{"id":"https://openalex.org/W2002831595","doi":"https://doi.org/10.1109/cicc.2014.6946007","title":"A 500nA quiescent current, trim-free, &amp;#x00B1;1.75% absolute accuracy, CMOS-only voltage reference based on anti-doped N-channel MOSFETs","display_name":"A 500nA quiescent current, trim-free, &amp;#x00B1;1.75% absolute accuracy, CMOS-only voltage reference based on anti-doped N-channel MOSFETs","publication_year":2014,"publication_date":"2014-09-01","ids":{"openalex":"https://openalex.org/W2002831595","doi":"https://doi.org/10.1109/cicc.2014.6946007","mag":"2002831595"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2014.6946007","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2014.6946007","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2014 Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053612573","display_name":"Mohammad Al-Shyoukh","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mohammad Al-Shyoukh","raw_affiliation_strings":["TSMC, Austin, TX, USA TSMC, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"TSMC, Austin, TX, USA TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027408003","display_name":"A. Kalnitsky","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Alex Kalnitsky","raw_affiliation_strings":["TSMC, Hsinchu, Taiwan","TSMC, Austin, TX, USA TSMC, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"TSMC, Austin, TX, USA TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I1334877674"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5053612573"],"corresponding_institution_ids":["https://openalex.org/I1334877674"],"apc_list":null,"apc_paid":null,"fwci":0.1868,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.53996082,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.8905884027481079},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.811879575252533},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5665609836578369},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.5222747325897217},{"id":"https://openalex.org/keywords/trim","display_name":"Trim","score":0.4705914258956909},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.4609224796295166},{"id":"https://openalex.org/keywords/die","display_name":"Die (integrated circuit)","score":0.4483029246330261},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.43911775946617126},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4242766499519348},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41980427503585815},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.351268470287323},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3434232473373413},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.341863751411438},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3356310725212097},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.32718294858932495},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.30869820713996887},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2501733899116516},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.15878421068191528}],"concepts":[{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.8905884027481079},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.811879575252533},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5665609836578369},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.5222747325897217},{"id":"https://openalex.org/C88611116","wikidata":"https://www.wikidata.org/wiki/Q957004","display_name":"Trim","level":2,"score":0.4705914258956909},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.4609224796295166},{"id":"https://openalex.org/C111106434","wikidata":"https://www.wikidata.org/wiki/Q1072430","display_name":"Die (integrated circuit)","level":2,"score":0.4483029246330261},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.43911775946617126},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4242766499519348},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41980427503585815},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.351268470287323},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3434232473373413},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.341863751411438},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3356310725212097},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.32718294858932495},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.30869820713996887},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2501733899116516},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.15878421068191528},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2014.6946007","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2014.6946007","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2014 Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1994326555","https://openalex.org/W2024963751","https://openalex.org/W2032998311","https://openalex.org/W2098227045","https://openalex.org/W2164364553"],"related_works":["https://openalex.org/W2483447122","https://openalex.org/W4205838487","https://openalex.org/W4320062971","https://openalex.org/W4206542901","https://openalex.org/W2217098757","https://openalex.org/W3208688275","https://openalex.org/W2088771128","https://openalex.org/W392191687","https://openalex.org/W2981398533","https://openalex.org/W2950853109"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"an":[3],"ultra":[4],"low":[5],"power":[6],"CMOS-only":[7],"voltage":[8,109],"reference":[9,13,55,76],"is":[10,56,101],"presented.":[11],"The":[12,54],"exploits":[14],"the":[15,36,45,52,75,106],"work":[16],"function":[17],"difference":[18],"between":[19,65],"anti-doped":[20,66],"(flipped-gate)":[21],"and":[22,32,39,67,93],"standard-doped":[23,68],"nMOS":[24,69],"devices.":[25,70],"These":[26],"devices":[27,50],"require":[28],"no":[29],"additional":[30],"processing":[31],"are":[33],"realizable":[34],"from":[35],"basic":[37],"N+":[38],"P+":[40],"implants":[41],"used":[42],"to":[43,103],"implement":[44],"standard":[46],"enhancement":[47],"mode":[48],"MOS":[49],"on":[51,72,84],"process.":[53],"implemented":[57],"as":[58],"a":[59,95],"temperature-compensated":[60],"\u0394V":[61],"<inf":[62],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[63,82],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">gs</inf>":[64],"Integrated":[71],"0.18\u03bcm":[73],"CMOS,":[74],"occupies":[77],"less":[78,87],"than":[79,88],"0.04mm":[80],"<sup":[81],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[83],"silicon,":[85],"requires":[86],"500nA":[89],"of":[90,98,105],"quiescent":[91],"current,":[92],"has":[94],"trim-free":[96],"accuracy":[97],"\u00b11.75%":[99],"which":[100],"comparable":[102],"that":[104],"most":[107],"well-behaved":[108],"references":[110],"employing":[111],"BJTs.":[112]},"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
