{"id":"https://openalex.org/W2964420546","doi":"https://doi.org/10.1109/cicc.2019.8780246","title":"A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10","display_name":"A Highly Reliable SRAM PUF with a Capacitive Preselection Mechanism and pre-ECC BER of 7.4E-10","publication_year":2019,"publication_date":"2019-04-01","ids":{"openalex":"https://openalex.org/W2964420546","doi":"https://doi.org/10.1109/cicc.2019.8780246","mag":"2964420546"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2019.8780246","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2019.8780246","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052033346","display_name":"Avi Miller","orcid":"https://orcid.org/0000-0003-4645-3841"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Avi Miller","raw_affiliation_strings":["Dept. of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006858727","display_name":"Yizhak Shifman","orcid":"https://orcid.org/0000-0003-1089-1081"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Yizhak Shifman","raw_affiliation_strings":["Dept. of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057416540","display_name":"Yoav Weizman","orcid":null},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Yoav Weizman","raw_affiliation_strings":["Dept. of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071090334","display_name":"Osnat Keren","orcid":"https://orcid.org/0000-0002-3101-9551"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Osnat Keren","raw_affiliation_strings":["Dept. of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038423749","display_name":"Joseph Shor","orcid":"https://orcid.org/0000-0002-9184-8642"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Joseph Shor","raw_affiliation_strings":["Dept. of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I13955877"],"apc_list":null,"apc_paid":null,"fwci":2.1571,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.87611295,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.741767942905426},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.6469911932945251},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.5811554193496704},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.5707547664642334},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.517639696598053},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.48182740807533264},{"id":"https://openalex.org/keywords/randomness","display_name":"Randomness","score":0.4713574945926666},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4316040873527527},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.4176868796348572},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.41747093200683594},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3777766823768616},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3442531228065491},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31367677450180054},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3087047040462494},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.17943546175956726},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1358984112739563},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1271548569202423},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.10374057292938232},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07102873921394348}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.741767942905426},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.6469911932945251},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.5811554193496704},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.5707547664642334},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.517639696598053},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.48182740807533264},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.4713574945926666},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4316040873527527},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.4176868796348572},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.41747093200683594},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3777766823768616},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3442531228065491},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31367677450180054},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3087047040462494},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.17943546175956726},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1358984112739563},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1271548569202423},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.10374057292938232},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07102873921394348},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2019.8780246","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2019.8780246","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.9100000262260437,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W609951012","https://openalex.org/W1971935236","https://openalex.org/W2001067488","https://openalex.org/W2067907366","https://openalex.org/W2580334840","https://openalex.org/W2594214473","https://openalex.org/W2791198567","https://openalex.org/W2794177219","https://openalex.org/W2899983232","https://openalex.org/W4237236484","https://openalex.org/W6755887523"],"related_works":["https://openalex.org/W3034924094","https://openalex.org/W3094954546","https://openalex.org/W1488708774","https://openalex.org/W1982811510","https://openalex.org/W4391100477","https://openalex.org/W2402189625","https://openalex.org/W4327779705","https://openalex.org/W4310560702","https://openalex.org/W1513698804","https://openalex.org/W2025534101"],"abstract_inverted_index":{"An":[0,33],"SRAM":[1],"PUF":[2,59],"with":[3,19],"an":[4,73],"internal":[5],"error":[6],"reduction":[7],"mechanism":[8],"is":[9],"presented.":[10],"A":[11,65],"capacitive":[12],"preselection":[13],"test":[14,23,50],"identifies":[15],"potentially":[16],"unstable":[17,42],"cells":[18,43],"insufficient":[20],"mismatch.":[21],"The":[22,49],"can":[24],"be":[25],"accomplished":[26],"in":[27,35,45],"one":[28],"VDD":[29],"/":[30],"temperature":[31],"corner.":[32],"implementation":[34],"TSMC":[36],"65nm":[37],"technology":[38],"disqualified":[39],"all":[40],"the":[41,55,58],"(19.7%)":[44],"14":[46],"800-bit":[47],"arrays.":[48],"has":[51],"no":[52],"impact":[53,62],"on":[54,63],"randomness":[56],"of":[57,70,76],"and":[60,72],"negligible":[61],"area.":[64],"highly":[66],"competitive":[67],"pre-ECC":[68],"BER":[69],"7.4E-10":[71],"energy":[74],"consumption":[75],"16fJ/bit":[77],"were":[78],"achieved.":[79]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}