{"id":"https://openalex.org/W2097991458","doi":"https://doi.org/10.1109/cicc.2009.5280840","title":"Angle sensitive pixels in CMOS for lensless 3D imaging","display_name":"Angle sensitive pixels in CMOS for lensless 3D imaging","publication_year":2009,"publication_date":"2009-09-01","ids":{"openalex":"https://openalex.org/W2097991458","doi":"https://doi.org/10.1109/cicc.2009.5280840","mag":"2097991458"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2009.5280840","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2009.5280840","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034208427","display_name":"Albert Wang","orcid":"https://orcid.org/0000-0002-0581-5765"},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Albert Wang","raw_affiliation_strings":["School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA","School of Electrical & Computer Engineering, Cornell University, Ithaca, NY 14853, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA","institution_ids":["https://openalex.org/I205783295"]},{"raw_affiliation_string":"School of Electrical & Computer Engineering, Cornell University, Ithaca, NY 14853, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071073936","display_name":"P. Gill","orcid":"https://orcid.org/0000-0002-2920-888X"},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Patrick Gill","raw_affiliation_strings":["School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA","School of Electrical & Computer Engineering, Cornell University, Ithaca, NY 14853, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA","institution_ids":["https://openalex.org/I205783295"]},{"raw_affiliation_string":"School of Electrical & Computer Engineering, Cornell University, Ithaca, NY 14853, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009855846","display_name":"Alyosha Molnar","orcid":"https://orcid.org/0000-0001-7674-1874"},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alyosha Molnar","raw_affiliation_strings":["School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA","School of Electrical & Computer Engineering, Cornell University, Ithaca, NY 14853, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA","institution_ids":["https://openalex.org/I205783295"]},{"raw_affiliation_string":"School of Electrical & Computer Engineering, Cornell University, Ithaca, NY 14853, USA","institution_ids":["https://openalex.org/I205783295"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I205783295"],"apc_list":null,"apc_paid":null,"fwci":0.9854,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.78106098,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"371","last_page":"374"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photodiode","display_name":"Photodiode","score":0.8456726670265198},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.7241508960723877},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.6807420253753662},{"id":"https://openalex.org/keywords/microscale-chemistry","display_name":"Microscale chemistry","score":0.6648691296577454},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.635741114616394},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6038514971733093},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.6019900441169739},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5875107645988464},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5703920722007751},{"id":"https://openalex.org/keywords/diffraction-grating","display_name":"Diffraction grating","score":0.4913705885410309},{"id":"https://openalex.org/keywords/dot-pitch","display_name":"Dot pitch","score":0.462301641702652},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4514365792274475},{"id":"https://openalex.org/keywords/diffraction","display_name":"Diffraction","score":0.4335900545120239},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23880529403686523},{"id":"https://openalex.org/keywords/grating","display_name":"Grating","score":0.20191293954849243},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.12110921740531921},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09058409929275513}],"concepts":[{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.8456726670265198},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.7241508960723877},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.6807420253753662},{"id":"https://openalex.org/C179428855","wikidata":"https://www.wikidata.org/wiki/Q1069216","display_name":"Microscale chemistry","level":2,"score":0.6648691296577454},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.635741114616394},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6038514971733093},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.6019900441169739},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5875107645988464},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5703920722007751},{"id":"https://openalex.org/C126753812","wikidata":"https://www.wikidata.org/wiki/Q653294","display_name":"Diffraction grating","level":3,"score":0.4913705885410309},{"id":"https://openalex.org/C179813606","wikidata":"https://www.wikidata.org/wiki/Q2032861","display_name":"Dot pitch","level":3,"score":0.462301641702652},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4514365792274475},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.4335900545120239},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23880529403686523},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.20191293954849243},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.12110921740531921},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09058409929275513},{"id":"https://openalex.org/C145420912","wikidata":"https://www.wikidata.org/wiki/Q853077","display_name":"Mathematics education","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2009.5280840","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2009.5280840","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10","score":0.6800000071525574}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1491247017","https://openalex.org/W2009476069","https://openalex.org/W2031952819","https://openalex.org/W2044495969","https://openalex.org/W2047081753","https://openalex.org/W2121656466","https://openalex.org/W2150363222","https://openalex.org/W2155330395","https://openalex.org/W2155617382","https://openalex.org/W2170725022","https://openalex.org/W2331422430","https://openalex.org/W2974519174"],"related_works":["https://openalex.org/W1966119149","https://openalex.org/W2321780500","https://openalex.org/W2028671992","https://openalex.org/W2347245756","https://openalex.org/W2099015120","https://openalex.org/W2891632513","https://openalex.org/W810815649","https://openalex.org/W2131990189","https://openalex.org/W2594681224","https://openalex.org/W1964634575"],"abstract_inverted_index":{"We":[0,64],"present":[1,65],"a":[2,21],"pixel-scale":[3],"CMOS":[4,49],"sensor":[5],"for":[6],"near-field,":[7],"lensless":[8,86],"3D":[9],"imaging.":[10],"This":[11],"angle-sensitive":[12],"pixel":[13],"(ASP)":[14],"uses":[15],"local,":[16],"stacked":[17],"diffraction":[18],"gratings":[19],"over":[20],"photodiode":[22],"to":[23],"discriminate":[24],"the":[25,55,72,91],"incident":[26],"angle":[27,80],"of":[28,71,83,94],"incoming":[29],"light.":[30],"The":[31],"ASPs,":[32],"measuring":[33],"20":[34],"mum":[35,39],"wide":[36],"and":[37,68],"40":[38],"long,":[40],"have":[41],"been":[42],"built":[43],"in":[44],"an":[45],"unmodified":[46],"130":[47],"nm":[48],"process.":[50],"Metal":[51],"wiring":[52],"layers":[53],"provide":[54],"required":[56],"gratings,":[57],"while":[58],"intrinsic":[59],"pn-junctions":[60],"act":[61],"as":[62,74,76],"photodiodes.":[63],"operating":[66],"principles":[67],"design":[69],"considerations":[70],"ASP,":[73],"well":[75],"results":[77],"demonstrating":[78],"desired":[79],"sensitivity.":[81],"Arrays":[82],"ASPs":[84],"enable":[85],"microscale":[87],"imaging":[88],"that":[89],"reconstructs":[90],"3-dimensional":[92],"structure":[93],"light":[95],"sources.":[96]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}