{"id":"https://openalex.org/W2801745195","doi":"https://doi.org/10.1109/cicc.2018.8357067","title":"Cascaded and resonant SRAM supply boosting for ultra-low voltage cognitive IoT applications","display_name":"Cascaded and resonant SRAM supply boosting for ultra-low voltage cognitive IoT applications","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2801745195","doi":"https://doi.org/10.1109/cicc.2018.8357067","mag":"2801745195"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2018.8357067","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2018.8357067","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5105554115","display_name":"Rajiv Joshi","orcid":"https://orcid.org/0009-0007-7486-1531"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rajiv V. Joshi","raw_affiliation_strings":["IBM T. J. Watson Research Center, Yorktown Heights, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research Center, Yorktown Heights, NY","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012357226","display_name":"Matthew M. Ziegler","orcid":"https://orcid.org/0000-0002-9259-7304"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew M. Ziegler","raw_affiliation_strings":["IBM T. J. Watson Research Center, Yorktown Heights, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research Center, Yorktown Heights, NY","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102006304","display_name":"Karthik Swaminathan","orcid":"https://orcid.org/0000-0002-4799-7587"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Karthik Swaminathan","raw_affiliation_strings":["IBM T. J. Watson Research Center, Yorktown Heights, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research Center, Yorktown Heights, NY","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030751472","display_name":"Nandhini Chandramoorthy","orcid":"https://orcid.org/0000-0002-5672-795X"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nandhini Chandramoorthy","raw_affiliation_strings":["IBM T. J. Watson Research Center, Yorktown Heights, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM T. J. Watson Research Center, Yorktown Heights, NY","institution_ids":["https://openalex.org/I4210114115"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8988021612167358},{"id":"https://openalex.org/keywords/mnist-database","display_name":"MNIST database","score":0.7106078863143921},{"id":"https://openalex.org/keywords/boosting","display_name":"Boosting (machine learning)","score":0.7089831233024597},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5869076251983643},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5771790742874146},{"id":"https://openalex.org/keywords/internet-of-things","display_name":"Internet of Things","score":0.5456136465072632},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5207776427268982},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4552437961101532},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4184529781341553},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38137346506118774},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.3472197353839874},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33916664123535156},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3196568489074707},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22749477624893188},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.16612020134925842}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8988021612167358},{"id":"https://openalex.org/C190502265","wikidata":"https://www.wikidata.org/wiki/Q17069496","display_name":"MNIST database","level":3,"score":0.7106078863143921},{"id":"https://openalex.org/C46686674","wikidata":"https://www.wikidata.org/wiki/Q466303","display_name":"Boosting (machine learning)","level":2,"score":0.7089831233024597},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5869076251983643},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5771790742874146},{"id":"https://openalex.org/C81860439","wikidata":"https://www.wikidata.org/wiki/Q251212","display_name":"Internet of Things","level":2,"score":0.5456136465072632},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5207776427268982},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4552437961101532},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4184529781341553},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38137346506118774},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.3472197353839874},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33916664123535156},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3196568489074707},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22749477624893188},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.16612020134925842},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2018.8357067","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2018.8357067","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7200000286102295}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1900393127","https://openalex.org/W2165720303","https://openalex.org/W2198948050","https://openalex.org/W2562793280","https://openalex.org/W2739739316","https://openalex.org/W4244763807","https://openalex.org/W6687655462"],"related_works":["https://openalex.org/W4386603768","https://openalex.org/W2950475743","https://openalex.org/W2886711096","https://openalex.org/W2750384547","https://openalex.org/W4380078352","https://openalex.org/W3046591097","https://openalex.org/W4389249638","https://openalex.org/W2733410219","https://openalex.org/W2310488720","https://openalex.org/W2310834573"],"abstract_inverted_index":{"To":[0],"enable":[1],"ultra-low":[2],"power":[3],"cognitive":[4,57],"IoT":[5,58],"systems,":[6],"we":[7],"present":[8],"novel":[9],"supply":[10,48],"boosting":[11,49],"techniques":[12,18,36],"allowing":[13],"low":[14],"voltage":[15,54],"SRAM.":[16],"These":[17],"include":[19],"enhancements":[20],"at":[21],"both":[22],"the":[23,35,68],"device":[24],"and":[25],"circuit":[26],"levels.":[27],"A":[28],"new":[29],"14nm":[30],"SOI":[31],"test":[32],"chip":[33],"employing":[34],"shows":[37],"functional":[38],"8T":[39],"SRAM":[40],"down":[41],"to":[42,52],"0.24V.":[43],"We":[44],"also":[45],"show":[46],"how":[47],"can":[50],"lead":[51],"lower":[53],"operation":[55],"of":[56,63],"applications":[59],"using":[60],"an":[61],"example":[62],"a":[64],"neural":[65],"network":[66],"running":[67],"MNIST":[69],"benchmark.":[70]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}