{"id":"https://openalex.org/W1999808756","doi":"https://doi.org/10.1109/coase.2013.6653934","title":"Automatic baseline-sample-selection scheme for baseline predictive maintenance","display_name":"Automatic baseline-sample-selection scheme for baseline predictive maintenance","publication_year":2013,"publication_date":"2013-08-01","ids":{"openalex":"https://openalex.org/W1999808756","doi":"https://doi.org/10.1109/coase.2013.6653934","mag":"1999808756"},"language":"en","primary_location":{"id":"doi:10.1109/coase.2013.6653934","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2013.6653934","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034259795","display_name":"Chunfang Chen","orcid":"https://orcid.org/0000-0002-1328-6277"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Fang Chen","raw_affiliation_strings":["Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C","Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088921274","display_name":"Yao\u2010Sheng Hsieh","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yao-Sheng Hsieh","raw_affiliation_strings":["Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C","Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037509897","display_name":"Fan\u2010Tien Cheng","orcid":"https://orcid.org/0000-0001-8201-223X"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Fan-Tien Cheng","raw_affiliation_strings":["Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C","Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100872802","display_name":"Hsien\u2010Cheng Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hsien-Cheng Huang","raw_affiliation_strings":["Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C","Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067111060","display_name":"Saint-Chi Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Saint-Chi Wang","raw_affiliation_strings":["Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C","Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Inst. of Manuf. Inf. & Syst., Nat. Cheng Kung Univ., Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I91807558"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"183","last_page":"188"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/baseline","display_name":"Baseline (sea)","score":0.8613275289535522},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.8224764466285706},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.7091385126113892},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6267988085746765},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.6016367673873901},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5240638256072998},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.49292469024658203},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4881385266780853},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.46422669291496277},{"id":"https://openalex.org/keywords/sample-mean-and-sample-covariance","display_name":"Sample mean and sample covariance","score":0.41179537773132324},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.39094078540802},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.34861525893211365},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24935531616210938},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22450923919677734},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.16393882036209106},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1486710011959076},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11862239241600037},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08349424600601196}],"concepts":[{"id":"https://openalex.org/C12725497","wikidata":"https://www.wikidata.org/wiki/Q810247","display_name":"Baseline (sea)","level":2,"score":0.8613275289535522},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.8224764466285706},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.7091385126113892},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6267988085746765},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.6016367673873901},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5240638256072998},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.49292469024658203},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4881385266780853},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.46422669291496277},{"id":"https://openalex.org/C181243257","wikidata":"https://www.wikidata.org/wiki/Q1693522","display_name":"Sample mean and sample covariance","level":3,"score":0.41179537773132324},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.39094078540802},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.34861525893211365},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24935531616210938},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22450923919677734},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.16393882036209106},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1486710011959076},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11862239241600037},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08349424600601196},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/coase.2013.6653934","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2013.6653934","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W639339342","https://openalex.org/W1974561605","https://openalex.org/W2005659508","https://openalex.org/W2013041820","https://openalex.org/W2021816127","https://openalex.org/W2022883512","https://openalex.org/W2071511176","https://openalex.org/W2091311817","https://openalex.org/W2136774956","https://openalex.org/W2159554491","https://openalex.org/W2169791524","https://openalex.org/W2917342912","https://openalex.org/W3022512959","https://openalex.org/W6653823843"],"related_works":["https://openalex.org/W1667647204","https://openalex.org/W2404647514","https://openalex.org/W4247536566","https://openalex.org/W2018477250","https://openalex.org/W3119814709","https://openalex.org/W4241418540","https://openalex.org/W1508895727","https://openalex.org/W2725786787","https://openalex.org/W4283160672","https://openalex.org/W1875930651"],"abstract_inverted_index":{"A":[0],"virtual-metrology-based":[1],"(VM-based)":[2],"baseline-predictive-maintenance":[3],"(BPM)":[4],"scheme":[5,41,147],"was":[6,87,95],"proposed":[7],"by":[8],"the":[9,14,25,39,45,48,52,59,66,74,84,93,124,129,132,150,155],"authors":[10],"recently.":[11],"By":[12],"applying":[13],"BPM":[15,40,53,125,133],"scheme,":[16],"fault":[17],"diagnosis":[18],"and":[19,24,68,73,100,114,127,153],"prognosis":[20],"can":[21,32],"be":[22,34],"accomplished":[23],"requirement":[26],"of":[27,38,47,57,65,83,131,137],"massive":[28],"historical":[29,71],"failure":[30],"data":[31,102],"also":[33,116],"released.":[35],"The":[36,55,135],"accuracy":[37],"highly":[42],"depends":[43],"on":[44],"correctness":[46],"baseline":[49,62],"models":[50],"in":[51],"scheme.":[54,134],"samples":[56,72,76,86,152,157],"creating":[58],"target-device":[60],"(TD)":[61],"model":[63],"consist":[64],"concise":[67],"healthy":[69,98],"(C&H)":[70],"fresh":[75],"just":[77],"after":[78],"maintenance.":[79],"Originally,":[80],"each":[81],"one":[82],"C&H":[85,151],"checked":[88],"manually":[89],"to":[90,141],"ensure":[91],"that":[92],"sample":[94],"generated":[96],"under":[97],"status":[99],"its":[101],"quality":[103],"is":[104,111,140],"good.":[105],"However,":[106],"this":[107,138],"health-&-quality":[108],"check":[109],"process":[110],"so":[112],"tedious":[113],"may":[115,122],"neglect":[117],"deleting":[118,154],"contradictory":[119,156],"samples,":[120],"which":[121],"deteriorate":[123],"results":[126],"prohibit":[128],"usage":[130],"purpose":[136],"paper":[139],"develop":[142],"an":[143],"automatic":[144],"baseline-sample-selection":[145],"(ABSS)":[146],"for":[148],"selecting":[149],"automatically.":[158]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}