{"id":"https://openalex.org/W2094296831","doi":"https://doi.org/10.1109/cicc.2014.6945992","title":"A 1.2 V 2.64 GS/s 8bit 39 mW skew-tolerant time-interleaved SAR ADC in 40 nm digital LP CMOS for 60 GHz WLAN","display_name":"A 1.2 V 2.64 GS/s 8bit 39 mW skew-tolerant time-interleaved SAR ADC in 40 nm digital LP CMOS for 60 GHz WLAN","publication_year":2014,"publication_date":"2014-09-01","ids":{"openalex":"https://openalex.org/W2094296831","doi":"https://doi.org/10.1109/cicc.2014.6945992","mag":"2094296831"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2014.6945992","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2014.6945992","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2014 Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074974280","display_name":"Sandipan Kundu","orcid":"https://orcid.org/0000-0003-3806-6913"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sandipan Kundu","raw_affiliation_strings":["Intel Corp, Santa Clara, CA, US","Intel Corporation, , Hillsboro, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corp, Santa Clara, CA, US","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corporation, , Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111871631","display_name":"Julia H. Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Julia H. Lu","raw_affiliation_strings":["Purdue University System, West Lafayette, IN, US","Purdue University West Lafayette IN USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Purdue University System, West Lafayette, IN, US","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Purdue University West Lafayette IN USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060170109","display_name":"Erkan Alpman","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Erkan Alpman","raw_affiliation_strings":["Intel Corp, Santa Clara, CA, US","Intel Corporation, , Hillsboro, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corp, Santa Clara, CA, US","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corporation, , Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002626327","display_name":"Hasnain Lakdawala","orcid":null},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210111675","display_name":"Market Matters","ror":"https://ror.org/021yan307","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210111675"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"Hasnain Lakdawala","raw_affiliation_strings":["QUALCOMM Inc, San Diego, CA, US","Qualcomm Inc.  San Diego CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"QUALCOMM Inc, San Diego, CA, US","institution_ids":["https://openalex.org/I4210087596","https://openalex.org/I4210111675"]},{"raw_affiliation_string":"Qualcomm Inc.  San Diego CA USA","institution_ids":["https://openalex.org/I19268510","https://openalex.org/I4210111675"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023349550","display_name":"Jeyanandh Paramesh","orcid":"https://orcid.org/0000-0001-7108-9522"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeyanandh Paramesh","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA, US","Carnegie-Mellon University, Pittsburgh, Pa., USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA, US","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Carnegie-Mellon University, Pittsburgh, Pa., USA#TAB#","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108235432","display_name":"Byunghoo Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Byunghoo Jung","raw_affiliation_strings":["Purdue University System, West Lafayette, IN, US","Purdue University West Lafayette IN USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Purdue University System, West Lafayette, IN, US","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Purdue University West Lafayette IN USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067666507","display_name":"Sarit Zur","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sarit Zur","raw_affiliation_strings":["Intel Corp, Santa Clara, CA, US","Intel Corporation, , Hillsboro, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corp, Santa Clara, CA, US","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corporation, , Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056116408","display_name":"E. Gordon","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eshel Gordon","raw_affiliation_strings":["Intel Corp, Santa Clara, CA, US","Intel Corporation, , Hillsboro, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corp, Santa Clara, CA, US","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corporation, , Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3466,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.80734977,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.9304284453392029},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.9040682315826416},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.7232800722122192},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7158308029174805},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5097803473472595},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.502720832824707},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.4364278316497803},{"id":"https://openalex.org/keywords/nyquist-rate","display_name":"Nyquist rate","score":0.41369086503982544},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.4046609103679657},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.3862786293029785},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27079159021377563},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21649223566055298},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1456870138645172},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1307409703731537}],"concepts":[{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.9304284453392029},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.9040682315826416},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.7232800722122192},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7158308029174805},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5097803473472595},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.502720832824707},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.4364278316497803},{"id":"https://openalex.org/C65914096","wikidata":"https://www.wikidata.org/wiki/Q6273772","display_name":"Nyquist rate","level":4,"score":0.41369086503982544},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.4046609103679657},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.3862786293029785},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27079159021377563},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21649223566055298},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1456870138645172},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1307409703731537},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2014.6945992","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2014.6945992","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2014 Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1750390948","https://openalex.org/W2005806893","https://openalex.org/W2055346681","https://openalex.org/W2101004723","https://openalex.org/W2104359526","https://openalex.org/W2113142084","https://openalex.org/W2132406028","https://openalex.org/W2161493898","https://openalex.org/W2164251692"],"related_works":["https://openalex.org/W2914701507","https://openalex.org/W2905521207","https://openalex.org/W2168717468","https://openalex.org/W2278942241","https://openalex.org/W2161345192","https://openalex.org/W2783221760","https://openalex.org/W4292071990","https://openalex.org/W3216962587","https://openalex.org/W2082979872","https://openalex.org/W2542076270"],"abstract_inverted_index":{"A":[0],"clock-skew":[1],"tolerant":[2],"8-bit":[3],"16x":[4],"time-interleaved":[5],"(TI)":[6],"SAR":[7],"ADC":[8,33,64],"is":[9],"presented":[10],"that":[11],"meets":[12],"WiGig":[13],"standard":[14],"requirements":[15],"with":[16,66,76],"only":[17],"background":[18],"offset":[19],"and":[20],"gain":[21],"calibrations.":[22],"By":[23],"using":[24],"a":[25,35],"\u201ccorrect-by-construction\u201d,":[26],"timing-calibration-free":[27],"global":[28],"bottom-plate":[29],"sampling":[30,36],"scheme,":[31],"the":[32,49],"achieves":[34,71],"rate":[37],"of":[38,44],"2.64GS/s":[39],"while":[40],"maintaining":[41],"an":[42,67,77],"ENOB":[43],"over":[45],"6":[46],"bits":[47],"in":[48],"entire":[50],"Nyquist":[51],"band.":[52],"The":[53,62],"40nm":[54],"LP":[55],"CMOS":[56],"design":[57],"dissipates":[58],"39mW":[59],"from":[60],"1.2V.":[61],"TI-SAR":[63],"characterized":[65],"integrated":[68],"receiver":[69],"front-end":[70],"\u221221.44dB":[72],"EVM":[73],"at":[74],"sensitivity":[75],"OFDM/":[78],"QAM16":[79],"signal.":[80]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}