{"id":"https://openalex.org/W2024062464","doi":"https://doi.org/10.1109/cicc.2008.4672104","title":"Session 16 - Embedded memory","display_name":"Session 16 - Embedded memory","publication_year":2008,"publication_date":"2008-09-01","ids":{"openalex":"https://openalex.org/W2024062464","doi":"https://doi.org/10.1109/cicc.2008.4672104","mag":"2024062464"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2008.4672104","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2008.4672104","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109354875","display_name":"K. Noda","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Kenji Noda","raw_affiliation_strings":["NScore","NScore, USA"],"affiliations":[{"raw_affiliation_string":"NScore","institution_ids":[]},{"raw_affiliation_string":"NScore, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088957303","display_name":"Jean-Christophe Vial","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140450","display_name":"Infineon Technologies (Canada)","ror":"https://ror.org/04hbev594","country_code":"CA","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210140450"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Jean-Christophe Vial","raw_affiliation_strings":["Infineon AG","Infineon, France"],"affiliations":[{"raw_affiliation_string":"Infineon AG","institution_ids":["https://openalex.org/I4210140450"]},{"raw_affiliation_string":"Infineon, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5109354875"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0820067,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"lvi","last_page":"lvii"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.3215999901294708,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.3215999901294708,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.28929999470710754,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.26330000162124634,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.9315910339355469},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6906254887580872},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.622225284576416},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5646933317184448},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.5533016324043274},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.5483763813972473},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.45511558651924133},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.268393874168396},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2526310086250305},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.17691367864608765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17688339948654175},{"id":"https://openalex.org/keywords/world-wide-web","display_name":"World Wide Web","score":0.10385265946388245},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05957302451133728}],"concepts":[{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.9315910339355469},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6906254887580872},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.622225284576416},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5646933317184448},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.5533016324043274},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.5483763813972473},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.45511558651924133},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.268393874168396},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2526310086250305},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.17691367864608765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17688339948654175},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.10385265946388245},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05957302451133728},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2008.4672104","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2008.4672104","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2116397085","https://openalex.org/W2783549708","https://openalex.org/W2535372975","https://openalex.org/W2537636062","https://openalex.org/W2017101954","https://openalex.org/W1594494193","https://openalex.org/W2086578073","https://openalex.org/W2537420636","https://openalex.org/W2378293894","https://openalex.org/W2113742827"],"abstract_inverted_index":{"Penetrating":[0],"into":[1],"sub-tenth":[2],"micron":[3],"regime,":[4],"variations":[5],"in":[6],"transistor":[7],"characteristics":[8],"are":[9],"having":[10],"a":[11],"more":[12],"critical":[13],"impact":[14],"on":[15],"the":[16],"design":[17],"of":[18],"high-density":[19],"memories,":[20],"such":[21],"as":[22],"SRAM,":[23],"Flash":[24],"and":[25,34],"ROM.":[26],"In":[27],"this":[28],"session,":[29],"two":[30],"papers":[31,36],"from":[32,37],"industry":[33],"five":[35],"academia":[38],"will":[39],"be":[40],"presented.":[41]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}