{"id":"https://openalex.org/W7161172784","doi":"https://doi.org/10.1109/cicc65509.2026.11509538","title":"A 40MHz Dual BEoL-RC Frequency Reference in 28nm CMOS with +440/-230ppm Inaccuracy from \u221255\u00b0C to 125\u00b0C and +940/+50ppm Inaccuracy After Accelerated Aging","display_name":"A 40MHz Dual BEoL-RC Frequency Reference in 28nm CMOS with +440/-230ppm Inaccuracy from \u221255\u00b0C to 125\u00b0C and +940/+50ppm Inaccuracy After Accelerated Aging","publication_year":2026,"publication_date":"2026-04-19","ids":{"openalex":"https://openalex.org/W7161172784","doi":"https://doi.org/10.1109/cicc65509.2026.11509538"},"language":null,"primary_location":{"id":"doi:10.1109/cicc65509.2026.11509538","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc65509.2026.11509538","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102746777","display_name":"Yihang Cheng","orcid":"https://orcid.org/0009-0006-6660-2356"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yihang Cheng","raw_affiliation_strings":["Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100413568","display_name":"Haiyu Wang","orcid":"https://orcid.org/0000-0001-5438-0422"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiyu Wang","raw_affiliation_strings":["Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136166857","display_name":"Ziyi Li","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziyi Li","raw_affiliation_strings":["Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102581098","display_name":"Minge Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Minge Jiang","raw_affiliation_strings":["Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136152705","display_name":"Xiaohan Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaohan Liu","raw_affiliation_strings":["Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136179869","display_name":"Yihan Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210096887","display_name":"HKUST Shenzhen Research Institute","ror":"https://ror.org/00sz56h79","country_code":"CN","type":"facility","lineage":["https://openalex.org/I200769079","https://openalex.org/I20231570","https://openalex.org/I4210096887","https://openalex.org/I4210147811"]},{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["CN","HK"],"is_corresponding":false,"raw_author_name":"Yihan Zhang","raw_affiliation_strings":["HKUST,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"HKUST,China","institution_ids":["https://openalex.org/I4210096887","https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136116622","display_name":"Huaqiang Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaqiang Wu","raw_affiliation_strings":["Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5136145125","display_name":"Sining Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sining Pan","raw_affiliation_strings":["Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua University,School of Integrated Circuits, BNRist,Beijing,China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.5982000231742859,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.5982000231742859,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.15049999952316284,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.12610000371932983,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5802000164985657},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.48339998722076416},{"id":"https://openalex.org/keywords/accelerated-aging","display_name":"Accelerated aging","score":0.34540000557899475},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.2919999957084656},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.289000004529953}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5956000089645386},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5802000164985657},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5217999815940857},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.48339998722076416},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3817000091075897},{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.34540000557899475},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.2919999957084656},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.289000004529953},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.2883000075817108},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2824000120162964},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2581000030040741}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc65509.2026.11509538","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc65509.2026.11509538","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,10,19],"high-accuracy":[4],"RC":[5,31,34],"frequency":[6,57],"reference":[7,58],"realized":[8,37],"in":[9,80],"standard":[11],"28nm":[12,81],"CMOS":[13],"technology.":[14],"It":[15],"is":[16,36],"based":[17],"on":[18],"digital":[20],"frequency-locked":[21],"loop":[22],"that":[23],"locks":[24],"the":[25,56],"frequency-phase":[26],"characteristics":[27],"of":[28],"Wien":[29],"Bridge":[30],"filters.":[32],"The":[33],"front-end":[35],"with":[38,50],"Back-End-of-Line":[39],"(BEoL)":[40],"devices":[41],"to":[42,66,71],"improve":[43],"aging":[44],"robustness":[45],"and":[46,52,82],"process":[47],"portability.":[48],"Combined":[49],"digital-friendly":[51],"leakage-insensitive":[53],"interface":[54],"electronics,":[55],"achieves":[59],"+440/230-ppm":[60],"inaccuracy":[61],"(including":[62],"hysteresis)":[63],"from":[64],"-55\u00b0C":[65],"125\u00b0C,":[67],"which":[68],"only":[69],"degrades":[70],"+940/+50ppm":[72],"after":[73],"accelerated":[74],"aging.":[75],"These":[76],"represent":[77],"state-of-the-art":[78],"performance":[79],"more":[83],"advanced":[84],"technologies.":[85]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-05-15T00:00:00"}