{"id":"https://openalex.org/W2037817558","doi":"https://doi.org/10.1109/cicc.2012.6330573","title":"Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables","display_name":"Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables","publication_year":2012,"publication_date":"2012-09-01","ids":{"openalex":"https://openalex.org/W2037817558","doi":"https://doi.org/10.1109/cicc.2012.6330573","mag":"2037817558"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2012.6330573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2012.6330573","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5105792483","display_name":"Bo Yu","orcid":"https://orcid.org/0009-0002-6290-4761"},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Bo Yu","raw_affiliation_strings":["Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085"],"affiliations":[{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I35662394"]},{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100353869","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-4510-2436"},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085"],"affiliations":[{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I35662394"]},{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039368125","display_name":"James Yonemura","orcid":null},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James Yonemura","raw_affiliation_strings":["Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085"],"affiliations":[{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I35662394"]},{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057821231","display_name":"Zhiyuan Wu","orcid":"https://orcid.org/0000-0001-7419-7326"},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhiyuan Wu","raw_affiliation_strings":["Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085"],"affiliations":[{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I35662394"]},{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049097923","display_name":"Jung-Suk Goo","orcid":"https://orcid.org/0000-0002-8170-2308"},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jung-Suk Goo","raw_affiliation_strings":["Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085"],"affiliations":[{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I35662394"]},{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069578595","display_name":"Ciby Thuruthiyil","orcid":null},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ciby Thuruthiyil","raw_affiliation_strings":["Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085"],"affiliations":[{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I35662394"]},{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003608153","display_name":"Ali B. Icel","orcid":null},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ali Icel","raw_affiliation_strings":["Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085"],"affiliations":[{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I35662394"]},{"raw_affiliation_string":"Compact Modeling and Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA 94085","institution_ids":["https://openalex.org/I35662394"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5105792483"],"corresponding_institution_ids":["https://openalex.org/I35662394"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.10122007,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/log-normal-distribution","display_name":"Log-normal distribution","score":0.7596523761749268},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6062792539596558},{"id":"https://openalex.org/keywords/random-noise","display_name":"Random noise","score":0.498319149017334},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.4796488881111145},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.4631494879722595},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.4619342088699341},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.4534268081188202},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3739936947822571},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3649139404296875},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31799185276031494},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2937800884246826},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1760815680027008},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09526956081390381}],"concepts":[{"id":"https://openalex.org/C151620405","wikidata":"https://www.wikidata.org/wiki/Q826116","display_name":"Log-normal distribution","level":2,"score":0.7596523761749268},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6062792539596558},{"id":"https://openalex.org/C2986577269","wikidata":"https://www.wikidata.org/wiki/Q11306265","display_name":"Random noise","level":2,"score":0.498319149017334},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.4796488881111145},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.4631494879722595},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.4619342088699341},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.4534268081188202},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3739936947822571},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3649139404296875},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31799185276031494},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2937800884246826},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1760815680027008},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09526956081390381},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2012.6330573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2012.6330573","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W658393943","https://openalex.org/W1484098281","https://openalex.org/W2026862514","https://openalex.org/W2079232648","https://openalex.org/W2118198557","https://openalex.org/W2118677669","https://openalex.org/W2129712034","https://openalex.org/W2140105855","https://openalex.org/W2142423888","https://openalex.org/W2161246726","https://openalex.org/W2170922761","https://openalex.org/W2539559157"],"related_works":["https://openalex.org/W2386430105","https://openalex.org/W2356521405","https://openalex.org/W2038534795","https://openalex.org/W2384358604","https://openalex.org/W2493033802","https://openalex.org/W1567829292","https://openalex.org/W3001063351","https://openalex.org/W3196905815","https://openalex.org/W2351370765","https://openalex.org/W219781853"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"investigate":[4],"the":[5,9,18,33,42],"geometry":[6],"dependence":[7],"for":[8],"local":[10],"variation":[11],"of":[12,20,44],"low-frequency":[13,45],"noise":[14,46],"in":[15,48],"MOSFETs":[16],"via":[17],"sum":[19],"lognormal":[21],"random":[22],"variables.":[23],"A":[24],"compact":[25],"model":[26],"has":[27],"been":[28],"developed":[29],"and":[30,39],"applied":[31],"to":[32],"measured":[34],"data":[35],"with":[36],"excellent":[37],"match,":[38],"therefore":[40],"enables":[41],"coverage":[43],"statistics":[47],"circuit":[49],"design.":[50]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}