{"id":"https://openalex.org/W2123997966","doi":"https://doi.org/10.1109/coase.2007.4341712","title":"A Consolidated Approach to Minimize Semiconductor Production Loss Due to Unscheduled ATE Downtime","display_name":"A Consolidated Approach to Minimize Semiconductor Production Loss Due to Unscheduled ATE Downtime","publication_year":2007,"publication_date":"2007-09-01","ids":{"openalex":"https://openalex.org/W2123997966","doi":"https://doi.org/10.1109/coase.2007.4341712","mag":"2123997966"},"language":"en","primary_location":{"id":"doi:10.1109/coase.2007.4341712","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2007.4341712","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Conference on Automation Science and Engineering","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012285299","display_name":"Tongdan Jin","orcid":"https://orcid.org/0000-0001-7845-9936"},"institutions":[{"id":"https://openalex.org/I131740757","display_name":"Texas A&M International University","ror":"https://ror.org/028861t28","country_code":"US","type":"education","lineage":["https://openalex.org/I131740757"]},{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tongdan Jin","raw_affiliation_strings":["Texas A and M International University, Laredo, TX, USA","Texas A&M Int. Univ., Laredo"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas A and M International University, Laredo, TX, USA","institution_ids":["https://openalex.org/I131740757"]},{"raw_affiliation_string":"Texas A&M Int. Univ., Laredo","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071929352","display_name":"F. Belkhouche","orcid":"https://orcid.org/0000-0002-0083-086X"},"institutions":[{"id":"https://openalex.org/I131740757","display_name":"Texas A&M International University","ror":"https://ror.org/028861t28","country_code":"US","type":"education","lineage":["https://openalex.org/I131740757"]},{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fethi Belkhouche","raw_affiliation_strings":["Texas A and M International University, Laredo, TX, USA","Texas A&M Int. Univ., Laredo"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas A and M International University, Laredo, TX, USA","institution_ids":["https://openalex.org/I131740757"]},{"raw_affiliation_string":"Texas A&M Int. Univ., Laredo","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033252436","display_name":"Chen-han Sung","orcid":null},"institutions":[{"id":"https://openalex.org/I131740757","display_name":"Texas A&M International University","ror":"https://ror.org/028861t28","country_code":"US","type":"education","lineage":["https://openalex.org/I131740757"]},{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chen-Han Sung","raw_affiliation_strings":["Texas A and M International University, Laredo, TX, USA","Texas A&M Int. Univ., Laredo"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas A and M International University, Laredo, TX, USA","institution_ids":["https://openalex.org/I131740757"]},{"raw_affiliation_string":"Texas A&M Int. Univ., Laredo","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"7","issue":null,"first_page":"188","last_page":"193"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13706","display_name":"Management and Optimization Techniques","score":0.9779000282287598,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/downtime","display_name":"Downtime","score":0.9539476633071899},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7706018686294556},{"id":"https://openalex.org/keywords/preventive-maintenance","display_name":"Preventive maintenance","score":0.7029103636741638},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6911550760269165},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.5847973823547363},{"id":"https://openalex.org/keywords/maintenance-engineering","display_name":"Maintenance engineering","score":0.4641927480697632},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4637010991573334},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4573189616203308},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.452745258808136},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4297979176044464},{"id":"https://openalex.org/keywords/idle","display_name":"Idle","score":0.42217403650283813},{"id":"https://openalex.org/keywords/budget-constraint","display_name":"Budget constraint","score":0.4192427098751068}],"concepts":[{"id":"https://openalex.org/C180591934","wikidata":"https://www.wikidata.org/wiki/Q1253369","display_name":"Downtime","level":2,"score":0.9539476633071899},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7706018686294556},{"id":"https://openalex.org/C24090081","wikidata":"https://www.wikidata.org/wiki/Q1043452","display_name":"Preventive maintenance","level":2,"score":0.7029103636741638},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6911550760269165},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.5847973823547363},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.4641927480697632},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4637010991573334},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4573189616203308},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.452745258808136},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4297979176044464},{"id":"https://openalex.org/C16320812","wikidata":"https://www.wikidata.org/wiki/Q1812200","display_name":"Idle","level":2,"score":0.42217403650283813},{"id":"https://openalex.org/C8505890","wikidata":"https://www.wikidata.org/wiki/Q605095","display_name":"Budget constraint","level":2,"score":0.4192427098751068},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C133425853","wikidata":"https://www.wikidata.org/wiki/Q60571","display_name":"Neoclassical economics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/coase.2007.4341712","is_oa":false,"landing_page_url":"https://doi.org/10.1109/coase.2007.4341712","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Conference on Automation Science and Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","score":0.5299999713897705,"id":"https://metadata.un.org/sdg/8"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1523010103","https://openalex.org/W1923374043","https://openalex.org/W1947418710","https://openalex.org/W2068525803","https://openalex.org/W2071275923","https://openalex.org/W2104948512","https://openalex.org/W2111095683","https://openalex.org/W2115170364","https://openalex.org/W3154170891","https://openalex.org/W6794212586"],"related_works":["https://openalex.org/W4214827973","https://openalex.org/W2672304337","https://openalex.org/W2187904564","https://openalex.org/W3144562559","https://openalex.org/W2349635908","https://openalex.org/W2029157094","https://openalex.org/W3049513231","https://openalex.org/W4387622039","https://openalex.org/W2159923716","https://openalex.org/W2073775770"],"abstract_inverted_index":{"A":[0],"production-loss":[1],"based":[2],"maintenance":[3,108],"plan":[4],"is":[5,53,83,87,120,135],"proposed":[6],"to":[7,12,37,49,89,107,122,140,147],"minimize":[8,90,141],"the":[9,20,39,46,69,72,80,91,95,124,142],"cost":[10],"due":[11,146],"unscheduled":[13,148],"ATE":[14,40],"(automatic":[15],"test":[16],"equipment)":[17],"downtime":[18],"in":[19],"back-end":[21],"process":[22],"of":[23],"semiconductor":[24,143],"manufacturing.":[25],"This":[26,51],"paper":[27],"suggests":[28],"two":[29],"methods,":[30],"active":[31],"redundancy":[32],"and":[33,64,78,100,110],"cold":[34],"standby":[35],"redundancy,":[36],"expedite":[38],"system":[41,47,73,96,149],"repair":[42,70],"time":[43,75],"for":[44],"returning":[45],"back":[48],"production.":[50],"strategy":[52],"different":[54],"from":[55],"other":[56],"reliability":[57],"improvement":[58],"methods":[59],"such":[60],"as":[61],"corrective":[62],"actions":[63],"preventive":[65],"maintenance.":[66],"By":[67],"reducing":[68],"time,":[71],"upper":[74],"actually":[76],"increases":[77],"hence":[79],"production":[81,92,144],"loss":[82,93,145],"minimized.":[84],"The":[85,127],"optimization":[86,116],"formulated":[88],"considering":[94],"depreciations,":[97],"lost":[98],"sales":[99],"idle":[101],"labor":[102],"when":[103],"they":[104],"are":[105],"subject":[106],"budget":[109],"volume":[111],"constraint.":[112],"To":[113],"solve":[114],"this":[115],"problem,":[117],"genetic":[118],"algorithm":[119],"used":[121],"find":[123],"near-optimal":[125],"solution.":[126],"illustrative":[128],"example":[129],"demonstrates":[130],"that":[131],"using":[132],"redundant":[133],"modules":[134],"a":[136],"very":[137],"effective":[138],"way":[139],"downtime.":[150]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}