{"id":"https://openalex.org/W4293053470","doi":"https://doi.org/10.1109/civemsa53371.2022.9853692","title":"Mixed-Signal Test System for Education in Instrumentation and Measurement Technology","display_name":"Mixed-Signal Test System for Education in Instrumentation and Measurement Technology","publication_year":2022,"publication_date":"2022-06-15","ids":{"openalex":"https://openalex.org/W4293053470","doi":"https://doi.org/10.1109/civemsa53371.2022.9853692"},"language":"en","primary_location":{"id":"doi:10.1109/civemsa53371.2022.9853692","is_oa":false,"landing_page_url":"https://doi.org/10.1109/civemsa53371.2022.9853692","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 9th International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109061634","display_name":"James Y. Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I51158804","display_name":"Massey University","ror":"https://ror.org/052czxv31","country_code":"NZ","type":"education","lineage":["https://openalex.org/I51158804"]}],"countries":["NZ"],"is_corresponding":true,"raw_author_name":"J. Xu","raw_affiliation_strings":["Massey University,School of Food & Advanced Technology,Auckland,New Zealand"],"affiliations":[{"raw_affiliation_string":"Massey University,School of Food & Advanced Technology,Auckland,New Zealand","institution_ids":["https://openalex.org/I51158804"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087503126","display_name":"Serge Demidenko","orcid":"https://orcid.org/0000-0001-9883-9311"},"institutions":[{"id":"https://openalex.org/I84339108","display_name":"Sunway University","ror":"https://ror.org/04mjt7f73","country_code":"MY","type":"education","lineage":["https://openalex.org/I84339108"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"S. Demidenko","raw_affiliation_strings":["Sunway University,School of Science & Technology,Kuala Lumpur,Malaysia"],"affiliations":[{"raw_affiliation_string":"Sunway University,School of Science & Technology,Kuala Lumpur,Malaysia","institution_ids":["https://openalex.org/I84339108"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084405350","display_name":"M. T. Chew","orcid":"https://orcid.org/0000-0002-7820-1203"},"institutions":[{"id":"https://openalex.org/I51158804","display_name":"Massey University","ror":"https://ror.org/052czxv31","country_code":"NZ","type":"education","lineage":["https://openalex.org/I51158804"]}],"countries":["NZ"],"is_corresponding":false,"raw_author_name":"M. T. Chew","raw_affiliation_strings":["Massey University,School of Food & Advanced Technology,Auckland,New Zealand"],"affiliations":[{"raw_affiliation_string":"Massey University,School of Food & Advanced Technology,Auckland,New Zealand","institution_ids":["https://openalex.org/I51158804"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5109061634"],"corresponding_institution_ids":["https://openalex.org/I51158804"],"apc_list":null,"apc_paid":null,"fwci":0.1381,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.4695618,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11283","display_name":"Experimental Learning in Engineering","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9783999919891357,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/signal-conditioning","display_name":"Signal conditioning","score":0.7066546082496643},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.626814603805542},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6081239581108093},{"id":"https://openalex.org/keywords/virtual-instrumentation","display_name":"Virtual instrumentation","score":0.5635254979133606},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5621544122695923},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.549718976020813},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.4989454746246338},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.4948059916496277},{"id":"https://openalex.org/keywords/desk","display_name":"Desk","score":0.4913279116153717},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4682748317718506},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44310006499290466},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4082447290420532},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.31766992807388306},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3034311532974243},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.1379782259464264},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08413949608802795}],"concepts":[{"id":"https://openalex.org/C2780412824","wikidata":"https://www.wikidata.org/wiki/Q3686420","display_name":"Signal conditioning","level":3,"score":0.7066546082496643},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.626814603805542},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6081239581108093},{"id":"https://openalex.org/C2781331281","wikidata":"https://www.wikidata.org/wiki/Q2392056","display_name":"Virtual instrumentation","level":3,"score":0.5635254979133606},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5621544122695923},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.549718976020813},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.4989454746246338},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.4948059916496277},{"id":"https://openalex.org/C2776545233","wikidata":"https://www.wikidata.org/wiki/Q1064858","display_name":"Desk","level":2,"score":0.4913279116153717},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4682748317718506},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44310006499290466},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4082447290420532},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.31766992807388306},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3034311532974243},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1379782259464264},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08413949608802795},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/civemsa53371.2022.9853692","is_oa":false,"landing_page_url":"https://doi.org/10.1109/civemsa53371.2022.9853692","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 9th International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5600000023841858,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2350426749","https://openalex.org/W2035101737","https://openalex.org/W1846623049","https://openalex.org/W2128579103","https://openalex.org/W2050038522","https://openalex.org/W2086413578","https://openalex.org/W2369012846","https://openalex.org/W4247344346","https://openalex.org/W2126327439","https://openalex.org/W4293053470"],"abstract_inverted_index":{"This":[0],"paper":[1],"discusses":[2],"the":[3,11,32,43,56,89,97],"development":[4,47],"of":[5,13,31,84],"a":[6,22,64],"low-cost":[7],"desk-top":[8],"system":[9,39],"for":[10],"teaching":[12],"mixed-signal":[14,35],"circuit":[15],"automated":[16],"electronic":[17],"testing.":[18],"The":[19,38,72,92],"device-under-test":[20],"is":[21,29,40,74],"typical":[23],"8-bit":[24],"analog-to-digital":[25],"converter":[26],"(ADC)":[27],"which":[28],"one":[30],"most":[33],"common":[34],"integrated":[36],"circuits.":[37],"based":[41],"on":[42],"general-purpose":[44],"National":[45],"Instrument":[46],"tools":[48],"(LabView":[49],"software":[50],"environment":[51],"and":[52,59,69,99,106],"ELVIS":[53],"hardware":[54],"providing":[55],"relevant":[57],"sensor":[58],"signal-conditioning":[60],"resources)":[61],"combined":[62],"with":[63],"custom-made":[65],"test":[66],"load":[67],"board":[68],"application-specific":[70],"software.":[71],"goal":[73],"to":[75],"assist":[76],"students":[77],"in":[78,88],"understanding":[79],"how":[80],"basic":[81],"static":[82,94],"characteristics":[83],"ADC":[85],"are":[86],"tested":[87],"real-world":[90],"industry.":[91],"measured":[93],"parameters":[95],"include":[96],"offset":[98],"gain":[100],"errors,":[101],"as":[102,104],"well":[103],"differential":[105],"integral":[107],"non-linearities.":[108]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}