{"id":"https://openalex.org/W2114013203","doi":"https://doi.org/10.1109/cicc.2008.4672012","title":"A process variation compensation scheme using cell-based forward body-biasing circuits usable for 1.2V design","display_name":"A process variation compensation scheme using cell-based forward body-biasing circuits usable for 1.2V design","publication_year":2008,"publication_date":"2008-09-01","ids":{"openalex":"https://openalex.org/W2114013203","doi":"https://doi.org/10.1109/cicc.2008.4672012","mag":"2114013203"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2008.4672012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2008.4672012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021907697","display_name":"Fumihiko Tachibana","orcid":"https://orcid.org/0000-0002-6311-9215"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Fumihiko Tachibana","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan","Toshiba Corporation, Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation, Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065544054","display_name":"Hironori Sato","orcid":"https://orcid.org/0000-0002-3746-4672"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hironori Sato","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan","Toshiba Corporation, Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation, Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026500836","display_name":"Takahiro Yamashita","orcid":"https://orcid.org/0000-0002-9739-4936"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro Yamashita","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan","Toshiba Corporation, Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation, Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105675534","display_name":"Hiroyuki Hara","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Hara","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan","Toshiba Corporation, Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation, Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065435508","display_name":"Takeshi Kitahara","orcid":"https://orcid.org/0000-0001-7063-5122"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeshi Kitahara","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan","Toshiba Corporation, Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation, Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078388756","display_name":"Shuou Nomura","orcid":"https://orcid.org/0009-0009-8545-6675"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shuou Nomura","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan","Toshiba Corporation, Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation, Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088806031","display_name":"Fumiyuki Yamane","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Fumiyuki Yamane","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan","Toshiba Corporation, Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation, Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102163477","display_name":"Yoshiro Tsuboi","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshiro Tsuboi","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan","Toshiba Corporation, Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation, Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101030227","display_name":"Keiko Seki","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keiko Seki","raw_affiliation_strings":["Toshiba Microelectronics Corporation, Kawasaki, Japan","Toshiba Microelectron. Corp., Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Microelectronics Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Microelectron. Corp., Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111905533","display_name":"Shuuji Matsumoto","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shuuji Matsumoto","raw_affiliation_strings":["Toshiba Microelectronics Corporation, Kawasaki, Japan","Toshiba Microelectron. Corp., Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Microelectronics Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Microelectron. Corp., Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055798666","display_name":"Yoshinori Watanabe","orcid":"https://orcid.org/0000-0002-5488-4812"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshinori Watanabe","raw_affiliation_strings":["Toshiba Microelectronics Corporation, Kawasaki, Japan","Toshiba Microelectron. Corp., Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Microelectronics Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Microelectron. Corp., Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068257959","display_name":"Mototsugu Hamada","orcid":"https://orcid.org/0000-0002-0461-4208"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mototsugu Hamada","raw_affiliation_strings":["Toshiba Corporation, Kawasaki, Japan","Toshiba Corporation, Kawasaki"],"affiliations":[{"raw_affiliation_string":"Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Toshiba Corporation, Kawasaki","institution_ids":["https://openalex.org/I1292669757"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":12,"corresponding_author_ids":["https://openalex.org/A5021907697"],"corresponding_institution_ids":["https://openalex.org/I1292669757"],"apc_list":null,"apc_paid":null,"fwci":1.6647,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.84745984,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"29","last_page":"32"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.8037866950035095},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.7653477191925049},{"id":"https://openalex.org/keywords/usable","display_name":"USable","score":0.6670981049537659},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.6046593189239502},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5650135278701782},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.522747278213501},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5003457069396973},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4969992935657501},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.4835914969444275},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4772472381591797},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.455446720123291},{"id":"https://openalex.org/keywords/limiter","display_name":"Limiter","score":0.41134941577911377},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.24529242515563965},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23808538913726807},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2139195203781128},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13113519549369812}],"concepts":[{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.8037866950035095},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.7653477191925049},{"id":"https://openalex.org/C2780615836","wikidata":"https://www.wikidata.org/wiki/Q2471869","display_name":"USable","level":2,"score":0.6670981049537659},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.6046593189239502},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5650135278701782},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.522747278213501},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5003457069396973},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4969992935657501},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.4835914969444275},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4772472381591797},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.455446720123291},{"id":"https://openalex.org/C45011657","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiter","level":2,"score":0.41134941577911377},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.24529242515563965},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23808538913726807},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2139195203781128},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13113519549369812},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2008.4672012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2008.4672012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1509583710","https://openalex.org/W2069217703","https://openalex.org/W2086447087","https://openalex.org/W2106550461","https://openalex.org/W2108049334","https://openalex.org/W2111020485","https://openalex.org/W2121520532","https://openalex.org/W2142410062","https://openalex.org/W2161000806","https://openalex.org/W2166677938","https://openalex.org/W4238765112","https://openalex.org/W4243486098"],"related_works":["https://openalex.org/W2021628707","https://openalex.org/W1594063253","https://openalex.org/W4244089572","https://openalex.org/W1964694529","https://openalex.org/W2156087976","https://openalex.org/W1971269059","https://openalex.org/W2373012476","https://openalex.org/W2046898974","https://openalex.org/W2751736054","https://openalex.org/W4205626949"],"abstract_inverted_index":{"A":[0],"cell-based":[1],"forward":[2],"body-biasing":[3],"technique":[4,44],"to":[5,45],"suppress":[6],"the":[7,49,58],"global":[8],"process":[9],"variation":[10],"and":[11,27],"its":[12],"design":[13],"flow":[14],"are":[15],"proposed.":[16],"Latch-up":[17],"free":[18],"operation":[19],"is":[20,34,52],"guaranteed":[21],"by":[22,54],"embedded":[23],"current":[24],"source":[25],"cells":[26,29],"limiter":[28],"even":[30],"when":[31],"supply":[32],"voltage":[33],"1.2":[35],"V":[36],"with":[37],"small":[38],"area":[39],"overhead.":[40],"By":[41],"applying":[42],"this":[43],"a":[46],"media":[47],"processor,":[48],"worst-case":[50],"delay":[51],"reduced":[53],"20%":[55],"without":[56],"sacrificing":[57],"maximum":[59],"leakage":[60],"spec.":[61]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}