{"id":"https://openalex.org/W2903718900","doi":"https://doi.org/10.1109/coase.2018.8560698","title":"Automated Electric-Field-Based Nanowire Characterization, Manipulation, and Assembly","display_name":"Automated Electric-Field-Based Nanowire Characterization, Manipulation, and Assembly","publication_year":2018,"publication_date":"2018-08-01","ids":{"openalex":"https://openalex.org/W2903718900","doi":"https://doi.org/10.1109/coase.2018.8560698","mag":"2903718900"},"language":"en","primary_location":{"id":"doi:10.1109/coase.2018.8560698","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2018.8560698","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 14th International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035243524","display_name":"Kaiyan Yu","orcid":"https://orcid.org/0000-0001-5962-8968"},"institutions":[{"id":"https://openalex.org/I123946342","display_name":"Binghamton University","ror":"https://ror.org/008rmbt77","country_code":"US","type":"education","lineage":["https://openalex.org/I123946342"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kaiyan Yu","raw_affiliation_strings":["Department of Mechanical Engineering, Binghamton University, Binghamton, NY, 13902"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Binghamton University, Binghamton, NY, 13902","institution_ids":["https://openalex.org/I123946342"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090869394","display_name":"Jingang Yi","orcid":"https://orcid.org/0000-0003-0628-9098"},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jingang Yi","raw_affiliation_strings":["Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway, NJ, USA"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway, NJ, USA","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102806645","display_name":"Jerry W. Shan","orcid":"https://orcid.org/0000-0003-2174-3930"},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jerry Shan","raw_affiliation_strings":["Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway, NJ, USA"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway, NJ, USA","institution_ids":["https://openalex.org/I102322142"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5035243524"],"corresponding_institution_ids":["https://openalex.org/I123946342"],"apc_list":null,"apc_paid":null,"fwci":0.3863,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.64466928,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1612","last_page":"1617"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12452","display_name":"Electrowetting and Microfluidic Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12452","display_name":"Electrowetting and Microfluidic Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11255","display_name":"Microfluidic and Bio-sensing Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11272","display_name":"Nanowire Synthesis and Applications","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanodevice","display_name":"Nanodevice","score":0.9642500877380371},{"id":"https://openalex.org/keywords/nanowire","display_name":"Nanowire","score":0.8776599168777466},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.6956191658973694},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6577020287513733},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.5542287230491638},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.5442001223564148},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.502373456954956},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.46370819211006165},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.46314737200737},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.42919501662254333},{"id":"https://openalex.org/keywords/silicon-nanowires","display_name":"Silicon nanowires","score":0.413227379322052},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3495692014694214},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.32165706157684326},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17259761691093445},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1472407877445221},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13103067874908447},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09673210978507996}],"concepts":[{"id":"https://openalex.org/C2909374376","wikidata":"https://www.wikidata.org/wiki/Q2726733","display_name":"Nanodevice","level":2,"score":0.9642500877380371},{"id":"https://openalex.org/C74214498","wikidata":"https://www.wikidata.org/wiki/Q631739","display_name":"Nanowire","level":2,"score":0.8776599168777466},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6956191658973694},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6577020287513733},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.5542287230491638},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.5442001223564148},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.502373456954956},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.46370819211006165},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.46314737200737},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.42919501662254333},{"id":"https://openalex.org/C2986665194","wikidata":"https://www.wikidata.org/wiki/Q28324872","display_name":"Silicon nanowires","level":3,"score":0.413227379322052},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3495692014694214},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32165706157684326},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17259761691093445},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1472407877445221},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13103067874908447},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09673210978507996},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/coase.2018.8560698","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2018.8560698","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 14th International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1982754184","https://openalex.org/W2000544277","https://openalex.org/W2002486581","https://openalex.org/W2012707371","https://openalex.org/W2022365857","https://openalex.org/W2078456003","https://openalex.org/W2089285837","https://openalex.org/W2136290525","https://openalex.org/W2139735688","https://openalex.org/W2303847528","https://openalex.org/W2348328230","https://openalex.org/W2414351964","https://openalex.org/W2517993614","https://openalex.org/W2552069129","https://openalex.org/W2602972799","https://openalex.org/W2802559838"],"related_works":["https://openalex.org/W2064677851","https://openalex.org/W2427862070","https://openalex.org/W2803109539","https://openalex.org/W2136992030","https://openalex.org/W1984314119","https://openalex.org/W2364387288","https://openalex.org/W2142353285","https://openalex.org/W2123902118","https://openalex.org/W2014118584","https://openalex.org/W2089236473"],"abstract_inverted_index":{"We":[0,27,67],"present":[1],"an":[2],"integrated,":[3],"electric-field-based":[4],"method":[5],"for":[6],"Automated":[7],"Characterization,":[8],"Manipulation,":[9],"and":[10,25,32,35,37,45,56],"Assembly":[11],"of":[12,80,90],"Nanowires":[13],"(ACMAN)":[14],"into":[15],"nanodevices":[16],"by":[17,72,93],"selectable":[18],"electrical":[19,65,82],"conductivities":[20],"with":[21,63,77],"precisely":[22],"controlled":[23],"positions":[24],"orientations.":[26],"combine":[28],"electrophoresis-based":[29],"motion-control,":[30],"planning":[31],"manipulation":[33],"strategies":[34],"contactless":[36],"solution-based":[38],"electro-orientation":[39],"spectroscopy":[40],"(EOS)":[41],"to":[42,59],"simultaneously":[43],"characterize":[44],"manipulate":[46],"multiple":[47],"individual":[48],"nanowires.":[49],"The":[50,84],"ACMAN":[51,70,95],"is":[52],"a":[53],"complete":[54],"automated":[55],"online":[57],"process":[58],"form":[60],"functional":[61],"nanodevice":[62],"desired":[64],"properties.":[66],"validate":[68],"the":[69,87,91,94],"design":[71],"assembling":[73],"field-effect":[74],"transistors":[75],"(FETs)":[76],"silicon":[78],"nanowires":[79],"selected":[81],"conductivities.":[83],"results":[85],"confirm":[86],"high":[88],"performance":[89],"FET":[92],"process.":[96]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}