{"id":"https://openalex.org/W2800841752","doi":"https://doi.org/10.1109/cicc.2018.8357065","title":"Functional safety SoC for autonomous driving","display_name":"Functional safety SoC for autonomous driving","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2800841752","doi":"https://doi.org/10.1109/cicc.2018.8357065","mag":"2800841752"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2018.8357065","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2018.8357065","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039818740","display_name":"Shinichi Shibahara","orcid":"https://orcid.org/0000-0003-4442-0421"},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Shinichi Shibahara","raw_affiliation_strings":["Renesas Electronics Corporation, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I4210153176"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5039818740"],"corresponding_institution_ids":["https://openalex.org/I4210153176"],"apc_list":null,"apc_paid":null,"fwci":0.7574,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.67819604,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.7261672019958496},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.7033202648162842},{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.6253230571746826},{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.5775482058525085},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5463349223136902},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.47662627696990967},{"id":"https://openalex.org/keywords/advanced-driver-assistance-systems","display_name":"Advanced driver assistance systems","score":0.4620482325553894},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.4196089506149292},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.39470234513282776},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3564210832118988},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.27956777811050415},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2238292098045349},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.1253892481327057},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11337581276893616}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.7261672019958496},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.7033202648162842},{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.6253230571746826},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.5775482058525085},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5463349223136902},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.47662627696990967},{"id":"https://openalex.org/C87833898","wikidata":"https://www.wikidata.org/wiki/Q1060280","display_name":"Advanced driver assistance systems","level":2,"score":0.4620482325553894},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.4196089506149292},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.39470234513282776},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3564210832118988},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.27956777811050415},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2238292098045349},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.1253892481327057},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11337581276893616},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2018.8357065","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2018.8357065","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6899999976158142,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2096229678","https://openalex.org/W2115795793","https://openalex.org/W2563294347"],"related_works":["https://openalex.org/W2170314243","https://openalex.org/W2119179026","https://openalex.org/W2523432015","https://openalex.org/W2794947590","https://openalex.org/W2114971758","https://openalex.org/W2109932036","https://openalex.org/W4313118781","https://openalex.org/W2354546390","https://openalex.org/W2153130273","https://openalex.org/W2765340260"],"abstract_inverted_index":{"Advanced":[0],"driver":[1],"assistance":[2],"system":[3],"(ADAS)":[4],"for":[5,32,51,58],"autonomous":[6],"driving":[7],"requires":[8],"high":[9],"computational":[10],"power.":[11],"The":[12,36],"requirement":[13],"on":[14],"functional":[15,34],"safety":[16,56,61,74],"support":[17],"in":[18,38,87],"ADAS":[19],"SoCs":[20],"is":[21,81],"getting":[22],"strict.":[23],"This":[24],"paper":[25,40],"discusses":[26],"two":[27],"topics:":[28],"implementation":[29],"and":[30,48,68],"verification":[31,95],"supporting":[33,59],"safety.":[35],"SoC":[37],"this":[39,91],"introduces":[41],"hardware":[42,46,78,112],"built-in":[43],"self-test":[44],"(BIST),":[45],"lock-step,":[47],"killer-droop":[49],"monitor":[50],"voltage":[52],"droop":[53],"prediction":[54],"as":[55],"mechanism":[57],"automotive":[60],"integrity":[62],"level":[63,109],"(ASIL)":[64],"B,":[65],"considering":[66],"area":[67],"power":[69],"constraints.":[70],"To":[71],"verify":[72],"the":[73,77,93,107],"mechanisms":[75],"efficiently,":[76],"BIST":[79,113],"operation":[80],"emulated":[82],"by":[83,100],"X-injection":[84],"to":[85,106],"flip-flops":[86],"RTL":[88],"simulation.":[89],"With":[90],"approach,":[92],"simulation":[94,110],"speed":[96],"can":[97],"be":[98],"improved":[99],"more":[101],"than":[102],"50":[103],"times,":[104],"compared":[105],"gate":[108,115],"with":[111],"implemented":[114],"netlist.":[116]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}