{"id":"https://openalex.org/W2966370334","doi":"https://doi.org/10.1109/cicc.2019.8780382","title":"A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25\u00b0C Resolution","display_name":"A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25\u00b0C Resolution","publication_year":2019,"publication_date":"2019-04-01","ids":{"openalex":"https://openalex.org/W2966370334","doi":"https://doi.org/10.1109/cicc.2019.8780382","mag":"2966370334"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2019.8780382","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2019.8780382","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081774167","display_name":"Daniel S. Truesdell","orcid":"https://orcid.org/0000-0002-5723-0398"},"institutions":[{"id":"https://openalex.org/I51556381","display_name":"University of Virginia","ror":"https://ror.org/0153tk833","country_code":"US","type":"education","lineage":["https://openalex.org/I51556381"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daniel S. Truesdell","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA","institution_ids":["https://openalex.org/I51556381"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080557997","display_name":"Benton H. Calhoun","orcid":"https://orcid.org/0000-0002-3770-5050"},"institutions":[{"id":"https://openalex.org/I51556381","display_name":"University of Virginia","ror":"https://ror.org/0153tk833","country_code":"US","type":"education","lineage":["https://openalex.org/I51556381"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Benton H. Calhoun","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA","institution_ids":["https://openalex.org/I51556381"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I51556381"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.717727541923523},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6683767437934875},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5393341779708862},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.5249961614608765},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5244534015655518},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.47751253843307495},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.45658060908317566},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44651782512664795},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3593593239784241},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2851963937282562},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1849781572818756}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.717727541923523},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6683767437934875},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5393341779708862},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5249961614608765},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5244534015655518},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.47751253843307495},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.45658060908317566},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44651782512664795},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3593593239784241},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2851963937282562},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1849781572818756},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2019.8780382","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2019.8780382","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320334631","display_name":"Natural Environment Research Council","ror":"https://ror.org/02b5d8509"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2087509188","https://openalex.org/W2124142740","https://openalex.org/W2594304245","https://openalex.org/W2648793147","https://openalex.org/W2800058686","https://openalex.org/W2802661585"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2171986175","https://openalex.org/W2109445684","https://openalex.org/W2170979950","https://openalex.org/W1900707063","https://openalex.org/W2081082331"],"abstract_inverted_index":{"This":[0,52],"work":[1],"presents":[2],"a":[3],"640":[4],"pW,":[5],"22":[6],"pJ/conversion":[7],"gate":[8],"leakage-powered":[9],"temperature":[10,59],"sensor":[11],"with":[12],"0.25\u00b0C":[13],"resolution":[14],"and":[15,32,45],"-2.7/1.8\u00b0C":[16],"worst-case":[17],"inaccuracy":[18],"from":[19],"-":[20],"20":[21],"\u00b0C":[22],"to":[23,35],"100\u00b0C.":[24],"Gate":[25],"leakage":[26],"currents":[27],"drive":[28],"both":[29],"the":[30,62],"sensing":[31,60],"sampling":[33],"elements":[34],"provide":[36],"compact":[37],"but":[38],"reliable":[39],"operation":[40],"that":[41],"balances":[42],"low":[43,46],"power":[44],"energy":[47],"for":[48,61],"flexible":[49],"application":[50],"use.":[51],"low-power,":[53],"low-energy":[54],"performance":[55],"enables":[56],"continuous":[57],"sub-nW":[58],"Internet":[63],"of":[64],"Things.":[65]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":5}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}