{"id":"https://openalex.org/W2067110467","doi":"https://doi.org/10.1109/cicc.2013.6658488","title":"Discretization and discrimination methods for design, verification, and testing of analog/mixed-signal circuits","display_name":"Discretization and discrimination methods for design, verification, and testing of analog/mixed-signal circuits","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2067110467","doi":"https://doi.org/10.1109/cicc.2013.6658488","mag":"2067110467"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2013.6658488","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2013.6658488","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2013 Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015393579","display_name":"Jaeha Kim","orcid":"https://orcid.org/0000-0003-2237-3134"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jaeha Kim","raw_affiliation_strings":["School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100685126","display_name":"Jiho Lee","orcid":"https://orcid.org/0000-0003-2516-1380"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jiho Lee","raw_affiliation_strings":["School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056798043","display_name":"Dogyoon Song","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Do-Gyoon Song","raw_affiliation_strings":["School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100359404","display_name":"Taehwan Kim","orcid":"https://orcid.org/0000-0002-7681-9552"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taehwan Kim","raw_affiliation_strings":["School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052695892","display_name":"Kyung-Hoon Kim","orcid":"https://orcid.org/0000-0003-3925-8917"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyung-Hoon Kim","raw_affiliation_strings":["School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048396595","display_name":"Seobin Jung","orcid":"https://orcid.org/0000-0002-1908-9581"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seobin Jung","raw_affiliation_strings":["School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052609677","display_name":"Sangho Youn","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangho Youn","raw_affiliation_strings":["School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Inter-university Semiconductor Research Center Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5015393579"],"corresponding_institution_ids":["https://openalex.org/I139264467"],"apc_list":null,"apc_paid":null,"fwci":0.9456,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76600304,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.6680858135223389},{"id":"https://openalex.org/keywords/discretization","display_name":"Discretization","score":0.6670011281967163},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6635482311248779},{"id":"https://openalex.org/keywords/convergence","display_name":"Convergence (economics)","score":0.6013583540916443},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5904914140701294},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5500909686088562},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5373429656028748},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.47870945930480957},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4456343650817871},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.41856345534324646},{"id":"https://openalex.org/keywords/sizing","display_name":"Sizing","score":0.4139060080051422},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4121731221675873},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3808630704879761},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3308145999908447},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.264275461435318},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19877436757087708},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16103887557983398},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.14235711097717285},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13980349898338318},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09425285458564758}],"concepts":[{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.6680858135223389},{"id":"https://openalex.org/C73000952","wikidata":"https://www.wikidata.org/wiki/Q17007827","display_name":"Discretization","level":2,"score":0.6670011281967163},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6635482311248779},{"id":"https://openalex.org/C2777303404","wikidata":"https://www.wikidata.org/wiki/Q759757","display_name":"Convergence (economics)","level":2,"score":0.6013583540916443},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5904914140701294},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5500909686088562},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5373429656028748},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.47870945930480957},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4456343650817871},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.41856345534324646},{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.4139060080051422},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4121731221675873},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3808630704879761},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3308145999908447},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.264275461435318},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19877436757087708},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16103887557983398},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14235711097717285},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13980349898338318},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09425285458564758},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2013.6658488","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2013.6658488","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2013 Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities","score":0.6800000071525574}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"},{"id":"https://openalex.org/F4320307801","display_name":"Texas Instruments","ror":"https://ror.org/03vsmv677"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1510052597","https://openalex.org/W1573878755","https://openalex.org/W1595368737","https://openalex.org/W1967004917","https://openalex.org/W1975611230","https://openalex.org/W1987748258","https://openalex.org/W2029021634","https://openalex.org/W2105706039","https://openalex.org/W2141776905","https://openalex.org/W2161195949","https://openalex.org/W2163286960","https://openalex.org/W2165016980","https://openalex.org/W2167915846","https://openalex.org/W2478708596","https://openalex.org/W4246353400","https://openalex.org/W6684520767"],"related_works":["https://openalex.org/W4242258007","https://openalex.org/W2155285526","https://openalex.org/W2394022884","https://openalex.org/W2185815555","https://openalex.org/W2071235072","https://openalex.org/W1924227955","https://openalex.org/W4242038055","https://openalex.org/W1493881961","https://openalex.org/W2128579103","https://openalex.org/W2151780421"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"how":[3,109],"the":[4,26,38,46,57,73,86,90,100,112,128,131,148,165,174],"difficult":[5],"problems":[6],"of":[7,16,42,48,61,82,89,99,115,150,168,177],"designing":[8],"verifying":[9,173],"and":[10,93,136,145,152,182],"testing":[11],"analog":[12,43],"circuits":[13,44],"in":[14,97,130,143,156,190],"presence":[15],"variability":[17,125],"can":[18],"be":[19],"converted":[20],"to":[21,66,110],"easier":[22],"ones":[23],"by":[24,76],"discretizing":[25,37,56],"search":[27],"spaces":[28],"or":[29],"discriminating":[30,85],"one":[31,65],"case":[32],"from":[33],"another.":[34],"For":[35],"instance":[36],"continuous":[39],"design":[40],"space":[41,60,75],"enables":[45,64,147],"use":[47,149],"an":[49,170],"efficient":[50],"predictive":[51],"global":[52,69],"circuit":[53,63,91,117],"optimizer.":[54],"Also":[55],"initial":[58],"condition":[59],"a":[62,79,95,105,178,184,191],"establish":[67],"its":[68],"convergence":[70,134],"property":[71],"over":[72],"entire":[74],"exploring":[77],"only":[78],"small":[80],"number":[81],"samples.":[83],"Lastly":[84],"test":[87,137,185],"responses":[88,138],"with":[92],"without":[94],"fault":[96,113],"consideration":[98,144],"underlying":[101],"statistical":[102],"distribution":[103],"provides":[104],"formal":[106],"guide":[107],"on":[108,164],"quantify":[111],"coverage":[114],"analog/mixed-signal":[116],"tests.":[118],"It":[119],"is":[120,124],"noteworthy":[121],"that":[122,126],"it":[123],"introduces":[127],"cross-correlations":[129],"performance":[132],"metrics":[133],"behaviors":[135],"between":[139],"two":[140],"nearby":[141],"candidates":[142],"therefore":[146],"discretization":[151],"discrimination":[153],"methods":[154,161],"listed":[155],"this":[157],"paper.":[158],"The":[159],"proposed":[160],"are":[162],"demonstrated":[163],"practical":[166],"examples":[167],"sizing":[169],"operational":[171],"amplifier":[172],"correct":[175],"start-up":[176],"coupled":[179],"ring":[180],"oscillator":[181],"composing":[183],"suite":[186],"for":[187],"screening":[188],"faults":[189],"digitally-controlled":[192],"phase":[193],"interpolator":[194],"circuit.":[195]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}