{"id":"https://openalex.org/W2042887506","doi":"https://doi.org/10.1109/coase.2013.6654027","title":"Attribute selection algorithm of data-based scheduling strategy for semiconductor manufacturing","display_name":"Attribute selection algorithm of data-based scheduling strategy for semiconductor manufacturing","publication_year":2013,"publication_date":"2013-08-01","ids":{"openalex":"https://openalex.org/W2042887506","doi":"https://doi.org/10.1109/coase.2013.6654027","mag":"2042887506"},"language":"en","primary_location":{"id":"doi:10.1109/coase.2013.6654027","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2013.6654027","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103108404","display_name":"Fei Qiao","orcid":"https://orcid.org/0000-0002-1513-8753"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Fei Qiao","raw_affiliation_strings":["School of Electronics & Information Engineering, Tongji University, Shanghai, CHINA","[Sch. of Electron. & Information Eng., Tongji Univ., Shanghai, China]"],"affiliations":[{"raw_affiliation_string":"School of Electronics & Information Engineering, Tongji University, Shanghai, CHINA","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"[Sch. of Electron. & Information Eng., Tongji Univ., Shanghai, China]","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051315321","display_name":"Yumin Ma","orcid":"https://orcid.org/0000-0001-9271-3363"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yumin Ma","raw_affiliation_strings":["School of Electronics & Information Engineering, Tongji University, Shanghai, CHINA","[Sch. of Electron. & Information Eng., Tongji Univ., Shanghai, China]"],"affiliations":[{"raw_affiliation_string":"School of Electronics & Information Engineering, Tongji University, Shanghai, CHINA","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"[Sch. of Electron. & Information Eng., Tongji Univ., Shanghai, China]","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100607711","display_name":"Xiang Gu","orcid":"https://orcid.org/0000-0002-2594-4118"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiang Gu","raw_affiliation_strings":["School of Electronics & Information Engineering, Tongji University, Shanghai, CHINA","[Sch. of Electron. & Information Eng., Tongji Univ., Shanghai, China]"],"affiliations":[{"raw_affiliation_string":"School of Electronics & Information Engineering, Tongji University, Shanghai, CHINA","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"[Sch. of Electron. & Information Eng., Tongji Univ., Shanghai, China]","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5103108404"],"corresponding_institution_ids":["https://openalex.org/I116953780"],"apc_list":null,"apc_paid":null,"fwci":0.6896,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.75924102,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"35","issue":null,"first_page":"410","last_page":"415"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7043206095695496},{"id":"https://openalex.org/keywords/scheduling","display_name":"Scheduling (production processes)","score":0.6314897537231445},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.5900238752365112},{"id":"https://openalex.org/keywords/production-control","display_name":"Production control","score":0.5312677621841431},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.4775191843509674},{"id":"https://openalex.org/keywords/production-line","display_name":"Production line","score":0.47445544600486755},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4715580642223358},{"id":"https://openalex.org/keywords/job-shop-scheduling","display_name":"Job shop scheduling","score":0.45577502250671387},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.44934001564979553},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.4387732148170471},{"id":"https://openalex.org/keywords/genetic-algorithm-scheduling","display_name":"Genetic algorithm scheduling","score":0.4386553466320038},{"id":"https://openalex.org/keywords/feature-selection","display_name":"Feature selection","score":0.42624416947364807},{"id":"https://openalex.org/keywords/production-manager","display_name":"Production manager","score":0.42513179779052734},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2570858597755432},{"id":"https://openalex.org/keywords/flow-shop-scheduling","display_name":"Flow shop scheduling","score":0.2510106563568115},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.20565849542617798},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18330419063568115}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7043206095695496},{"id":"https://openalex.org/C206729178","wikidata":"https://www.wikidata.org/wiki/Q2271896","display_name":"Scheduling (production processes)","level":2,"score":0.6314897537231445},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.5900238752365112},{"id":"https://openalex.org/C2780682718","wikidata":"https://www.wikidata.org/wiki/Q16321575","display_name":"Production control","level":3,"score":0.5312677621841431},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.4775191843509674},{"id":"https://openalex.org/C99862985","wikidata":"https://www.wikidata.org/wiki/Q10858068","display_name":"Production line","level":2,"score":0.47445544600486755},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4715580642223358},{"id":"https://openalex.org/C55416958","wikidata":"https://www.wikidata.org/wiki/Q6206757","display_name":"Job shop scheduling","level":3,"score":0.45577502250671387},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.44934001564979553},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.4387732148170471},{"id":"https://openalex.org/C159022435","wikidata":"https://www.wikidata.org/wiki/Q5532874","display_name":"Genetic algorithm scheduling","level":5,"score":0.4386553466320038},{"id":"https://openalex.org/C148483581","wikidata":"https://www.wikidata.org/wiki/Q446488","display_name":"Feature selection","level":2,"score":0.42624416947364807},{"id":"https://openalex.org/C135909481","wikidata":"https://www.wikidata.org/wiki/Q17092930","display_name":"Production manager","level":3,"score":0.42513179779052734},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2570858597755432},{"id":"https://openalex.org/C158336966","wikidata":"https://www.wikidata.org/wiki/Q3074426","display_name":"Flow shop scheduling","level":4,"score":0.2510106563568115},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.20565849542617798},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18330419063568115},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C68387754","wikidata":"https://www.wikidata.org/wiki/Q7271585","display_name":"Schedule","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/coase.2013.6654027","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2013.6654027","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W187357405","https://openalex.org/W190437827","https://openalex.org/W1555220825","https://openalex.org/W1981903510","https://openalex.org/W2051473520","https://openalex.org/W2053951935","https://openalex.org/W2099880607","https://openalex.org/W2114715354","https://openalex.org/W2115252758","https://openalex.org/W2148949939","https://openalex.org/W2153962305","https://openalex.org/W2158400788","https://openalex.org/W2165395862","https://openalex.org/W2360062444","https://openalex.org/W2362081766","https://openalex.org/W2378352956","https://openalex.org/W2393083508","https://openalex.org/W6607623206","https://openalex.org/W6607693206"],"related_works":["https://openalex.org/W4391342735","https://openalex.org/W2029316283","https://openalex.org/W2125597601","https://openalex.org/W4235093757","https://openalex.org/W1546051781","https://openalex.org/W2370727940","https://openalex.org/W2128000717","https://openalex.org/W2104208743","https://openalex.org/W2153949497","https://openalex.org/W1997397921"],"abstract_inverted_index":{"In":[0],"today's":[1],"digital":[2],"and":[3,16,51,77],"information-based":[4],"manufacturing":[5,111],"environment,":[6],"data":[7,24],"are":[8,31,42],"basic":[9],"elements":[10],"for":[11,124],"almost":[12],"every":[13],"production":[14,23,49,89,126,139],"control":[15,50],"management":[17,52],"activity.":[18],"This":[19,91],"paper":[20],"focuses":[21],"on":[22,27,83],"processing":[25],"based":[26],"attribute":[28,68],"analysis.":[29],"There":[30],"thousands":[32],"of":[33,40,86,95],"attributes":[34,60,104,127],"in":[35,109],"semiconductor":[36],"manufacturing.":[37],"However,":[38],"some":[39,47],"them":[41],"irrelevant":[43],"and/or":[44],"redundant":[45],"to":[46,57,72,101,114],"optimal":[48],"issues.":[53],"It":[54],"is":[55,92,100,128,133],"hard":[56],"decide":[58],"which":[59,103],"should":[61],"be":[62],"considered":[63],"as":[64],"input":[65],"references.":[66],"Rational":[67],"selection":[69,122],"may":[70],"lead":[71],"an":[73],"accurate":[74],"scheduling":[75,112],"strategy":[76],"finally":[78],"exerts":[79],"a":[80,115,136],"positive":[81],"impact":[82],"the":[84,87,93,106,110],"performance":[85,117],"whole":[88],"line.":[90,140],"motivation":[94],"this":[96],"work.":[97],"Its":[98,130],"goal":[99],"investigate":[102],"play":[105],"key":[107],"roles":[108],"according":[113],"specific":[116],"criterion.":[118],"A":[119],"genetic":[120],"algorithm-based":[121],"approach":[123],"feature":[125],"proposed.":[129],"prediction":[131],"accuracy":[132],"verified":[134],"via":[135],"practical":[137],"wafer":[138]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}