value":[203,208],"with":[204,252],"minimum":[206,241],"maximum":[211],"value.":[213],"determines":[216],"these":[217],"values":[218],"will":[228],"vary":[229],"from":[230],"one":[231],"another.":[234],"objective":[236],"have":[239],"possible":[242],"errors":[243],"when":[244],"detecting":[245],"by":[247,255],"contour.":[248],"AFM":[249],"was":[250],"tried":[251],"photos":[253],"taken":[254],"smart":[257],"camera":[258],"got":[261],"good":[263],"results.":[264]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}