{"id":"https://openalex.org/W2059647671","doi":"https://doi.org/10.1109/cicc.2013.6658462","title":"Advancements in high-speed link modeling and simulation (An invited paper for CICC 2013)","display_name":"Advancements in high-speed link modeling and simulation (An invited paper for CICC 2013)","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2059647671","doi":"https://doi.org/10.1109/cicc.2013.6658462","mag":"2059647671"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2013.6658462","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2013.6658462","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2013 Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002311924","display_name":"Mike Peng Li","orcid":null},"institutions":[{"id":"https://openalex.org/I22433950","display_name":"Altera (United States)","ror":"https://ror.org/017b7j426","country_code":"US","type":"company","lineage":["https://openalex.org/I22433950"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mike Peng Li","raw_affiliation_strings":["Altera Corporation, San Jose, CA","[Altera Corp., San Jose, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Altera Corporation, San Jose, CA","institution_ids":[]},{"raw_affiliation_string":"[Altera Corp., San Jose, CA, USA]","institution_ids":["https://openalex.org/I22433950"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108640820","display_name":"Masashi Shimanouchi","orcid":null},"institutions":[{"id":"https://openalex.org/I22433950","display_name":"Altera (United States)","ror":"https://ror.org/017b7j426","country_code":"US","type":"company","lineage":["https://openalex.org/I22433950"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Masashi Shimanouchi","raw_affiliation_strings":["Altera Corporation, San Jose, CA","[Altera Corp., San Jose, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Altera Corporation, San Jose, CA","institution_ids":[]},{"raw_affiliation_string":"[Altera Corp., San Jose, CA, USA]","institution_ids":["https://openalex.org/I22433950"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005166661","display_name":"Hsinho Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I22433950","display_name":"Altera (United States)","ror":"https://ror.org/017b7j426","country_code":"US","type":"company","lineage":["https://openalex.org/I22433950"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hsinho Wu","raw_affiliation_strings":["Altera Corporation, San Jose, CA","[Altera Corp., San Jose, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Altera Corporation, San Jose, CA","institution_ids":[]},{"raw_affiliation_string":"[Altera Corp., San Jose, CA, USA]","institution_ids":["https://openalex.org/I22433950"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I22433950"],"apc_list":null,"apc_paid":null,"fwci":1.2159,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76912186,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7587236762046814},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6237426400184631},{"id":"https://openalex.org/keywords/modeling-and-simulation","display_name":"Modeling and simulation","score":0.6092167496681213},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.43491899967193604},{"id":"https://openalex.org/keywords/ibis","display_name":"Ibis","score":0.4339357912540436},{"id":"https://openalex.org/keywords/simulation-modeling","display_name":"Simulation modeling","score":0.4324209988117218},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.4320463240146637},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3572293519973755},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3407122492790222},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.2857990860939026},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1292790174484253}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7587236762046814},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6237426400184631},{"id":"https://openalex.org/C167343916","wikidata":"https://www.wikidata.org/wiki/Q6888384","display_name":"Modeling and simulation","level":2,"score":0.6092167496681213},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.43491899967193604},{"id":"https://openalex.org/C2780698032","wikidata":"https://www.wikidata.org/wiki/Q193833","display_name":"Ibis","level":2,"score":0.4339357912540436},{"id":"https://openalex.org/C108215451","wikidata":"https://www.wikidata.org/wiki/Q7263963","display_name":"Simulation modeling","level":2,"score":0.4324209988117218},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.4320463240146637},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3572293519973755},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3407122492790222},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.2857990860939026},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1292790174484253},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C175444787","wikidata":"https://www.wikidata.org/wiki/Q39072","display_name":"Microeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2013.6658462","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2013.6658462","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2013 Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1658809881","https://openalex.org/W1989472460","https://openalex.org/W2099571807","https://openalex.org/W2150359820","https://openalex.org/W2159160377","https://openalex.org/W2169458783","https://openalex.org/W2181798177","https://openalex.org/W2294347919","https://openalex.org/W6685284757"],"related_works":["https://openalex.org/W2352918229","https://openalex.org/W2188191905","https://openalex.org/W2375505868","https://openalex.org/W2356939368","https://openalex.org/W2376060232","https://openalex.org/W2887246461","https://openalex.org/W2064426819","https://openalex.org/W120587663","https://openalex.org/W2390909022","https://openalex.org/W2369700222"],"abstract_inverted_index":{"As":[0],"the":[1,12,50,54,68,90,131,150,155,186],"high-speed":[2],"I/O":[3],"(HSIO)":[4],"and":[5,16,22,35,60,65,71,99,113,134,139,144,148,152,159,165,170,182],"serial":[6],"link":[7,157],"data":[8],"rate":[9],"keeps":[10],"increasing,":[11],"requirements":[13,29,143],"for":[14,48,101,154],"accuracy":[15,151,181],"advanced":[17],"capabilities":[18],"of":[19,53,79,92],"its":[20],"modeling":[21,59,70,100,158],"simulation":[23,72,98,164],"techniques":[24,135],"get":[25],"more":[26],"stringent.":[27],"Emerging":[28],"such":[30,108],"as":[31,109,177,179],"comprehending":[32],"process,":[33],"voltage,":[34],"temperature":[36],"(PVT)":[37],"variations":[38],"at":[39],"deep":[40],"sub-micron":[41],"process":[42],"nodes":[43],"or":[44,77],"smaller,":[45],"fully":[46],"accounting":[47],"all":[49,78],"circuit":[51],"blocks":[52],"link,":[55],"gap":[56],"closing":[57],"between":[58],"measurements,":[61],"have":[62],"become":[63],"critical":[64],"important,":[66],"yet":[67],"conventional":[69],"methods":[73,133],"cannot":[74],"meet":[75,138,174],"most":[76],"those":[80,124],"requirements.":[81,126],"In":[82],"this":[83],"paper,":[84],"we":[85],"will":[86,129,162],"start":[87],"with":[88,123,185],"reviewing":[89],"status":[91],"techniques/methods":[93],"used":[94],"in":[95,121],"recent":[96],"HSIO":[97,156],"signaling,":[102],"integrated":[103],"circuits":[104],"(ICs),":[105],"board":[106],"circuits,":[107],"behavioral":[110],"statistical,":[111],"SPICE":[112],"IBIS-AMI,":[114],"outlining":[115],"areas":[116],"where":[117],"they":[118,146],"fall":[119],"short,":[120],"comparison":[122],"emerging":[125,142,175],"We":[127,161],"then":[128],"discuss":[130],"new":[132,187],"that":[136],"can":[137],"comprehend":[140],"these":[141],"how":[145,172],"enhance":[147],"advance":[149],"capability":[153,183],"simulation.":[160],"give":[163],"experimental":[166],"results":[167],"to":[168,173],"demonstrate":[169],"quantify":[171],"requirements,":[176],"well":[178],"needed":[180],"advancements,":[184],"techniques.":[188]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}