{"id":"https://openalex.org/W7161139091","doi":"https://doi.org/10.1109/cicc65509.2026.11509606","title":"A 400 \u00d7 400 Perovskite Image Sensor with Pixel-Wise Dynamic Self-Adjustment Using Time-Efficient Multiple Sampling and Adaptive Resolution","display_name":"A 400 \u00d7 400 Perovskite Image Sensor with Pixel-Wise Dynamic Self-Adjustment Using Time-Efficient Multiple Sampling and Adaptive Resolution","publication_year":2026,"publication_date":"2026-04-19","ids":{"openalex":"https://openalex.org/W7161139091","doi":"https://doi.org/10.1109/cicc65509.2026.11509606"},"language":"en","primary_location":{"id":"doi:10.1109/cicc65509.2026.11509606","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc65509.2026.11509606","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041098432","display_name":"Kyuik Cho","orcid":"https://orcid.org/0009-0001-4271-7881"},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Kyuik Cho","raw_affiliation_strings":["ETH Zurich,Department of Information Technology and Electrical Engineering,Zurich,Switzerland,8092"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ETH Zurich,Department of Information Technology and Electrical Engineering,Zurich,Switzerland,8092","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136130041","display_name":"Sergey Tsarev","orcid":null},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Sergey Tsarev","raw_affiliation_strings":["ETH Zurich,Department of Chemistry and Applied Biosciences,Zurich,Switzerland,8093"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ETH Zurich,Department of Chemistry and Applied Biosciences,Zurich,Switzerland,8093","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136132880","display_name":"Quang Lung","orcid":null},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Quang Lung","raw_affiliation_strings":["ETH Zurich,Department of Chemistry and Applied Biosciences,Zurich,Switzerland,8093"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ETH Zurich,Department of Chemistry and Applied Biosciences,Zurich,Switzerland,8093","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011394732","display_name":"Erfu Wu","orcid":"https://orcid.org/0000-0001-7728-5284"},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Erfu Wu","raw_affiliation_strings":["ETH Zurich,Department of Information Technology and Electrical Engineering,Zurich,Switzerland,8092"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ETH Zurich,Department of Information Technology and Electrical Engineering,Zurich,Switzerland,8092","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019482618","display_name":"Sergii Yakunin","orcid":"https://orcid.org/0000-0002-6409-0565"},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Sergii Yakunin","raw_affiliation_strings":["ETH Zurich,Department of Chemistry and Applied Biosciences,Zurich,Switzerland,8093"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ETH Zurich,Department of Chemistry and Applied Biosciences,Zurich,Switzerland,8093","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136167717","display_name":"Ivan Shorubalko","orcid":null},"institutions":[{"id":"https://openalex.org/I71824836","display_name":"Swiss Federal Laboratories for Materials Science and Technology","ror":"https://ror.org/02x681a42","country_code":"CH","type":"facility","lineage":["https://openalex.org/I2799323385","https://openalex.org/I71824836"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Ivan Shorubalko","raw_affiliation_strings":["Empa – Swiss Federal Laboratories for Materials Science and Technology,Dubendorf,Switzerland,8600"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Empa – Swiss Federal Laboratories for Materials Science and Technology,Dubendorf,Switzerland,8600","institution_ids":["https://openalex.org/I71824836"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136121552","display_name":"Maksym Kovalenko","orcid":null},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Maksym Kovalenko","raw_affiliation_strings":["ETH Zurich,Department of Chemistry and Applied Biosciences,Zurich,Switzerland,8093"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ETH Zurich,Department of Chemistry and Applied Biosciences,Zurich,Switzerland,8093","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5136164703","display_name":"Taekwang Jang","orcid":null},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Taekwang Jang","raw_affiliation_strings":["ETH Zurich,Department of Information Technology and Electrical Engineering,Zurich,Switzerland,8092"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ETH Zurich,Department of Information Technology and Electrical Engineering,Zurich,Switzerland,8092","institution_ids":["https://openalex.org/I35440088"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.4738791,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10247","display_name":"Perovskite Materials and Applications","score":0.3125999867916107,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10247","display_name":"Perovskite Materials and Applications","score":0.3125999867916107,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.22990000247955322,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.047600001096725464,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.3391000032424927},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3240000009536743},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.31779998540878296},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.31209999322891235},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.2865000069141388},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.28369998931884766}],"concepts":[{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.539900004863739},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5008999705314636},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49050000309944153},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.3391000032424927},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3240000009536743},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.31779998540878296},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.31209999322891235},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.2865000069141388},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.28369998931884766},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2759999930858612},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.26499998569488525},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.2606000006198883},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.2542000114917755},{"id":"https://openalex.org/C155011858","wikidata":"https://www.wikidata.org/wiki/Q3036449","display_name":"Perovskite (structure)","level":2,"score":0.2529999911785126}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/cicc65509.2026.11509606","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc65509.2026.11509606","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},{"id":"pmh:oai:dora:empa_45676","is_oa":false,"landing_page_url":"https://www.dora.lib4ri.ch/empa/item/empa:45676","pdf_url":null,"source":{"id":"https://openalex.org/S4306401298","display_name":"DORA Empa (Swiss Federal Laboratories for Materials Science and Technology (Empa))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I71824836","host_organization_name":"Swiss Federal Laboratories for Materials Science and Technology","host_organization_lineage":["https://openalex.org/I71824836"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"46th annual IEEE custom integrated circuits conference, CICC 2026","raw_type":"Proceedings Paper"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6933202743530273}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,64,69,84],"400":[4,6],"x":[5],"perovskite":[7,101],"image":[8],"sensor":[9],"incorporating":[10],"time-efficient":[11],"multiple":[12,34],"sampling":[13,35],"(TEMS)":[14],"and":[15,51,93],"adaptive":[16],"resolution":[17,42],"(AR)":[18],"techniques.":[19],"The":[20],"proposed":[21],"TEMS":[22,79],"achieves":[23],"noise":[24,76],"reduction":[25],"with":[26,77,98],"minimal":[27],"frame":[28,87],"rate":[29,88],"penalty":[30],"compared":[31,80],"to":[32,48,81],"conventional":[33,90],"(MS),":[36],"while":[37],"AR":[38],"dynamically":[39],"adjusts":[40],"the":[41,52,108],"of":[43],"each":[44],"column":[45],"ADC":[46],"according":[47],"signal":[49],"level":[50],"focused":[53],"imaging":[54],"region,":[55],"thereby":[56],"minimizing":[57],"power":[58,96],"consumption.":[59],"A":[60,100],"readout":[61,110],"circuit":[62],"for":[63],"prototype":[65],"is":[66,104],"fabricated":[67],"in":[68],"180nm":[70],"CMOS":[71,109],"process,":[72],"achieving":[73],"41%":[74],"lower":[75,95],"4-times":[78,91],"single":[82],"sampling,":[83],"36%":[85],"higher":[86],"than":[89],"MS,":[92],"24%":[94],"consumption":[97],"AR.":[99],"photodetector":[102],"array":[103],"monolithically":[105],"integrated":[106],"on":[107],"chip":[111],"through":[112],"post-processing":[113],"steps.":[114]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-05-15T00:00:00"}