{"id":"https://openalex.org/W1994448796","doi":"https://doi.org/10.1109/cicc.2007.4405865","title":"Accurate Modeling of RF Circuit Blocks: Weakly-Nonlinear Narrowband LNAs","display_name":"Accurate Modeling of RF Circuit Blocks: Weakly-Nonlinear Narrowband LNAs","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W1994448796","doi":"https://doi.org/10.1109/cicc.2007.4405865","mag":"1994448796"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2007.4405865","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2007.4405865","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077122791","display_name":"J.A. Croon","orcid":"https://orcid.org/0000-0003-0215-441X"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"J. A. Croon","raw_affiliation_strings":["NXP Semiconductors Research, Eindhoven, Netherlands","NXP Semicond. Res., Eindhoven"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors Research, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"NXP Semicond. Res., Eindhoven","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110563720","display_name":"D.M.W. Leenaerts","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"D. M. W. Leenaerts","raw_affiliation_strings":["NXP Semiconductors Research, Eindhoven, Netherlands","NXP Semicond. Res., Eindhoven"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors Research, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"NXP Semicond. Res., Eindhoven","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113606468","display_name":"D.B.M. Klaassen","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"D. B. M. Klaassen","raw_affiliation_strings":["NXP Semiconductors Research, Eindhoven, Netherlands","NXP Semicond. Res., Eindhoven"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors Research, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]},{"raw_affiliation_string":"NXP Semicond. Res., Eindhoven","institution_ids":["https://openalex.org/I109147379"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I109147379"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"865","last_page":"868"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/narrowband","display_name":"Narrowband","score":0.8599590063095093},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6900981068611145},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5817018151283264},{"id":"https://openalex.org/keywords/transistor-model","display_name":"Transistor model","score":0.5613458156585693},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.541219174861908},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5144432187080383},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.48658859729766846},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.4819895625114441},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4762437641620636},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.41237854957580566},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.387555867433548},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27606379985809326},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16658943891525269},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0587383508682251}],"concepts":[{"id":"https://openalex.org/C2776096036","wikidata":"https://www.wikidata.org/wiki/Q1140483","display_name":"Narrowband","level":2,"score":0.8599590063095093},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6900981068611145},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5817018151283264},{"id":"https://openalex.org/C150169584","wikidata":"https://www.wikidata.org/wiki/Q7834319","display_name":"Transistor model","level":4,"score":0.5613458156585693},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.541219174861908},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5144432187080383},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.48658859729766846},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.4819895625114441},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4762437641620636},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.41237854957580566},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.387555867433548},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27606379985809326},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16658943891525269},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0587383508682251},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2007.4405865","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2007.4405865","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1485946213","https://openalex.org/W2093688445","https://openalex.org/W2102716462","https://openalex.org/W2113127220"],"related_works":["https://openalex.org/W2109674204","https://openalex.org/W2303515603","https://openalex.org/W2012380465","https://openalex.org/W2034106250","https://openalex.org/W2106224022","https://openalex.org/W2609117520","https://openalex.org/W2040240112","https://openalex.org/W1817913304","https://openalex.org/W2170688190","https://openalex.org/W2188506260"],"abstract_inverted_index":{"An":[0],"extensive":[1],"behavioral":[2],"model":[3,38],"is":[4,39],"presented":[5],"for":[6,25],"weakly-nonlinear":[7],"narrowband":[8],"LNAs.":[9],"Both":[10],"the":[11],"electrical":[12],"transfer":[13],"and":[14,28,49],"noise":[15],"properties":[16],"are":[17,64],"well":[18],"described.":[19],"Performance":[20],"figures":[21],"can":[22],"be":[23],"predicted":[24],"varying":[26],"source":[27],"load":[29],"conditions.":[30],"A":[31],"Verilog-A":[32],"implementation":[33],"facilitates":[34],"cross-platform":[35],"simulations.":[36],"The":[37],"compared":[40],"to":[41],"transistor-level":[42],"simulations":[43],"of":[44,50],"a":[45,51,60],"simple":[46],"textbook":[47],"LNA":[48,56],"state-of-the-art":[52],"65":[53],"nm":[54],"CMOS":[55],"in":[57],"combination":[58],"with":[59],"mixer.":[61],"Excellent":[62],"agreements":[63],"achieved.":[65]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}