{"id":"https://openalex.org/W2800470148","doi":"https://doi.org/10.1109/cicc.2018.8357063","title":"Compact modeling and simulation of accelerated circuit aging","display_name":"Compact modeling and simulation of accelerated circuit aging","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2800470148","doi":"https://doi.org/10.1109/cicc.2018.8357063","mag":"2800470148"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2018.8357063","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2018.8357063","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089024476","display_name":"Devyani Patra","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Devyani Patra","raw_affiliation_strings":["School of ECEE, Arizona State University, Tempe, AZ"],"affiliations":[{"raw_affiliation_string":"School of ECEE, Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102880669","display_name":"Jiayang Zhang","orcid":"https://orcid.org/0000-0002-1276-3748"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiayang Zhang","raw_affiliation_strings":["IME, Peking University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"IME, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002760019","display_name":"Runsheng Wang","orcid":"https://orcid.org/0000-0002-7514-0767"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Runsheng Wang","raw_affiliation_strings":["IME, Peking University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"IME, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044513450","display_name":"M. Katoozi","orcid":null},"institutions":[{"id":"https://openalex.org/I1295339012","display_name":"Boeing (United States)","ror":"https://ror.org/04sm5zn07","country_code":"US","type":"company","lineage":["https://openalex.org/I1295339012"]},{"id":"https://openalex.org/I4210115859","display_name":"Behavioral Tech Research, Inc.","ror":"https://ror.org/02843s885","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210115859"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mehdi Katoozi","raw_affiliation_strings":["Boeing Research & Technology, Seattle, WA"],"affiliations":[{"raw_affiliation_string":"Boeing Research & Technology, Seattle, WA","institution_ids":["https://openalex.org/I4210115859","https://openalex.org/I1295339012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067006645","display_name":"Ethan H. Cannon","orcid":null},"institutions":[{"id":"https://openalex.org/I1295339012","display_name":"Boeing (United States)","ror":"https://ror.org/04sm5zn07","country_code":"US","type":"company","lineage":["https://openalex.org/I1295339012"]},{"id":"https://openalex.org/I4210115859","display_name":"Behavioral Tech Research, Inc.","ror":"https://ror.org/02843s885","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210115859"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ethan H. Cannon","raw_affiliation_strings":["Boeing Research & Technology, Seattle, WA"],"affiliations":[{"raw_affiliation_string":"Boeing Research & Technology, Seattle, WA","institution_ids":["https://openalex.org/I4210115859","https://openalex.org/I1295339012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062886480","display_name":"Ru Huang","orcid":"https://orcid.org/0000-0002-8146-4821"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ru Huang","raw_affiliation_strings":["IME, Peking University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"IME, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100740019","display_name":"Yu Cao","orcid":"https://orcid.org/0000-0001-6968-1180"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Cao","raw_affiliation_strings":["School of ECEE, Arizona State University, Tempe, AZ"],"affiliations":[{"raw_affiliation_string":"School of ECEE, Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5089024476"],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":0.2609,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.55866381,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.7464535236358643},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6926038265228271},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6497446298599243},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6201971173286438},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6048165559768677},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5520303249359131},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.49741891026496887},{"id":"https://openalex.org/keywords/accelerated-aging","display_name":"Accelerated aging","score":0.4942181408405304},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4701170027256012},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.4481729567050934},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4372754693031311},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2618192732334137},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17164739966392517},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16100022196769714},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.11232483386993408},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.069364994764328}],"concepts":[{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.7464535236358643},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6926038265228271},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6497446298599243},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6201971173286438},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6048165559768677},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5520303249359131},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.49741891026496887},{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.4942181408405304},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4701170027256012},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.4481729567050934},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4372754693031311},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2618192732334137},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17164739966392517},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16100022196769714},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.11232483386993408},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.069364994764328},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2018.8357063","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2018.8357063","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1522481364","https://openalex.org/W1662559499","https://openalex.org/W2134869654","https://openalex.org/W2216662081","https://openalex.org/W2290288937","https://openalex.org/W2543260924","https://openalex.org/W2620936769","https://openalex.org/W6637151114","https://openalex.org/W6680222014","https://openalex.org/W6696752137"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W4321353415","https://openalex.org/W2745001401","https://openalex.org/W2130974462","https://openalex.org/W2028665553","https://openalex.org/W2086519370","https://openalex.org/W4246352526","https://openalex.org/W4400235630","https://openalex.org/W1975778413","https://openalex.org/W1975511343"],"abstract_inverted_index":{"Accelerated":[0],"aging":[1,16],"becomes":[2],"progressively":[3],"pronounced":[4],"in":[5,39,83],"various":[6],"circuits,":[7],"due":[8],"to":[9,30,109,113],"the":[10,24,32,54,57,61,115],"feedback":[11],"between":[12],"circuit":[13,69,75],"operation":[14],"and":[15,68,81,97,103],"effects,":[17],"especially":[18],"HCI.":[19],"To":[20],"predict":[21],"this":[22,42],"behavior,":[23],"conventional":[25],"method":[26],"requires":[27],"iterative":[28],"simulations":[29],"track":[31],"elevated":[33],"degradation":[34,62],"rate,":[35],"which":[36],"is":[37,47,72,89,107],"expensive":[38],"computation.":[40],"In":[41],"paper,":[43],"a":[44],"compact":[45],"model":[46,59,88],"derived":[48],"for":[49,78],"accelerated":[50,118],"aging.":[51,119],"By":[52],"analyzing":[53],"underlying":[55],"mechanism,":[56],"new":[58,87],"connects":[60],"rate":[63],"with":[64,74],"both":[65],"reliability":[66],"physics":[67],"topology.":[70],"It":[71],"compatible":[73],"simulation,":[76],"general":[77],"design":[79],"conditions,":[80],"efficient":[82],"long-term":[84],"prediction.":[85],"The":[86],"validated":[90],"by":[91],"silicon":[92],"data":[93],"at":[94],"65nm,":[95],"28nm,":[96],"16/14nm":[98],"technologies,":[99],"demonstrating":[100],"its":[101],"scalability":[102],"effectiveness.":[104],"Furthermore,":[105],"it":[106],"applied":[108],"several":[110],"benchmark":[111],"circuits":[112],"illustrate":[114],"importance":[116],"of":[117]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}