{"id":"https://openalex.org/W2100637012","doi":"https://doi.org/10.1109/cicc.2009.5280851","title":"SiGe digital frequency dividers with reduced residual phase noise","display_name":"SiGe digital frequency dividers with reduced residual phase noise","publication_year":2009,"publication_date":"2009-09-01","ids":{"openalex":"https://openalex.org/W2100637012","doi":"https://doi.org/10.1109/cicc.2009.5280851","mag":"2100637012"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2009.5280851","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2009.5280851","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022407531","display_name":"Stephen Horst","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stephen Horst","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","School of Electrical and Computer Engineering, 777 Atlantic Drive, N.W., Georgia Institute of Technology Atlanta, 30332-0250, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, 777 Atlantic Drive, N.W., Georgia Institute of Technology Atlanta, 30332-0250, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108228754","display_name":"S.D. Phillips","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stan Phillips","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","School of Electrical and Computer Engineering, 777 Atlantic Drive, N.W., Georgia Institute of Technology Atlanta, 30332-0250, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, 777 Atlantic Drive, N.W., Georgia Institute of Technology Atlanta, 30332-0250, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003975240","display_name":"Hossein Miri Lavasani","orcid":"https://orcid.org/0000-0002-9665-7992"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hossein Lavasani","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","School of Electrical and Computer Engineering, 777 Atlantic Drive, N.W., Georgia Institute of Technology Atlanta, 30332-0250, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, 777 Atlantic Drive, N.W., Georgia Institute of Technology Atlanta, 30332-0250, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081523432","display_name":"Farrokh Ayazi","orcid":"https://orcid.org/0000-0002-4539-7393"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Farrokh Ayazi","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","School of Electrical and Computer Engineering, 777 Atlantic Drive, N.W., Georgia Institute of Technology Atlanta, 30332-0250, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, 777 Atlantic Drive, N.W., Georgia Institute of Technology Atlanta, 30332-0250, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073899315","display_name":"John D. Cressler","orcid":"https://orcid.org/0000-0001-8268-5135"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John D. Cressler","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","School of Electrical and Computer Engineering, 777 Atlantic Drive, N.W., Georgia Institute of Technology Atlanta, 30332-0250, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, 777 Atlantic Drive, N.W., Georgia Institute of Technology Atlanta, 30332-0250, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.4854,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.57838899,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"251","last_page":"254"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.8047698736190796},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.6669167876243591},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5916177034378052},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5682197213172913},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5552668571472168},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.5072926878929138},{"id":"https://openalex.org/keywords/oscillator-phase-noise","display_name":"Oscillator phase noise","score":0.4481387436389923},{"id":"https://openalex.org/keywords/heterojunction-bipolar-transistor","display_name":"Heterojunction bipolar transistor","score":0.44572556018829346},{"id":"https://openalex.org/keywords/effective-input-noise-temperature","display_name":"Effective input noise temperature","score":0.4444171190261841},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.443854421377182},{"id":"https://openalex.org/keywords/noise-generator","display_name":"Noise generator","score":0.4207785725593567},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.4132019579410553},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4107578992843628},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35747838020324707},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3112712502479553},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31020504236221313},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2483547031879425},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.23939448595046997},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.22253474593162537},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.1493135690689087},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1086738109588623},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.08605566620826721},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.07528987526893616}],"concepts":[{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.8047698736190796},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.6669167876243591},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5916177034378052},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5682197213172913},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5552668571472168},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.5072926878929138},{"id":"https://openalex.org/C26571440","wikidata":"https://www.wikidata.org/wiki/Q7106415","display_name":"Oscillator phase noise","level":5,"score":0.4481387436389923},{"id":"https://openalex.org/C173408217","wikidata":"https://www.wikidata.org/wiki/Q1428898","display_name":"Heterojunction bipolar transistor","level":5,"score":0.44572556018829346},{"id":"https://openalex.org/C12252657","wikidata":"https://www.wikidata.org/wiki/Q5347266","display_name":"Effective input noise temperature","level":5,"score":0.4444171190261841},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.443854421377182},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.4207785725593567},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.4132019579410553},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4107578992843628},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35747838020324707},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3112712502479553},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31020504236221313},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2483547031879425},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.23939448595046997},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.22253474593162537},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.1493135690689087},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1086738109588623},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.08605566620826721},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.07528987526893616},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2009.5280851","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2009.5280851","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5199999809265137,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2024261630","https://openalex.org/W2097877032","https://openalex.org/W2117662511","https://openalex.org/W2117874625","https://openalex.org/W2138487740"],"related_works":["https://openalex.org/W2065584582","https://openalex.org/W2186557704","https://openalex.org/W2081047325","https://openalex.org/W2043715255","https://openalex.org/W2110284327","https://openalex.org/W2114974284","https://openalex.org/W1972967837","https://openalex.org/W2055857167","https://openalex.org/W1537423256","https://openalex.org/W1984904330"],"abstract_inverted_index":{"A":[0,19],"new":[1,100],"design":[2,24,101],"methodology":[3],"for":[4,88],"achieving":[5],"very":[6],"low":[7],"residual":[8,38],"phase":[9,39,48,65,83,89],"noise":[10,49,66,84],"in":[11,63,106],"SiGe":[12],"HBT":[13],"digital":[14],"frequency":[15],"dividers":[16],"is":[17,25,102],"presented.":[18],"modified":[20],"CML":[21],"D":[22,54],"latch":[23,30,42,55],"proposed":[26],"that":[27,86,98],"enables":[28],"the":[29,37,104],"to":[31],"draw":[32],"more":[33],"current,":[34],"thereby":[35],"reducing":[36],"noise.":[40],"The":[41,72],"modification":[43],"yields":[44],"a":[45,52,64,81],"10":[46,60],"dB":[47],"improvement":[50],"over":[51],"standard":[53,82],"topology,":[56],"with":[57],"measurements":[58],"at":[59],"GHz":[61],"resulting":[62],"floor":[67],"of":[68,77],"-":[69],"160":[70],"dBc/Hz.":[71],"circuit":[73],"dissipates":[74],"350":[75],"mW":[76],"DC":[78,91],"power,":[79],"but":[80],"figure-of-merit":[85],"accounts":[87],"noise,":[90],"power":[92],"dissipation,":[93],"and":[94],"operating":[95],"frequency,":[96],"reveals":[97],"this":[99],"among":[103],"best":[105],"its":[107],"class.":[108]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}