{"id":"https://openalex.org/W2739704560","doi":"https://doi.org/10.1109/cicc.2017.7993668","title":"Digitally-assisted leakage current supply circuit for reducing the analog LDO minimum dropout voltage","display_name":"Digitally-assisted leakage current supply circuit for reducing the analog LDO minimum dropout voltage","publication_year":2017,"publication_date":"2017-04-01","ids":{"openalex":"https://openalex.org/W2739704560","doi":"https://doi.org/10.1109/cicc.2017.7993668","mag":"2739704560"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2017.7993668","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2017.7993668","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078143248","display_name":"Samantak Gangopadhyay","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samantak Gangopadhyay","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071566785","display_name":"Saad Bin Nasir","orcid":"https://orcid.org/0000-0003-1488-0021"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saad Bin Nasir","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018222926","display_name":"Hoan Nguyen","orcid":"https://orcid.org/0000-0003-2607-4510"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hoan Nguyen","raw_affiliation_strings":["Qualcomm Technologies, Inc., Raleigh, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc., Raleigh, NC, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102787815","display_name":"Jihoon Jeong","orcid":"https://orcid.org/0000-0002-7295-3316"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jihoon Jeong","raw_affiliation_strings":["Qualcomm Technologies, Inc., Raleigh, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc., Raleigh, NC, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039122623","display_name":"Francois Atallah","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Francois Atallah","raw_affiliation_strings":["Qualcomm Technologies, Inc., Raleigh, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc., Raleigh, NC, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014850579","display_name":"Keith Bowman","orcid":"https://orcid.org/0000-0002-7638-9783"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Keith Bowman","raw_affiliation_strings":["Qualcomm Technologies, Inc., Raleigh, NC, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, Inc., Raleigh, NC, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091408102","display_name":"Arijit Raychowdhury","orcid":"https://orcid.org/0000-0001-8391-0576"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arijit Raychowdhury","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/low-dropout-regulator","display_name":"Low-dropout regulator","score":0.6780453324317932},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.6105836033821106},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5464732050895691},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5396769642829895},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5348227620124817},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4385963976383209},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.434373676776886},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.3865029215812683},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3819766640663147},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34218868613243103}],"concepts":[{"id":"https://openalex.org/C140501009","wikidata":"https://www.wikidata.org/wiki/Q6692746","display_name":"Low-dropout regulator","level":5,"score":0.6780453324317932},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.6105836033821106},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5464732050895691},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5396769642829895},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5348227620124817},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4385963976383209},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.434373676776886},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.3865029215812683},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3819766640663147},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34218868613243103},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2017.7993668","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2017.7993668","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Custom Integrated Circuits Conference (CICC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8700000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1976341316","https://openalex.org/W1992459337","https://openalex.org/W1995260866","https://openalex.org/W2043104325","https://openalex.org/W2086284897","https://openalex.org/W2294756903","https://openalex.org/W2537403501"],"related_works":["https://openalex.org/W1982997428","https://openalex.org/W2044172536","https://openalex.org/W2371498377","https://openalex.org/W2370995213","https://openalex.org/W3185987145","https://openalex.org/W4366165321","https://openalex.org/W3081405802","https://openalex.org/W4287514677","https://openalex.org/W2017190659","https://openalex.org/W4282007662"],"abstract_inverted_index":{"A":[0],"digitally-assisted":[1],"leakage":[2],"current":[3,10],"supply":[4],"(LCS)":[5],"circuit":[6],"reduces":[7],"the":[8,20,49,70],"maximum":[9],"demand":[11],"for":[12,34],"analog":[13],"lowdropout":[14],"(LDO)":[15],"voltage":[16,23],"regulators":[17],"to":[18],"lower":[19],"minimum":[21],"dropout":[22],"(VDO,MIN),":[24],"and":[25],"consequently,":[26],"enable":[27],"a":[28,45],"wider":[29,71],"range":[30],"of":[31,63],"LDO":[32,53,72],"operation":[33],"power":[35,61],"savings":[36],"in":[37,44,59],"system-on-chip":[38],"processor":[39],"cores.":[40],"From":[41],"silicon":[42],"measurements":[43],"130nm":[46],"test":[47],"chip,":[48],"LCS":[50],"assisted":[51],"hybrid":[52],"decreases":[54],"VDO,MIN":[55],"by":[56],"30-38%,":[57],"resulting":[58],"core":[60],"reduction":[62],"21-28%":[64],"at":[65],"equal":[66],"clock":[67],"frequencies":[68],"within":[69],"operating":[73],"range.":[74]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}