{"id":"https://openalex.org/W2164407220","doi":"https://doi.org/10.1109/cicc.2008.4672088","title":"A CMOS TDC-based digital magnetic Hall sensor using the self temperature compensation","display_name":"A CMOS TDC-based digital magnetic Hall sensor using the self temperature compensation","publication_year":2008,"publication_date":"2008-09-01","ids":{"openalex":"https://openalex.org/W2164407220","doi":"https://doi.org/10.1109/cicc.2008.4672088","mag":"2164407220"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2008.4672088","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2008.4672088","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065293026","display_name":"Young-Jae Min","orcid":"https://orcid.org/0000-0002-0334-5560"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Young-Jae Min","raw_affiliation_strings":["Department of Electronics and Computer Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013743208","display_name":"Soo-Won Kim","orcid":"https://orcid.org/0000-0002-6637-0018"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soo-Won Kim","raw_affiliation_strings":["Department of Electronics and Computer Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5065293026"],"corresponding_institution_ids":["https://openalex.org/I197347611"],"apc_list":null,"apc_paid":null,"fwci":1.0145,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.7977248,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"329","last_page":"332"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.828372597694397},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.6700995564460754},{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.6066056489944458},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5310260057449341},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.5267212390899658},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5135996341705322},{"id":"https://openalex.org/keywords/hall-effect-sensor","display_name":"Hall effect sensor","score":0.5088894367218018},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5078878998756409},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.5055723190307617},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4993453025817871},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4260212182998657},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40739235281944275},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.39261654019355774},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.38187894225120544},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.30834418535232544},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28190112113952637},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15505674481391907},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08925563097000122}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.828372597694397},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.6700995564460754},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.6066056489944458},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5310260057449341},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5267212390899658},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5135996341705322},{"id":"https://openalex.org/C107637996","wikidata":"https://www.wikidata.org/wiki/Q1431247","display_name":"Hall effect sensor","level":3,"score":0.5088894367218018},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5078878998756409},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.5055723190307617},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4993453025817871},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4260212182998657},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40739235281944275},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.39261654019355774},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.38187894225120544},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.30834418535232544},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28190112113952637},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15505674481391907},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08925563097000122},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2008.4672088","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2008.4672088","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8999999761581421}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321373","display_name":"Korea University","ror":"https://ror.org/047dqcg40"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320337407","display_name":"Division of Human Resource Development","ror":"https://ror.org/03mamvh39"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W566488747","https://openalex.org/W653189998","https://openalex.org/W1533614470","https://openalex.org/W1537774006","https://openalex.org/W1592605254","https://openalex.org/W1606091559","https://openalex.org/W1977084925","https://openalex.org/W2016871830","https://openalex.org/W2064189791","https://openalex.org/W2075386052","https://openalex.org/W2075529127","https://openalex.org/W2122240794","https://openalex.org/W2124991176","https://openalex.org/W2126093914","https://openalex.org/W2132298101","https://openalex.org/W2138043036","https://openalex.org/W2157024459","https://openalex.org/W2171702041","https://openalex.org/W3037876176","https://openalex.org/W3103339143","https://openalex.org/W3143002681"],"related_works":["https://openalex.org/W4384112194","https://openalex.org/W2783354812","https://openalex.org/W2103009189","https://openalex.org/W4312958259","https://openalex.org/W4390813131","https://openalex.org/W2349383066","https://openalex.org/W4308259661","https://openalex.org/W4328132048","https://openalex.org/W2146514983","https://openalex.org/W2118008391"],"abstract_inverted_index":{"A":[0],"CMOS":[1,35,92],"TDC-based":[2,51],"digital":[3,52],"magnetic":[4,40,103],"Hall":[5],"sensor":[6,17,21,85],"using":[7],"the":[8,20,38,42,57,79,96,121],"self":[9,65],"temperature":[10,66,74,81,111],"compensation":[11,67],"schemes":[12,68],"is":[13,29,44,54,86,132],"proposed.":[14],"The":[15,50,64,83],"proposed":[16,55,84],"consists":[18],"of":[19,69],"device,":[22],"its":[23],"bias":[24],"and":[25,61,71,94,110],"signal-processing":[26],"circuit":[27,53],"which":[28],"fully":[30],"compatible":[31],"with":[32,46,88],"a":[33,89],"standard":[34,90],"technology.":[36],"For":[37],"high":[39],"sensitivity,":[41],"MAGFET":[43],"implemented":[45,87],"proper":[47],"geometric":[48],"parameters.":[49],"for":[56,78],"low":[58,80,123],"power":[59,124],"consumption":[60,125],"easy":[62],"design.":[63],"mobility":[70],"threshold":[72],"voltage":[73,131],"effects":[75],"are":[76],"utilized":[77],"variation.":[82],"0.18\u03bcm":[91],"technology":[93],"shows":[95],"good":[97],"detectable":[98],"resolution":[99],"by":[100,113,126],"0.8\u03bcT":[101],"under":[102],"fields":[104],"ranging":[105,115],"from":[106,116],"0":[107],"to":[108,118],"0.8T":[109],"variations":[112],"250nT":[114],"\u221240\u00b0C":[117],"+80\u00b0C.":[119],"And":[120],"very":[122],"360\u03bcW":[127],"at":[128],"1.8V":[129],"supply":[130],"measured.":[133]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-03-12T08:34:05.389933","created_date":"2025-10-10T00:00:00"}