{"id":"https://openalex.org/W2072717808","doi":"https://doi.org/10.1109/cicc.2007.4405850","title":"Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips","display_name":"Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2072717808","doi":"https://doi.org/10.1109/cicc.2007.4405850","mag":"2072717808"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2007.4405850","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2007.4405850","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113369049","display_name":"Norm Robson","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Norm Robson","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM, Hopewell"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Hopewell","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034793002","display_name":"John Safran","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Safran","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM, Hopewell"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Hopewell","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108429941","display_name":"C. Kothandaraman","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chandrasekharan Kothandaraman","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM, Hopewell"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Hopewell","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012736438","display_name":"Alberto Cestero","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alberto Cestero","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM, Hopewell"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Hopewell","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100441919","display_name":"Xiang Chen","orcid":"https://orcid.org/0000-0002-3371-0055"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiang Chen","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM, Hopewell"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Hopewell","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041785604","display_name":"Raj Rajeevakumar","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Raj Rajeevakumar","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM, Hopewell"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Hopewell","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076880891","display_name":"A. Leslie","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alan Leslie","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM, Hopewell"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Hopewell","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086326988","display_name":"D. Moy","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dan Moy","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM, Hopewell"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Hopewell","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079341609","display_name":"T. Kirihata","orcid":"https://orcid.org/0000-0002-3507-0274"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Toshiaki Kirihata","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM, Hopewell"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Hopewell","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091022757","display_name":"Subramanian S. Iyer","orcid":"https://orcid.org/0000-0003-1220-031X"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Subramanian Iyer","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM, Hopewell"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Hopewell","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5113369049"],"corresponding_institution_ids":["https://openalex.org/I1341412227"],"apc_list":null,"apc_paid":null,"fwci":2.5143,"has_fulltext":false,"cited_by_count":81,"citation_normalized_percentile":{"value":0.89216613,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"799","last_page":"804"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9829000234603882,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.8261777758598328},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8162312507629395},{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.7040119171142578},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.615281343460083},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4925449788570404},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.46484559774398804},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3867962658405304},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3227977752685547},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.266695111989975},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.16328692436218262},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.14924126863479614},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10218322277069092},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10185113549232483}],"concepts":[{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.8261777758598328},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8162312507629395},{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.7040119171142578},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.615281343460083},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4925449788570404},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.46484559774398804},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3867962658405304},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3227977752685547},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.266695111989975},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.16328692436218262},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14924126863479614},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10218322277069092},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10185113549232483}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2007.4405850","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2007.4405850","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1542907730","https://openalex.org/W1575732703","https://openalex.org/W2032431045","https://openalex.org/W2097538613","https://openalex.org/W2099158291","https://openalex.org/W2120747262","https://openalex.org/W2135465509","https://openalex.org/W2138052574","https://openalex.org/W2151460191","https://openalex.org/W2156304049","https://openalex.org/W2163629952","https://openalex.org/W2169342007","https://openalex.org/W6682750983"],"related_works":["https://openalex.org/W3000097931","https://openalex.org/W2354322770","https://openalex.org/W3126131865","https://openalex.org/W4237547500","https://openalex.org/W1570848052","https://openalex.org/W2373192430","https://openalex.org/W4239268388","https://openalex.org/W4253186488","https://openalex.org/W1537496349","https://openalex.org/W2379407973"],"abstract_inverted_index":{"Electrical":[0],"fuse":[1,31],"(eFUSE)":[2],"has":[3],"become":[4],"a":[5,59],"popular":[6],"choice":[7],"to":[8,36],"enable":[9],"memory":[10],"redundancy,":[11],"chip":[12,65],"identification":[13],"and":[14,19,27,42,53],"authentication,":[15],"analog":[16],"device":[17],"trimming,":[18],"other":[20],"applications.":[21],"We":[22],"will":[23],"review":[24],"the":[25,56,63,67],"evolution":[26],"applications":[28],"of":[29,66],"electrical":[30],"solutions":[32],"for":[33,62],"180":[34],"nm":[35,38,51],"45":[37],"technologies":[39],"at":[40],"IBM,":[41],"provide":[43],"some":[44],"insight":[45],"into":[46],"future":[47],"uses":[48],"in":[49],"32":[50],"technology":[52],"beyond":[54],"with":[55],"eFUSE":[57],"as":[58],"building":[60],"block":[61],"autonomic":[64],"future.":[68]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":8},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":5}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}