{"id":"https://openalex.org/W2113764022","doi":"https://doi.org/10.1109/cicc.2009.5280815","title":"Impact of Transistor Level degradation on product reliability","display_name":"Impact of Transistor Level degradation on product reliability","publication_year":2009,"publication_date":"2009-09-01","ids":{"openalex":"https://openalex.org/W2113764022","doi":"https://doi.org/10.1109/cicc.2009.5280815","mag":"2113764022"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2009.5280815","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2009.5280815","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109073494","display_name":"Tanya Nigam","orcid":null},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Tanya Nigam","raw_affiliation_strings":["Global Foundries, Inc., Sunnyvale, CA, USA","GLOBALFOUNDRIES, 1050 Arques Ave., Sunnyvale, CA 94088, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Global Foundries, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I35662394"]},{"raw_affiliation_string":"GLOBALFOUNDRIES, 1050 Arques Ave., Sunnyvale, CA 94088, USA","institution_ids":["https://openalex.org/I35662394"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5109073494"],"corresponding_institution_ids":["https://openalex.org/I35662394"],"apc_list":null,"apc_paid":null,"fwci":3.3979,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.92690659,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"431","last_page":"438"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.8894845247268677},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7879810929298401},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.7641470432281494},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.7027803063392639},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5836717486381531},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.5348255634307861},{"id":"https://openalex.org/keywords/ring","display_name":"Ring (chemistry)","score":0.5073310732841492},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.49983763694763184},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4620615243911743},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4517502188682556},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4171147346496582},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4038845896720886},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30891579389572144},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26411232352256775},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2118072807788849},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.17032140493392944},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16757914423942566},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10892069339752197},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10632199048995972},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1042499840259552}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.8894845247268677},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7879810929298401},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.7641470432281494},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.7027803063392639},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5836717486381531},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.5348255634307861},{"id":"https://openalex.org/C2780378348","wikidata":"https://www.wikidata.org/wiki/Q25351438","display_name":"Ring (chemistry)","level":2,"score":0.5073310732841492},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.49983763694763184},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4620615243911743},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4517502188682556},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4171147346496582},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4038845896720886},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30891579389572144},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26411232352256775},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2118072807788849},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.17032140493392944},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16757914423942566},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10892069339752197},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10632199048995972},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1042499840259552},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2009.5280815","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2009.5280815","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1592779097","https://openalex.org/W1598816221","https://openalex.org/W1974698823","https://openalex.org/W1983991167","https://openalex.org/W1989488575","https://openalex.org/W1990785435","https://openalex.org/W1999919743","https://openalex.org/W2028337423","https://openalex.org/W2041424982","https://openalex.org/W2047910845","https://openalex.org/W2056727633","https://openalex.org/W2096768978","https://openalex.org/W2103880958","https://openalex.org/W2107547873","https://openalex.org/W2112542663","https://openalex.org/W2112999426","https://openalex.org/W2117738125","https://openalex.org/W2545401637","https://openalex.org/W4242372418","https://openalex.org/W4256357472"],"related_works":["https://openalex.org/W141820298","https://openalex.org/W2049584446","https://openalex.org/W2079781215","https://openalex.org/W4378770497","https://openalex.org/W4308245303","https://openalex.org/W2014033564","https://openalex.org/W2004049596","https://openalex.org/W4399487065","https://openalex.org/W2104413329","https://openalex.org/W3015531425"],"abstract_inverted_index":{"Product":[0],"level":[1],"lifetime":[2],"margins,":[3],"determined":[4],"by":[5],"HCI":[6,15,36],"and":[7,35,42],"BTI,":[8],"are":[9,23],"shrinking":[10],"with":[11,19],"scaling.":[12],"Accurate":[13],"device-level":[14],"degradation":[16,28,49],"models,":[17,22],"together":[18],"known":[20],"BTI":[21],"needed":[24],"to":[25,46],"predict":[26],"frequency":[27,48],"of":[29,53],"a":[30,51],"ring":[31],"oscillator.":[32],"Both":[33],"NBTI":[34],"exhibit":[37],"relief":[38],"during":[39],"AC":[40],"operation":[41],"the":[43],"respective":[44],"contribution":[45],"RO":[47],"is":[50],"function":[52],"applied":[54],"bias.":[55]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}