{"id":"https://openalex.org/W2783131307","doi":"https://doi.org/10.1109/coase.2017.8256114","title":"A fast large-size production data transformation scheme for supporting smart manufacturing in semiconductor industry","display_name":"A fast large-size production data transformation scheme for supporting smart manufacturing in semiconductor industry","publication_year":2017,"publication_date":"2017-08-01","ids":{"openalex":"https://openalex.org/W2783131307","doi":"https://doi.org/10.1109/coase.2017.8256114","mag":"2783131307"},"language":"en","primary_location":{"id":"doi:10.1109/coase.2017.8256114","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2017.8256114","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 13th IEEE Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050301130","display_name":"Benny Suryajaya","orcid":"https://orcid.org/0000-0002-0266-1844"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Benny Suryajaya","raw_affiliation_strings":["Inst. of Manufacturing Information and Systems, National Cheng kung University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inst. of Manufacturing Information and Systems, National Cheng kung University, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085618113","display_name":"Chao\u2010Chun Chen","orcid":"https://orcid.org/0000-0002-7028-5609"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chao-Chun Chen","raw_affiliation_strings":["Inst. of Manufacturing Information and Systems, National Cheng kung University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inst. of Manufacturing Information and Systems, National Cheng kung University, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090340870","display_name":"Min\u2010Hsiung Hung","orcid":"https://orcid.org/0000-0003-2458-471X"},"institutions":[{"id":"https://openalex.org/I205612303","display_name":"Chinese Culture University","ror":"https://ror.org/04shepe48","country_code":"TW","type":"education","lineage":["https://openalex.org/I205612303"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Min-Hsiung Hung","raw_affiliation_strings":["Department of Computer Science and Information Engineering, Chinese Culture University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, Chinese Culture University, Taiwan","institution_ids":["https://openalex.org/I205612303"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000432975","display_name":"Liu Yu-yang","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Yang Liu","raw_affiliation_strings":["Inst. of Manufacturing Information and Systems, National Cheng kung University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inst. of Manufacturing Information and Systems, National Cheng kung University, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101850697","display_name":"Jiaxuan Liu","orcid":"https://orcid.org/0000-0001-5557-3015"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jia-Xuan Liu","raw_affiliation_strings":["Inst. of Manufacturing Information and Systems, National Cheng kung University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inst. of Manufacturing Information and Systems, National Cheng kung University, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057346582","display_name":"Yu\u2010Chuan Lin","orcid":"https://orcid.org/0000-0003-1707-8800"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Chuan Lin","raw_affiliation_strings":["Inst. of Manufacturing Information and Systems, National Cheng kung University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inst. of Manufacturing Information and Systems, National Cheng kung University, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"10","issue":null,"first_page":"275","last_page":"281"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9865000247955322,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9678000211715698,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/factory","display_name":"Factory (object-oriented programming)","score":0.7410085201263428},{"id":"https://openalex.org/keywords/big-data","display_name":"Big data","score":0.708552360534668},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6879715919494629},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.5640314221382141},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.4908450245857239},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.47903862595558167},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4556368887424469},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.45228689908981323},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.44062840938568115},{"id":"https://openalex.org/keywords/analytics","display_name":"Analytics","score":0.43247509002685547},{"id":"https://openalex.org/keywords/data-transformation","display_name":"Data transformation","score":0.42980048060417175},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.4244096875190735},{"id":"https://openalex.org/keywords/massively-parallel","display_name":"Massively parallel","score":0.4241601824760437},{"id":"https://openalex.org/keywords/advanced-manufacturing","display_name":"Advanced manufacturing","score":0.41747069358825684},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.34600526094436646},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.31578874588012695},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22966864705085754},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.1819935142993927},{"id":"https://openalex.org/keywords/data-warehouse","display_name":"Data warehouse","score":0.168917715549469}],"concepts":[{"id":"https://openalex.org/C40149104","wikidata":"https://www.wikidata.org/wiki/Q5620977","display_name":"Factory (object-oriented programming)","level":2,"score":0.7410085201263428},{"id":"https://openalex.org/C75684735","wikidata":"https://www.wikidata.org/wiki/Q858810","display_name":"Big data","level":2,"score":0.708552360534668},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6879715919494629},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.5640314221382141},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.4908450245857239},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.47903862595558167},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4556368887424469},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.45228689908981323},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.44062840938568115},{"id":"https://openalex.org/C79158427","wikidata":"https://www.wikidata.org/wiki/Q485396","display_name":"Analytics","level":2,"score":0.43247509002685547},{"id":"https://openalex.org/C150670458","wikidata":"https://www.wikidata.org/wiki/Q4272815","display_name":"Data transformation","level":3,"score":0.42980048060417175},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.4244096875190735},{"id":"https://openalex.org/C190475519","wikidata":"https://www.wikidata.org/wiki/Q544384","display_name":"Massively parallel","level":2,"score":0.4241601824760437},{"id":"https://openalex.org/C77854861","wikidata":"https://www.wikidata.org/wiki/Q4686346","display_name":"Advanced manufacturing","level":2,"score":0.41747069358825684},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.34600526094436646},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.31578874588012695},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22966864705085754},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.1819935142993927},{"id":"https://openalex.org/C135572916","wikidata":"https://www.wikidata.org/wiki/Q193351","display_name":"Data warehouse","level":2,"score":0.168917715549469},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/coase.2017.8256114","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2017.8256114","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 13th IEEE Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6600000262260437,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1598064945","https://openalex.org/W1656242846","https://openalex.org/W2029608738","https://openalex.org/W2044049559","https://openalex.org/W2087177601","https://openalex.org/W2129840796","https://openalex.org/W2173213060","https://openalex.org/W2189465200","https://openalex.org/W2311402947","https://openalex.org/W2394680079","https://openalex.org/W2470902751","https://openalex.org/W2614235045","https://openalex.org/W2995564009","https://openalex.org/W6687322159","https://openalex.org/W6712120708"],"related_works":["https://openalex.org/W1970433854","https://openalex.org/W2384486034","https://openalex.org/W2023867642","https://openalex.org/W1905852083","https://openalex.org/W2325500789","https://openalex.org/W2051254741","https://openalex.org/W1534344224","https://openalex.org/W2982427177","https://openalex.org/W3194053468","https://openalex.org/W2986139856"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5,11,123,128,165,175,184],"novel":[6],"data":[7,13,19,48,66,72,102,137],"transformation":[8,67],"scheme":[9,68,77,88,121,155,182],"over":[10],"big":[12,47,136],"platform,":[14],"aiming":[15],"at":[16],"injecting":[17],"production":[18,101],"from":[20],"the":[21,25,32,65,71,83,90,109,132,150,153,157,162,180,188],"local":[22],"database":[23],"in":[24,142],"factory":[26,130,167,186],"side":[27],"and":[28,160],"transforming":[29],"them":[30],"into":[31,64,108],"workpiece-centric":[33,110],"form":[34,111],"that":[35,112],"many":[36],"manufacturing":[37,96,115,129,145],"analytics":[38],"systems":[39],"need.":[40],"The":[41],"key":[42,91],"idea":[43],"is":[44],"to":[45,82,93,126,164,183],"blend":[46],"processing":[49,63,73],"techniques,":[50],"including":[51],"table":[52],"composition":[53],"with":[54],"external":[55],"distributed":[56],"files,":[57],"columnar":[58],"storage,":[59],"partition,":[60],"massively":[61],"parallel":[62],"for":[69,168],"minimizing":[70],"time.":[74],"Our":[75],"proposed":[76,120,154,181],"brings":[78],"two":[79],"main":[80],"impacts":[81],"smart":[84,114],"manufacturing.":[85],"First,":[86],"our":[87,119,191],"plays":[89],"component":[92],"develop":[94],"data-driven":[95],"decision":[97],"systems,":[98],"since":[99,135],"large-volume":[100],"sources":[103],"can":[104],"be":[105],"efficiently":[106],"transformed":[107],"other":[113],"services":[116],"require.":[117],"Second,":[118],"provides":[122],"development":[124],"exemplar":[125],"assist":[127],"toward":[131],"Industry-4.0":[133],"realm,":[134],"techniques":[138],"are":[139],"ingeniously":[140],"blended":[141],"building":[143],"data-intensive":[144],"services.":[146],"We":[147],"finally":[148],"implement":[149],"prototype":[151,163],"of":[152,174,190],"on":[156],"Hadoop":[158],"platform":[159],"apply":[161],"semiconductor":[166,185],"conducting":[169],"integrated":[170],"tests.":[171],"Testing":[172],"results":[173],"case":[176],"study":[177],"physically":[178],"applying":[179],"demonstrate":[187],"success":[189],"work.":[192]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}