{"id":"https://openalex.org/W2072077203","doi":"https://doi.org/10.1109/cicc.2008.4672038","title":"Measurement and analysis of variability in 45nm strained-Si CMOS technology","display_name":"Measurement and analysis of variability in 45nm strained-Si CMOS technology","publication_year":2008,"publication_date":"2008-09-01","ids":{"openalex":"https://openalex.org/W2072077203","doi":"https://doi.org/10.1109/cicc.2008.4672038","mag":"2072077203"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2008.4672038","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2008.4672038","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054062234","display_name":"Liang-Teck Pang","orcid":null},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Liang-Teck Pang","raw_affiliation_strings":["Electrical Engineering and Computer Sciences, University of California, Berkeley, USA","Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Sciences, University of California, Berkeley, USA","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041784384","display_name":"Borivoje Nikoli\u0107","orcid":"https://orcid.org/0000-0003-2324-1715"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Borivoje Nikolic","raw_affiliation_strings":["Electrical Engineering and Computer Sciences, University of California, Berkeley, USA","Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Sciences, University of California, Berkeley, USA","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA","institution_ids":["https://openalex.org/I95457486"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.7835,"has_fulltext":false,"cited_by_count":45,"citation_normalized_percentile":{"value":0.96935561,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"6922","issue":null,"first_page":"129","last_page":"132"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7545747756958008},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.45410215854644775},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.44646620750427246},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38558971881866455},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.3593621850013733},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34422361850738525},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29084357619285583}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7545747756958008},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.45410215854644775},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44646620750427246},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38558971881866455},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3593621850013733},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34422361850738525},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29084357619285583}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/cicc.2008.4672038","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2008.4672038","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.228.8284","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.228.8284","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.eecs.berkeley.edu/%7Ebora/Journals/2009/JSSC2009-Aug.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7799999713897705}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W98379717","https://openalex.org/W1499824786","https://openalex.org/W1530036224","https://openalex.org/W1572287951","https://openalex.org/W1580951898","https://openalex.org/W1607434217","https://openalex.org/W1870293527","https://openalex.org/W1968791949","https://openalex.org/W1993325125","https://openalex.org/W2006992622","https://openalex.org/W2020741729","https://openalex.org/W2033443176","https://openalex.org/W2059147047","https://openalex.org/W2066701048","https://openalex.org/W2072796287","https://openalex.org/W2100344939","https://openalex.org/W2103323734","https://openalex.org/W2104130192","https://openalex.org/W2120475991","https://openalex.org/W2129883611","https://openalex.org/W2140823559","https://openalex.org/W2150526221","https://openalex.org/W2153292994","https://openalex.org/W2491447123","https://openalex.org/W2542369305"],"related_works":["https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W4390401159","https://openalex.org/W2744391499","https://openalex.org/W3120461830","https://openalex.org/W4230250635","https://openalex.org/W3041790586","https://openalex.org/W2018879842","https://openalex.org/W2109445684"],"abstract_inverted_index":{"A":[0],"test-chip":[1],"in":[2,17],"a":[3],"low-power":[4],"45nm":[5],"technology,":[6],"featuring":[7],"uniaxial":[8],"strained":[9],"Si,":[10],"has":[11,31],"been":[12,32],"built":[13],"to":[14],"study":[15],"variability":[16,30],"CMOS":[18],"circuits.":[19],"Systematic":[20],"layout-induced":[21,62],"variation,":[22],"die-to-die":[23],"(D2D),":[24],"wafer-to-wafer":[25],"(W2W)":[26],"and":[27,34,44,61],"within-die":[28],"(WID)":[29],"measured":[33,49],"analyzed.":[35],"Delay":[36],"is":[37,48,64],"characterized":[38],"using":[39],"an":[40,51],"array":[41],"of":[42],"ring-oscillators":[43],"transistor":[45],"leakage":[46],"current":[47],"with":[50],"on-chip":[52],"ADC.":[53],"Results":[54],"show":[55],"that":[56],"systematic":[57],"variations":[58],"are":[59],"small":[60],"variation":[63],"dominated":[65],"by":[66],"strain":[67],"effects.":[68]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":8}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}