{"id":"https://openalex.org/W4396918397","doi":"https://doi.org/10.1109/cicc60959.2024.10529093","title":"An 80MS/s 70.79dB-SNDR 60.7fJ/Conv-Step Radiation-Tolerant Semi-Time-interleaved Pipelined-SAR ADC","display_name":"An 80MS/s 70.79dB-SNDR 60.7fJ/Conv-Step Radiation-Tolerant Semi-Time-interleaved Pipelined-SAR ADC","publication_year":2024,"publication_date":"2024-04-21","ids":{"openalex":"https://openalex.org/W4396918397","doi":"https://doi.org/10.1109/cicc60959.2024.10529093"},"language":"en","primary_location":{"id":"doi:10.1109/cicc60959.2024.10529093","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/cicc60959.2024.10529093","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008273773","display_name":"Zheyi Li","orcid":"https://orcid.org/0000-0002-1740-1711"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Zheyi Li","raw_affiliation_strings":["lmec,Leuven,Belgium","Katholieke Universiteit Leuven, Geel, Belgium","lmec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"lmec,Leuven,Belgium","institution_ids":[]},{"raw_affiliation_string":"Katholieke Universiteit Leuven, Geel, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"lmec, Leuven, Belgium","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011976022","display_name":"Laurent Berti","orcid":"https://orcid.org/0000-0002-0388-6498"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Laurent Berti","raw_affiliation_strings":["lmec,Leuven,Belgium","lmec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"lmec,Leuven,Belgium","institution_ids":[]},{"raw_affiliation_string":"lmec, Leuven, Belgium","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5098623415","display_name":"Qiuyang Lin","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Qiuyang Lin","raw_affiliation_strings":["lmec,Leuven,Belgium","lmec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"lmec,Leuven,Belgium","institution_ids":[]},{"raw_affiliation_string":"lmec, Leuven, Belgium","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065673604","display_name":"Jinghao Zhao","orcid":"https://orcid.org/0000-0001-9631-8168"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jinghao Zhao","raw_affiliation_strings":["Katholieke Universiteit Leuven,Geel,Belgium","Katholieke Universiteit Leuven, Geel, Belgium"],"affiliations":[{"raw_affiliation_string":"Katholieke Universiteit Leuven,Geel,Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"Katholieke Universiteit Leuven, Geel, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067936716","display_name":"Maxim S. Gorbunov","orcid":"https://orcid.org/0000-0002-4017-7033"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Maxim Gorbunov","raw_affiliation_strings":["lmec,Leuven,Belgium","lmec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"lmec,Leuven,Belgium","institution_ids":[]},{"raw_affiliation_string":"lmec, Leuven, Belgium","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057702668","display_name":"Geert Thys","orcid":"https://orcid.org/0000-0002-5320-7844"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Geert Thys","raw_affiliation_strings":["lmec,Leuven,Belgium","lmec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"lmec,Leuven,Belgium","institution_ids":[]},{"raw_affiliation_string":"lmec, Leuven, Belgium","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016595959","display_name":"Paul Leroux","orcid":"https://orcid.org/0000-0002-1790-2428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Paul Leroux","raw_affiliation_strings":["Katholieke Universiteit Leuven,Geel,Belgium","Katholieke Universiteit Leuven, Geel, Belgium"],"affiliations":[{"raw_affiliation_string":"Katholieke Universiteit Leuven,Geel,Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"Katholieke Universiteit Leuven, Geel, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5008273773"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":0.4419,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.60544531,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6782315969467163},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6670794486999512},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.6606135964393616},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.6096194982528687},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5592954158782959},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.556954562664032},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.49433183670043945},{"id":"https://openalex.org/keywords/electrical-efficiency","display_name":"Electrical efficiency","score":0.44432976841926575},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43609052896499634},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.4270074665546417},{"id":"https://openalex.org/keywords/energy-conversion-efficiency","display_name":"Energy conversion efficiency","score":0.4263612627983093},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3599393963813782},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3287888765335083},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28127044439315796},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24049055576324463},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20196551084518433},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.1227886974811554},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.08621099591255188},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08135923743247986},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.07590839266777039}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6782315969467163},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6670794486999512},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.6606135964393616},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.6096194982528687},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5592954158782959},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.556954562664032},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.49433183670043945},{"id":"https://openalex.org/C118993495","wikidata":"https://www.wikidata.org/wiki/Q5042828","display_name":"Electrical efficiency","level":3,"score":0.44432976841926575},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43609052896499634},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.4270074665546417},{"id":"https://openalex.org/C206991015","wikidata":"https://www.wikidata.org/wiki/Q192704","display_name":"Energy conversion efficiency","level":2,"score":0.4263612627983093},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3599393963813782},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3287888765335083},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28127044439315796},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24049055576324463},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20196551084518433},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.1227886974811554},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.08621099591255188},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08135923743247986},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.07590839266777039},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/cicc60959.2024.10529093","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/cicc60959.2024.10529093","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:20.500.12942/759449","is_oa":false,"landing_page_url":"https://lirias.kuleuven.be/handle/20.500.12942/759449","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Custom Integrated Circuits Conference (CICC), CO, Denver, 21-24 February 2024","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7699999809265137,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4225795411","https://openalex.org/W2809744190","https://openalex.org/W2511013388","https://openalex.org/W2044192478","https://openalex.org/W2371206122","https://openalex.org/W2182049391","https://openalex.org/W2374714942","https://openalex.org/W786839612","https://openalex.org/W2012940364","https://openalex.org/W4392235650"],"abstract_inverted_index":{"In":[0],"modern":[1],"medical,":[2],"aerospace,":[3],"and":[4,32,40,86,93,98,105],"high-energy":[5],"physics":[6],"applications,":[7],"radiation":[8,47,73,94,106],"tolerance":[9],"in":[10,36],"ADCs":[11],"is":[12,82],"crucial":[13],"to":[14,25,38,55],"guarantee":[15],"the":[16,26,42,57,61,67,88],"signal":[17],"chain's":[18],"robustness.":[19],"However,":[20,60],"it":[21],"usually":[22],"brings":[23],"penalties":[24],"power":[27,53,91],"efficiency.":[28],"Double":[29],"modular":[30],"redundancy":[31],"averaging":[33],"are":[34],"used":[35],"[1]":[37],"detect":[39],"ignore":[41],"error":[43],"samples":[44],"caused":[45,71],"by":[46,72,84],"effects.":[48],"[2]":[49],"applies":[50],"a":[51,78],"higher":[52],"supply":[54],"minimize":[56],"radiation-induced":[58],"degradation.":[59],"previous":[62],"works":[63],"did":[64],"not":[65],"consider":[66],"ADC":[68],"efficiency":[69,92,104],"degradation":[70],"tolerance.":[74,107],"This":[75],"paper":[76],"presents":[77],"pipelined-SAR":[79],"ADC,":[80],"which":[81],"designed":[83],"revealing":[85],"balancing":[87],"tradeoffs":[89],"between":[90],"tolerance,":[95],"achieving":[96],"80MS/s":[97],"70.79-dB":[99],"SNDR":[100],"with":[101],"high":[102],"conversion":[103]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-05T09:29:38.588285","created_date":"2025-10-10T00:00:00"}