{"id":"https://openalex.org/W2090672831","doi":"https://doi.org/10.1109/coase.2012.6386374","title":"Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing","display_name":"Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing","publication_year":2012,"publication_date":"2012-08-01","ids":{"openalex":"https://openalex.org/W2090672831","doi":"https://doi.org/10.1109/coase.2012.6386374","mag":"2090672831"},"language":"en","primary_location":{"id":"doi:10.1109/coase.2012.6386374","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2012.6386374","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011593588","display_name":"Gloria Luz Rodriguez-Verjan","orcid":null},"institutions":[{"id":"https://openalex.org/I3019848993","display_name":"Mines Saint-\u00c9tienne","ror":"https://ror.org/05a1dws80","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I205703379","https://openalex.org/I3019848993"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Gloria Rodriguez-Verjan","raw_affiliation_strings":["Centre Micro\u00e9lectronique de Provence, Ecole des Mines de Saint-\u00c9tienne, Gardanne, France","STMicroelectronics Rousset, Rousset, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre Micro\u00e9lectronique de Provence, Ecole des Mines de Saint-\u00c9tienne, Gardanne, France","institution_ids":["https://openalex.org/I3019848993"]},{"raw_affiliation_string":"STMicroelectronics Rousset, Rousset, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033487403","display_name":"Eric Tartiere","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Eric Tartiere","raw_affiliation_strings":["STMicroelectronics Rousset, Rousset, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics Rousset, Rousset, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011705857","display_name":"Jacques Pinaton","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jacques Pinaton","raw_affiliation_strings":["STMicroelectronics Rousset, Rousset, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics Rousset, Rousset, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028102263","display_name":"St\u00e9phane Dauz\u00e8re\u2010P\u00e9r\u00e8s","orcid":"https://orcid.org/0000-0002-3566-3248"},"institutions":[{"id":"https://openalex.org/I3019848993","display_name":"Mines Saint-\u00c9tienne","ror":"https://ror.org/05a1dws80","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I205703379","https://openalex.org/I3019848993"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Stephane Dauzere-Peres","raw_affiliation_strings":["Centre Micro\u00e9lectronique de Provence, Ecole des Mines de Saint-\u00c9tienne, Gardanne, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centre Micro\u00e9lectronique de Provence, Ecole des Mines de Saint-\u00c9tienne, Gardanne, France","institution_ids":["https://openalex.org/I3019848993"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033111924","display_name":"Alexis Thieullen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alexis Thieullen","raw_affiliation_strings":["STMicroelectronics Rousset, Rousset, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics Rousset, Rousset, France","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3887,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.84948939,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"920","last_page":"923"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9815000295639038,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9800999760627747,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scope","display_name":"Scope (computer science)","score":0.7841346263885498},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.742998480796814},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.7191523313522339},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.6198187470436096},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6147780418395996},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5903170704841614},{"id":"https://openalex.org/keywords/wafer-fabrication","display_name":"Wafer fabrication","score":0.5194079875946045},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5058298110961914},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.41084909439086914},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36467990279197693},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.12696009874343872}],"concepts":[{"id":"https://openalex.org/C2778012447","wikidata":"https://www.wikidata.org/wiki/Q1034415","display_name":"Scope (computer science)","level":2,"score":0.7841346263885498},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.742998480796814},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.7191523313522339},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.6198187470436096},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6147780418395996},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5903170704841614},{"id":"https://openalex.org/C35750839","wikidata":"https://www.wikidata.org/wiki/Q7959421","display_name":"Wafer fabrication","level":3,"score":0.5194079875946045},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5058298110961914},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.41084909439086914},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36467990279197693},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.12696009874343872},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/coase.2012.6386374","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2012.6386374","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:emse-00722672v1","is_oa":false,"landing_page_url":"https://hal-emse.ccsd.cnrs.fr/emse-00722672","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"8th IEEE International conference on Automation Science and Engineering, Aug 2012, Seoul, South Korea. pp.1-4","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W3489370","https://openalex.org/W2013927912","https://openalex.org/W2020460778","https://openalex.org/W2082083708","https://openalex.org/W2103117824","https://openalex.org/W2121487085","https://openalex.org/W2134413183","https://openalex.org/W2151186428","https://openalex.org/W2224480906","https://openalex.org/W2483664965","https://openalex.org/W3149311483"],"related_works":["https://openalex.org/W2170726572","https://openalex.org/W2146435486","https://openalex.org/W2006086900","https://openalex.org/W1483119123","https://openalex.org/W2377558694","https://openalex.org/W2992897358","https://openalex.org/W2394172622","https://openalex.org/W1594978932","https://openalex.org/W2083418455","https://openalex.org/W2140718007"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"lot":[4],"dispatching":[5,53],"strategy":[6,54],"to":[7,28],"reduce":[8],"the":[9,18,29,35,70,75,82],"Wafer":[10,83],"at":[11,84],"Risk":[12,85],"(W@R)":[13],"on":[14,86],"process":[15,33,87],"tools,":[16],"i.e.":[17],"number":[19],"of":[20,38,49,77],"wafers":[21],"processed":[22],"between":[23],"two":[24],"defectivity":[25,40],"inspections.":[26],"Due":[27],"highly":[30],"complex":[31],"manufacturing":[32],"and":[34,81],"molecular":[36],"scope":[37],"operations,":[39],"inspections":[41],"are":[42],"critical":[43],"for":[44],"sustaining":[45],"high":[46],"yield":[47],"levels":[48],"products.":[50],"The":[51],"novel":[52],"guides":[55],"operators":[56],"in":[57,65],"selecting":[58],"lots":[59],"that":[60,69],"will":[61],"later":[62],"be":[63],"controlled":[64],"defectivity.":[66],"Results":[67],"show":[68],"system":[71],"is":[72],"effective":[73],"since":[74],"impact":[76],"measures":[78],"has":[79,89],"improved":[80],"tools":[88],"been":[90],"reduced.":[91]},"counts_by_year":[{"year":2013,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}