{"id":"https://openalex.org/W2139733995","doi":"https://doi.org/10.1109/coase.2009.5234182","title":"Presentation and improvement of an AFM-based system for the measurement of adhesion forces","display_name":"Presentation and improvement of an AFM-based system for the measurement of adhesion forces","publication_year":2009,"publication_date":"2009-08-01","ids":{"openalex":"https://openalex.org/W2139733995","doi":"https://doi.org/10.1109/coase.2009.5234182","mag":"2139733995"},"language":"en","primary_location":{"id":"doi:10.1109/coase.2009.5234182","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2009.5234182","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Conference on Automation Science and Engineering","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019160451","display_name":"Micky Rakotondrabe","orcid":"https://orcid.org/0000-0002-6413-7271"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I53262699","display_name":"\u00c9cole Nationale Sup\u00e9rieure de M\u00e9canique et des Microtechniques","ror":"https://ror.org/05813w841","country_code":"FR","type":"education","lineage":["https://openalex.org/I53262699"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Micky Rakotondrabe","raw_affiliation_strings":["UMR CNRS-6174 / UFC / ENSMM / UTBM, Micro-Mechatronic Systems Department (AS2M Department), FEMTO-st Institute, Besancon, France","UMR CNRS-6174, UFC, ENSMM, Automatic Control and Micro-Mechatronic Systems Department, AS2M Department, FEMTO-st Institute, UTBM, Besan\u00e7on, France#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UMR CNRS-6174 / UFC / ENSMM / UTBM, Micro-Mechatronic Systems Department (AS2M Department), FEMTO-st Institute, Besancon, France","institution_ids":["https://openalex.org/I53262699","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"UMR CNRS-6174, UFC, ENSMM, Automatic Control and Micro-Mechatronic Systems Department, AS2M Department, FEMTO-st Institute, UTBM, Besan\u00e7on, France#TAB#","institution_ids":["https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103953081","display_name":"Patrick Rougeot","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I53262699","display_name":"\u00c9cole Nationale Sup\u00e9rieure de M\u00e9canique et des Microtechniques","ror":"https://ror.org/05813w841","country_code":"FR","type":"education","lineage":["https://openalex.org/I53262699"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick Rougeot","raw_affiliation_strings":["UMR CNRS-6174 / UFC / ENSMM / UTBM, Micro-Mechatronic Systems Department (AS2M Department), FEMTO-st Institute, Besancon, France","UMR CNRS-6174, UFC, ENSMM, Automatic Control and Micro-Mechatronic Systems Department, AS2M Department, FEMTO-st Institute, UTBM, Besan\u00e7on, France#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UMR CNRS-6174 / UFC / ENSMM / UTBM, Micro-Mechatronic Systems Department (AS2M Department), FEMTO-st Institute, Besancon, France","institution_ids":["https://openalex.org/I53262699","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"UMR CNRS-6174, UFC, ENSMM, Automatic Control and Micro-Mechatronic Systems Department, AS2M Department, FEMTO-st Institute, UTBM, Besan\u00e7on, France#TAB#","institution_ids":["https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.231,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.60607037,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"585","last_page":"590"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11525","display_name":"Piezoelectric Actuators and Control","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hysteresis","display_name":"Hysteresis","score":0.7276932001113892},{"id":"https://openalex.org/keywords/van-der-waals-force","display_name":"van der Waals force","score":0.7124404907226562},{"id":"https://openalex.org/keywords/adhesion","display_name":"Adhesion","score":0.6520114541053772},{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.6221533417701721},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.5882799029350281},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.44255250692367554},{"id":"https://openalex.org/keywords/lever","display_name":"Lever","score":0.43469002842903137},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.3742172420024872},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35965535044670105},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3425511419773102},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.31345057487487793},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2200309932231903},{"id":"https://openalex.org/keywords/molecule","display_name":"Molecule","score":0.13718077540397644},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.12428304553031921},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11221960186958313},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.10421288013458252}],"concepts":[{"id":"https://openalex.org/C123299182","wikidata":"https://www.wikidata.org/wiki/Q190837","display_name":"Hysteresis","level":2,"score":0.7276932001113892},{"id":"https://openalex.org/C126061179","wikidata":"https://www.wikidata.org/wiki/Q189627","display_name":"van der Waals force","level":3,"score":0.7124404907226562},{"id":"https://openalex.org/C84416704","wikidata":"https://www.wikidata.org/wiki/Q188666","display_name":"Adhesion","level":2,"score":0.6520114541053772},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.6221533417701721},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5882799029350281},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.44255250692367554},{"id":"https://openalex.org/C107524782","wikidata":"https://www.wikidata.org/wiki/Q40164","display_name":"Lever","level":2,"score":0.43469002842903137},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3742172420024872},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35965535044670105},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3425511419773102},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31345057487487793},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2200309932231903},{"id":"https://openalex.org/C32909587","wikidata":"https://www.wikidata.org/wiki/Q11369","display_name":"Molecule","level":2,"score":0.13718077540397644},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.12428304553031921},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11221960186958313},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.10421288013458252},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/coase.2009.5234182","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2009.5234182","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Conference on Automation Science and Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320883","display_name":"Agence Nationale de la Recherche","ror":"https://ror.org/00rbzpz17"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1986810687","https://openalex.org/W2019758703","https://openalex.org/W2058209887","https://openalex.org/W2061515128","https://openalex.org/W2110189618","https://openalex.org/W2124614417","https://openalex.org/W2141945233","https://openalex.org/W2161176408","https://openalex.org/W2293686648","https://openalex.org/W2460821334","https://openalex.org/W2503576964"],"related_works":["https://openalex.org/W2319849381","https://openalex.org/W3208483585","https://openalex.org/W809494831","https://openalex.org/W4379985877","https://openalex.org/W4250682053","https://openalex.org/W2341184654","https://openalex.org/W2996939057","https://openalex.org/W2362409171","https://openalex.org/W2350467400","https://openalex.org/W2523035732"],"abstract_inverted_index":{"The":[0],"aim":[1],"of":[2,10,78,104],"this":[3,49],"paper":[4],"is":[5,46,53,98],"the":[6,57,61,64,67,76,79,82,85,89,102,105],"presentation":[7],"and":[8,26,66,87],"improvement":[9],"an":[11,20,51],"AFM-based":[12],"system":[13,91],"dedicated":[14],"to":[15,34,55],"measure":[16],"adhesion":[17,58],"forces.":[18],"Because":[19],"AFM-lever":[21],"presents":[22],"a":[23,27,94],"high":[24,28],"linearity":[25],"resolution,":[29],"it":[30],"can":[31,72],"be":[32,73],"used":[33,54],"characterize":[35],"forces":[36,59,71],"that":[37],"appears":[38],"between":[39],"two":[40],"micro-objects":[41],"when":[42],"their":[43],"relative":[44],"distance":[45],"small.":[47],"In":[48],"paper,":[50],"AFM":[52],"evaluate":[56],"versus":[60],"distance.":[62],"Especially,":[63],"pull-off":[65],"Van":[68],"Der":[69],"Waals":[70],"quantified.":[74],"Unfortunately,":[75],"presence":[77],"hysteresis":[80,96],"on":[81,110],"piezotube":[83],"distorts":[84],"measurement":[86,107],"makes":[88],"whole":[90],"imprecise.":[92],"Hence,":[93],"Prandtl-Ishlinskii":[95],"compensator":[97],"introduced.":[99],"To":[100],"show":[101],"efficiency":[103],"improved":[106],"system,":[108],"experiments":[109],"different":[111],"materials":[112],"where":[113],"performed.":[114]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}