{"id":"https://openalex.org/W2739851847","doi":"https://doi.org/10.1109/cicc.2017.7993685","title":"A 0.13\u03bcm 64Mb HfO&lt;inf&gt;x&lt;/inf&gt; ReRAM using configurable ramped voltage write and low read-disturb sensing techniques for reliability improvement","display_name":"A 0.13\u03bcm 64Mb HfO&lt;inf&gt;x&lt;/inf&gt; ReRAM using configurable ramped voltage write and low read-disturb sensing techniques for reliability improvement","publication_year":2017,"publication_date":"2017-04-01","ids":{"openalex":"https://openalex.org/W2739851847","doi":"https://doi.org/10.1109/cicc.2017.7993685","mag":"2739851847"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2017.7993685","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2017.7993685","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101814064","display_name":"Xiaowei Han","orcid":"https://orcid.org/0000-0002-6783-0557"},"institutions":[{"id":"https://openalex.org/I4210148388","display_name":"Xi'an UniIC Semiconductors (China)","ror":"https://ror.org/04c99ac72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210148388"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaowei Han","raw_affiliation_strings":["Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I4210148388"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102988603","display_name":"Qian Jia","orcid":"https://orcid.org/0000-0002-6661-5628"},"institutions":[{"id":"https://openalex.org/I4210148388","display_name":"Xi'an UniIC Semiconductors (China)","ror":"https://ror.org/04c99ac72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210148388"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qian Jia","raw_affiliation_strings":["Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I4210148388"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100762412","display_name":"Hongbin Sun","orcid":"https://orcid.org/0000-0002-5465-9818"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongbin Sun","raw_affiliation_strings":["School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100447558","display_name":"Longfei Wang","orcid":"https://orcid.org/0000-0002-3951-0783"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longfei Wang","raw_affiliation_strings":["School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040105498","display_name":"Huaqiang Wu","orcid":"https://orcid.org/0000-0001-8359-7997"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaqiang Wu","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, P. R. China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103087227","display_name":"Yimao Cai","orcid":"https://orcid.org/0000-0003-2961-9176"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yimao Cai","raw_affiliation_strings":["Institute of Microelectronics, Peking University, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Peking University, Beijing, P. R. China","institution_ids":["https://openalex.org/I20231570","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100401234","display_name":"Feng Zhang","orcid":"https://orcid.org/0000-0002-1163-2498"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Zhang","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011176866","display_name":"Yongyi Xie","orcid":"https://orcid.org/0000-0001-7750-2373"},"institutions":[{"id":"https://openalex.org/I4210148388","display_name":"Xi'an UniIC Semiconductors (China)","ror":"https://ror.org/04c99ac72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210148388"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongyi Xie","raw_affiliation_strings":["Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I4210148388"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102527341","display_name":"Fangxu Dong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148388","display_name":"Xi'an UniIC Semiconductors (China)","ror":"https://ror.org/04c99ac72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210148388"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fangxu Dong","raw_affiliation_strings":["Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I4210148388"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100379565","display_name":"Xiaoguang Wang","orcid":"https://orcid.org/0000-0002-0141-0701"},"institutions":[{"id":"https://openalex.org/I4210148388","display_name":"Xi'an UniIC Semiconductors (China)","ror":"https://ror.org/04c99ac72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210148388"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoguang Wang","raw_affiliation_strings":["Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I4210148388"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016098267","display_name":"Xiaofei Xue","orcid":"https://orcid.org/0000-0001-9320-0367"},"institutions":[{"id":"https://openalex.org/I4210148388","display_name":"Xi'an UniIC Semiconductors (China)","ror":"https://ror.org/04c99ac72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210148388"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaofei Xue","raw_affiliation_strings":["Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I4210148388"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013475433","display_name":"Li Pang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148388","display_name":"Xi'an UniIC Semiconductors (China)","ror":"https://ror.org/04c99ac72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210148388"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Pang","raw_affiliation_strings":["Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I4210148388"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102895243","display_name":"Xiaoqing Zhao","orcid":"https://orcid.org/0000-0002-9767-3169"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoqing Zhao","raw_affiliation_strings":["School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062291375","display_name":"Mengnan Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mengnan Wu","raw_affiliation_strings":["School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018080574","display_name":"Pu Bai","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pu Bai","raw_affiliation_strings":["School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100453158","display_name":"Qi Liu","orcid":"https://orcid.org/0000-0001-7062-831X"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Liu","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111976023","display_name":"Hangbing Lv","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hangbing Lv","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009065607","display_name":"Bing Yu","orcid":"https://orcid.org/0009-0004-7297-9307"},"institutions":[{"id":"https://openalex.org/I4210148388","display_name":"Xi'an UniIC Semiconductors (China)","ror":"https://ror.org/04c99ac72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210148388"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Yu","raw_affiliation_strings":["Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I4210148388"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085012323","display_name":"Chao Zhao","orcid":"https://orcid.org/0000-0002-9582-1068"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Zhao","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100746962","display_name":"He Qian","orcid":"https://orcid.org/0000-0003-3377-5366"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"He Qian","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, P. R. China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103404322","display_name":"Ru Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ru Huang","raw_affiliation_strings":["Institute of Microelectronics, Peking University, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Peking University, Beijing, P. R. China","institution_ids":["https://openalex.org/I20231570","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110532530","display_name":"Ming Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Liu","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100639141","display_name":"Yumei Zhou","orcid":"https://orcid.org/0009-0009-4566-9465"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yumei Zhou","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy Sciences, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047405956","display_name":"Nanning Zheng","orcid":"https://orcid.org/0000-0003-1608-8257"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nanning Zheng","raw_affiliation_strings":["School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049081005","display_name":"Qiwei Ren","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148388","display_name":"Xi'an UniIC Semiconductors (China)","ror":"https://ror.org/04c99ac72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210148388"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiwei Ren","raw_affiliation_strings":["Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China"],"affiliations":[{"raw_affiliation_string":"Xi'an UniIC Semiconductors Co., Ltd., Xi'an, Shaanxi, P. R. China","institution_ids":["https://openalex.org/I4210148388"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":25,"corresponding_author_ids":["https://openalex.org/A5101814064"],"corresponding_institution_ids":["https://openalex.org/I4210148388"],"apc_list":null,"apc_paid":null,"fwci":0.2867,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.58924746,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9643524885177612},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7900431752204895},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5756977200508118},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5382214784622192},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.5041795969009399},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.49029234051704407},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4738762080669403},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.45867854356765747},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4248943328857422},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4029247462749481},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36476874351501465},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3433237075805664},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3074473738670349},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17586871981620789},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15879908204078674},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14095720648765564}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9643524885177612},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7900431752204895},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5756977200508118},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5382214784622192},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.5041795969009399},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.49029234051704407},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4738762080669403},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.45867854356765747},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4248943328857422},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4029247462749481},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36476874351501465},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3433237075805664},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3074473738670349},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17586871981620789},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15879908204078674},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14095720648765564},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2017.7993685","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2017.7993685","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7400000095367432}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1484330480","https://openalex.org/W1573873562","https://openalex.org/W2003284017","https://openalex.org/W2018257879","https://openalex.org/W6628999389"],"related_works":["https://openalex.org/W2909760123","https://openalex.org/W2104937488","https://openalex.org/W2845311063","https://openalex.org/W2086074825","https://openalex.org/W3088669828","https://openalex.org/W4386880198","https://openalex.org/W2896073877","https://openalex.org/W2185474626","https://openalex.org/W2093903577","https://openalex.org/W1549725729"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,68],"0.13\u03bcm":[4],"64Mb":[5],"HfO":[6],"<sub":[7],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[8],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">x</sub>":[9],"ReRAM":[10,41],"for":[11],"embedded":[12],"storage":[13],"in":[14,34],"IoT":[15],"device.":[16],"The":[17],"configurable":[18],"ramped":[19],"voltage":[20],"write":[21,63],"and":[22,49,60],"low":[23],"read-disturb":[24],"sensing":[25],"techniques":[26],"are":[27,65],"proposed":[28],"to":[29],"address":[30],"the":[31,40],"reliability":[32],"challenges":[33],"ReRAM.":[35],"Experimental":[36],"results":[37],"show":[38],"that,":[39],"chip":[42],"achieves":[43],"more":[44],"than":[45],"107":[46],"cycles'":[47],"endurance":[48],"10":[50],"years'":[51],"retention":[52],"at":[53],"75\u00b0C.":[54],"In":[55],"addition,":[56],"its":[57],"full":[58],"function":[59],"superior":[61],"random":[62],"performance":[64],"demonstrated":[66],"on":[67],"developed":[69],"evaluation":[70],"board.":[71]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}