{"id":"https://openalex.org/W2965673716","doi":"https://doi.org/10.1109/cicc.2019.8780135","title":"A Metal-Via Resistance Based Physically Unclonable Function with 1.18% Native Instability","display_name":"A Metal-Via Resistance Based Physically Unclonable Function with 1.18% Native Instability","publication_year":2019,"publication_date":"2019-04-01","ids":{"openalex":"https://openalex.org/W2965673716","doi":"https://doi.org/10.1109/cicc.2019.8780135","mag":"2965673716"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2019.8780135","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2019.8780135","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066370358","display_name":"Beomsoo Park","orcid":"https://orcid.org/0000-0002-1842-0324"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Beomsoo Park","raw_affiliation_strings":["Department of electrical and computer engineering, University of Florida, Gainesville, Florida USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of electrical and computer engineering, University of Florida, Gainesville, Florida USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073054890","display_name":"Mark Tehranipoor","orcid":"https://orcid.org/0000-0003-4699-3231"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark Tehranipoor","raw_affiliation_strings":["Department of electrical and computer engineering, University of Florida, Gainesville, Florida USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of electrical and computer engineering, University of Florida, Gainesville, Florida USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009243659","display_name":"Domenic Forte","orcid":"https://orcid.org/0000-0002-2794-7320"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Domenic Forte","raw_affiliation_strings":["Department of electrical and computer engineering, University of Florida, Gainesville, Florida USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of electrical and computer engineering, University of Florida, Gainesville, Florida USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071432833","display_name":"Nima Maghari","orcid":"https://orcid.org/0000-0002-9168-5142"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nima Maghari","raw_affiliation_strings":["Department of electrical and computer engineering, University of Florida, Gainesville, Florida USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of electrical and computer engineering, University of Florida, Gainesville, Florida USA","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I33213144"],"apc_list":null,"apc_paid":null,"fwci":2.1571,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.87662172,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.7813180685043335},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.6971739530563354},{"id":"https://openalex.org/keywords/parasitic-element","display_name":"Parasitic element","score":0.6526548862457275},{"id":"https://openalex.org/keywords/hamming-distance","display_name":"Hamming distance","score":0.6524922847747803},{"id":"https://openalex.org/keywords/instability","display_name":"Instability","score":0.6189347505569458},{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.5518732666969299},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5381240844726562},{"id":"https://openalex.org/keywords/hamming-code","display_name":"Hamming code","score":0.4673512279987335},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4578993618488312},{"id":"https://openalex.org/keywords/entropy","display_name":"Entropy (arrow of time)","score":0.42844077944755554},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40770411491394043},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35058119893074036},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3212375044822693},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27936479449272156},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.21116000413894653},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18274447321891785},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11460089683532715},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.0771719217300415}],"concepts":[{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.7813180685043335},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.6971739530563354},{"id":"https://openalex.org/C71367568","wikidata":"https://www.wikidata.org/wiki/Q3363655","display_name":"Parasitic element","level":2,"score":0.6526548862457275},{"id":"https://openalex.org/C193319292","wikidata":"https://www.wikidata.org/wiki/Q272172","display_name":"Hamming distance","level":2,"score":0.6524922847747803},{"id":"https://openalex.org/C207821765","wikidata":"https://www.wikidata.org/wiki/Q405372","display_name":"Instability","level":2,"score":0.6189347505569458},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.5518732666969299},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5381240844726562},{"id":"https://openalex.org/C73150493","wikidata":"https://www.wikidata.org/wiki/Q853922","display_name":"Hamming code","level":4,"score":0.4673512279987335},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4578993618488312},{"id":"https://openalex.org/C106301342","wikidata":"https://www.wikidata.org/wiki/Q4117933","display_name":"Entropy (arrow of time)","level":2,"score":0.42844077944755554},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40770411491394043},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35058119893074036},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3212375044822693},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27936479449272156},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.21116000413894653},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18274447321891785},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11460089683532715},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.0771719217300415},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.0},{"id":"https://openalex.org/C157125643","wikidata":"https://www.wikidata.org/wiki/Q884707","display_name":"Block code","level":3,"score":0.0},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2019.8780135","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2019.8780135","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1574944801","https://openalex.org/W2001067488","https://openalex.org/W2067907366","https://openalex.org/W2088455835","https://openalex.org/W2153293882","https://openalex.org/W2290692811","https://openalex.org/W2594214473","https://openalex.org/W4285719527","https://openalex.org/W6650704792"],"related_works":["https://openalex.org/W2943247777","https://openalex.org/W2740543340","https://openalex.org/W2371167013","https://openalex.org/W1493958394","https://openalex.org/W1582340598","https://openalex.org/W2794545997","https://openalex.org/W2584980534","https://openalex.org/W2182731056","https://openalex.org/W1600949677","https://openalex.org/W2779867339"],"abstract_inverted_index":{"A":[0],"physically":[1],"unclonable":[2],"function":[3],"(PUF)":[4],"leveraging":[5],"the":[6,11,34,53,61],"parasitic":[7,36,65],"resistance":[8],"created":[9],"by":[10],"metal-via":[12,62],"interconnection":[13,63],"as":[14],"entropy":[15],"source":[16],"is":[17,30,48,103,115],"proposed":[18],"in":[19],"this":[20],"paper.":[21],"Metals":[22],"2":[23],"through":[24],"6":[25],"of":[26,39,60,80],"a":[27,77],"65nm":[28],"process":[29],"used":[31],"to":[32,50,96,100],"create":[33],"necessary":[35],"resistance.":[37],"Instead":[38],"using":[40,71],"additional":[41],"stabilization":[42],"techniques,":[43],"an":[44],"incremental":[45],"analog-to-digital":[46],"converter":[47],"implemented":[49],"precisely":[51],"measure":[52],"voltage":[54,90],"difference":[55],"between":[56,109],"two":[57],"branches":[58],"consisting":[59],"based":[64],"resistances.":[66],"The":[67,86,106],"fabricated":[68],"PUF,":[69],"without":[70],"any":[72],"post":[73],"processing":[74],"algorithm,":[75],"achieves":[76],"native":[78],"instability":[79,88],"1.18%":[81],"with":[82],"1000":[83],"repeated":[84],"evaluations.":[85],"worst-case":[87],"for":[89],"and":[91,98,111],"temperature":[92],"ranging":[93],"from":[94],"0.8V":[95],"1.3V":[97],"0\u00b0C":[99],"85\u00b0C,":[101],"respectively":[102],"below":[104],"2.5%.":[105],"distance":[107],"ratio":[108],"intra-die":[110],"inter-die":[112],"Hamming":[113],"Distance":[114],"above":[116],"310X.":[117]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}