{"id":"https://openalex.org/W2123303725","doi":"https://doi.org/10.1109/cicc.2013.6658528","title":"A 0.1–3GHz cell-based fractional-N all digital phase-locked loop using ΔΣ noise-shaped phase detector","display_name":"A 0.1–3GHz cell-based fractional-N all digital phase-locked loop using ΔΣ noise-shaped phase detector","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2123303725","doi":"https://doi.org/10.1109/cicc.2013.6658528","mag":"2123303725"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2013.6658528","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2013.6658528","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2013 Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072393624","display_name":"Yao-Chia Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yao-Chia Liu","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","Dept. of Electron. Eng, Nat. Chiao Tung Univ, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Dept. of Electron. Eng, Nat. Chiao Tung Univ, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042049354","display_name":"Wei\u2010Zen Chen","orcid":"https://orcid.org/0000-0003-2840-0754"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wei-Zen Chen","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","Dept. of Electron. Eng, Nat. Chiao Tung Univ, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Dept. of Electron. Eng, Nat. Chiao Tung Univ, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037811772","display_name":"Mao-Hsuan Chou","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Mao-Hsuan Chou","raw_affiliation_strings":["TSMC, Hsinchu, Taiwan","Dept. of Electron. Eng., TSMC, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Dept. of Electron. Eng., TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049719560","display_name":"Tsung-Hsien Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Tsung-Hsien Tsai","raw_affiliation_strings":["TSMC, Hsinchu, Taiwan","Dept. of Electron. Eng., TSMC, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Dept. of Electron. Eng., TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091595262","display_name":"Yen-Wei Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yen-Wei Lee","raw_affiliation_strings":["Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","Dept. of Electron. Eng, Nat. Chiao Tung Univ, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Dept. of Electron. Eng, Nat. Chiao Tung Univ, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101878884","display_name":"Min-Shueh Yuan","orcid":"https://orcid.org/0000-0003-4902-1358"},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Min-Shueh Yuan","raw_affiliation_strings":["TSMC, Hsinchu, Taiwan","Dept. of Electron. Eng., TSMC, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Dept. of Electron. Eng., TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I1334877674"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4801,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.71397568,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.7035315632820129},{"id":"https://openalex.org/keywords/phase-detector","display_name":"Phase detector","score":0.6456467509269714},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.6386545896530151},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6029092073440552},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.6025518178939819},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.566849946975708},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5339303016662598},{"id":"https://openalex.org/keywords/phase-frequency-detector","display_name":"Phase frequency detector","score":0.479467511177063},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4644947350025177},{"id":"https://openalex.org/keywords/quantization","display_name":"Quantization (signal processing)","score":0.45702242851257324},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.453769326210022},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4474390745162964},{"id":"https://openalex.org/keywords/dither","display_name":"Dither","score":0.42736101150512695},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4019908607006073},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36729222536087036},{"id":"https://openalex.org/keywords/noise-shaping","display_name":"Noise shaping","score":0.29208314418792725},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21606403589248657},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16418898105621338},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1281265914440155},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.08144384622573853}],"concepts":[{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.7035315632820129},{"id":"https://openalex.org/C110086884","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase detector","level":3,"score":0.6456467509269714},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.6386545896530151},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6029092073440552},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6025518178939819},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.566849946975708},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5339303016662598},{"id":"https://openalex.org/C2776158855","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase frequency detector","level":5,"score":0.479467511177063},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4644947350025177},{"id":"https://openalex.org/C28855332","wikidata":"https://www.wikidata.org/wiki/Q198099","display_name":"Quantization (signal processing)","level":2,"score":0.45702242851257324},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.453769326210022},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4474390745162964},{"id":"https://openalex.org/C70451592","wikidata":"https://www.wikidata.org/wiki/Q376493","display_name":"Dither","level":3,"score":0.42736101150512695},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4019908607006073},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36729222536087036},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.29208314418792725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21606403589248657},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16418898105621338},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1281265914440155},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.08144384622573853},{"id":"https://openalex.org/C114825011","wikidata":"https://www.wikidata.org/wiki/Q440704","display_name":"Charge pump","level":4,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2013.6658528","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2013.6658528","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2013 Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6899999976158142}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2008857137","https://openalex.org/W2070241898","https://openalex.org/W2094445066","https://openalex.org/W2094903094","https://openalex.org/W2108185796","https://openalex.org/W2129618067","https://openalex.org/W2160063814","https://openalex.org/W2166290265","https://openalex.org/W6674213865","https://openalex.org/W6674340685","https://openalex.org/W6679351170"],"related_works":["https://openalex.org/W4385624389","https://openalex.org/W4381745543","https://openalex.org/W2295601265","https://openalex.org/W2148370333","https://openalex.org/W2979324006","https://openalex.org/W2054263477","https://openalex.org/W2187168840","https://openalex.org/W2103790907","https://openalex.org/W2096085680","https://openalex.org/W2025414300"],"abstract_inverted_index":{"A":[0],"0.1-3":[1],"GHz,":[2],"cell-based,":[3],"fractional-N":[4],"ADPLL":[5],"with":[6,55],"\u0394\u03a3":[7],"noise-shaped":[8],"phase":[9,17,20,28],"detector":[10],"is":[11,52,73],"presented.":[12],"By":[13],"dithering":[14],"the":[15,70],"reference":[16],"and":[18,30],"quantization":[19],"error":[21],"through":[22],"an":[23],"additional":[24],"feedback":[25],"path,":[26],"linear":[27],"detection":[29],"zero":[31],"stabilization":[32],"are":[33],"accomplished":[34],"without":[35],"resort":[36],"to":[37,40],"sophisticated":[38],"time":[39],"digital":[41],"converter":[42],"(TDC).":[43],"The":[44],"measured":[45],"rms":[46],"jitter":[47],"from":[48],"a":[49,56],"3GHz":[50],"carrier":[51],"1.9":[53],"ps":[54],"multiplication":[57],"factor":[58],"of":[59],"60.":[60],"Implemented":[61],"in":[62],"TSMC":[63],"40nm":[64],"general":[65],"purpose":[66],"superb":[67],"CMOS":[68],"technology,":[69],"chip":[71],"size":[72],"280um":[74],"\u00d7":[75],"240um.":[76]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}