{"id":"https://openalex.org/W1972847779","doi":"https://doi.org/10.1109/cicc.2010.5617378","title":"A novel readout IC with high noise immunity for charge-based touch screen panels","display_name":"A novel readout IC with high noise immunity for charge-based touch screen panels","publication_year":2010,"publication_date":"2010-09-01","ids":{"openalex":"https://openalex.org/W1972847779","doi":"https://doi.org/10.1109/cicc.2010.5617378","mag":"1972847779"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2010.5617378","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2010.5617378","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Custom Integrated Circuits Conference 2010","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066601615","display_name":"Jun-Hyeok Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"J. H. Yang","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050854730","display_name":"Seungchul Jung","orcid":"https://orcid.org/0000-0003-2727-0791"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"S. C. Jung","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112668536","display_name":"Young Jin Woo","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Y. J. Woo","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070079294","display_name":"Jin Yong Jeon","orcid":"https://orcid.org/0000-0002-1469-4520"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"J. Y. Jeon","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076607904","display_name":"Seungjae Lee","orcid":"https://orcid.org/0009-0000-1605-7421"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"S. W. Lee","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035574866","display_name":"C. B. Park","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"C. B. Park","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101602883","display_name":"Hyun\u2010Sik Kim","orcid":"https://orcid.org/0000-0002-4564-7938"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"H. S. Kim","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054097644","display_name":"Seung\u2010Tak Ryu","orcid":"https://orcid.org/0000-0002-6947-7785"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"S. T. Ryu","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013697220","display_name":"G. H. Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"G. H. Cho","raw_affiliation_strings":["KAIST, Daejeon, South Korea","KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST, 373-1, Guseong-Dong, Yuseong-Gu, Daejeon, 305-701, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5066601615"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":0.8659,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.75422947,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"36","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.8576041460037231},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6419723033905029},{"id":"https://openalex.org/keywords/noise-immunity","display_name":"Noise immunity","score":0.6057641506195068},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5897309184074402},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5688824653625488},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.567484438419342},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5375632047653198},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5320255160331726},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4501837491989136},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.43816035985946655},{"id":"https://openalex.org/keywords/time-delay-and-integration","display_name":"Time delay and integration","score":0.4290335774421692},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.40440890192985535},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.27658846974372864},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26597467064857483},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13990753889083862},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12249255180358887},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12029045820236206}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.8576041460037231},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6419723033905029},{"id":"https://openalex.org/C2988494973","wikidata":"https://www.wikidata.org/wiki/Q179448","display_name":"Noise immunity","level":3,"score":0.6057641506195068},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5897309184074402},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5688824653625488},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.567484438419342},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5375632047653198},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5320255160331726},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4501837491989136},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.43816035985946655},{"id":"https://openalex.org/C96566525","wikidata":"https://www.wikidata.org/wiki/Q7805282","display_name":"Time delay and integration","level":2,"score":0.4290335774421692},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.40440890192985535},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.27658846974372864},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26597467064857483},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13990753889083862},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12249255180358887},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12029045820236206},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2010.5617378","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2010.5617378","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Custom Integrated Circuits Conference 2010","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6200000047683716,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1964797675","https://openalex.org/W1979352985","https://openalex.org/W2045381232","https://openalex.org/W2080654955","https://openalex.org/W2082689721","https://openalex.org/W2154050313","https://openalex.org/W6645232416"],"related_works":["https://openalex.org/W2034349229","https://openalex.org/W4366783034","https://openalex.org/W1972415042","https://openalex.org/W4313221225","https://openalex.org/W2150642609","https://openalex.org/W2005410346","https://openalex.org/W4306816370","https://openalex.org/W2189390720","https://openalex.org/W2390229089","https://openalex.org/W2054435879"],"abstract_inverted_index":{"The":[0,80],"critical":[1],"issues":[2],"in":[3,85],"charge-based":[4],"touch":[5],"screen":[6],"panels":[7],"for":[8],"large":[9,78],"size":[10],"display":[11],"are":[12],"noise":[13,32],"and":[14,33,41,56,66],"speed.":[15],"To":[16],"solve":[17,72],"these,":[18],"this":[19],"paper":[20],"introduces":[21],"a":[22,35,45,50,54,73,77,86],"two-point":[23],"relative":[24],"sensing":[25],"based":[26],"`Delta-Integration'":[27],"scheme.":[28],"It":[29],"eliminates":[30],"local":[31],"increases":[34],"readout":[36],"difference":[37],"between":[38],"the":[39,60,67],"touched":[40],"non-touched":[42],"area.":[43],"As":[44],"result,":[46],"it":[47],"can":[48],"replace":[49],"high-resolution":[51],"ADC":[52],"with":[53],"comparator":[55],"counter.":[57],"In":[58],"addition,":[59],"single-bit":[61],"conversion":[62],"of":[63,76],"\u0394-integration":[64],"method":[65],"proposed":[68],"wide-bandwidth":[69],"charge":[70],"amplifier":[71],"speed":[74],"issue":[75],"display.":[79],"prototype":[81],"chip":[82],"is":[83],"implemented":[84],"0.35-\u03bcm":[87],"CMOS":[88],"technology.":[89]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}