{"id":"https://openalex.org/W2097027186","doi":"https://doi.org/10.1109/cicc.2007.4405796","title":"A Low Standby Power Flip-flop with Reduced Circuit and Control Complexity","display_name":"A Low Standby Power Flip-flop with Reduced Circuit and Control Complexity","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2097027186","doi":"https://doi.org/10.1109/cicc.2007.4405796","mag":"2097027186"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2007.4405796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2007.4405796","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015329523","display_name":"Lawrence T. Clark","orcid":"https://orcid.org/0000-0001-7741-6512"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lawrence T. Clark","raw_affiliation_strings":["Department of Electrical Engineering, Arizona State University, USA","Arizona State University, Tempe,#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Arizona State University, Tempe,#TAB#","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108500092","display_name":"Mohammed Kabir","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammed Kabir","raw_affiliation_strings":["Department of Electrical Engineering, Arizona State University, USA","Arizona State University, Tempe,#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Arizona State University, Tempe,#TAB#","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065434632","display_name":"Jonathan E. Knudsen","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jonathan E. Knudsen","raw_affiliation_strings":["Department of Electrical Engineering, Arizona State University, USA","Arizona State University, Tempe,#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Arizona State University, Tempe,#TAB#","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":1.4973,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.79773757,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"3","issue":null,"first_page":"571","last_page":"574"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/standby-power","display_name":"Standby power","score":0.9365854263305664},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6189331412315369},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.476161926984787},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.474883496761322},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.47186535596847534},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.4633150100708008},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45511630177497864},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4483014941215515},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4408084452152252},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.43370410799980164},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4269736409187317},{"id":"https://openalex.org/keywords/power-gating","display_name":"Power gating","score":0.420291930437088},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.368129700422287},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3458516597747803},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.335688054561615},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.23864737153053284},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.09503614902496338},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09139305353164673}],"concepts":[{"id":"https://openalex.org/C7140552","wikidata":"https://www.wikidata.org/wiki/Q1366402","display_name":"Standby power","level":3,"score":0.9365854263305664},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6189331412315369},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.476161926984787},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.474883496761322},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.47186535596847534},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.4633150100708008},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45511630177497864},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4483014941215515},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4408084452152252},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43370410799980164},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4269736409187317},{"id":"https://openalex.org/C2780700455","wikidata":"https://www.wikidata.org/wiki/Q7236515","display_name":"Power gating","level":4,"score":0.420291930437088},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.368129700422287},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3458516597747803},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.335688054561615},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.23864737153053284},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.09503614902496338},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09139305353164673},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2007.4405796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2007.4405796","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8600000143051147}],"awards":[],"funders":[{"id":"https://openalex.org/F4320338294","display_name":"Air Force Research Laboratory","ror":"https://ror.org/02e2egq70"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1555969351","https://openalex.org/W2016044694","https://openalex.org/W2061632702","https://openalex.org/W2105035472","https://openalex.org/W2116070420","https://openalex.org/W2126810113","https://openalex.org/W2154941994","https://openalex.org/W2285765729","https://openalex.org/W3172772885"],"related_works":["https://openalex.org/W2075172982","https://openalex.org/W3013845316","https://openalex.org/W2783501501","https://openalex.org/W2001738463","https://openalex.org/W2282162811","https://openalex.org/W2112183879","https://openalex.org/W2082217244","https://openalex.org/W12274323","https://openalex.org/W2136873993","https://openalex.org/W3135068662"],"abstract_inverted_index":{"A":[0],"flip-flop":[1],"using":[2,70],"a":[3,34,86],"combination":[4],"of":[5,94],"thin":[6],"and":[7,14,19,61],"thick":[8,35,71,98],"gate":[9,36,72,99],"transistors":[10],"combines":[11],"high":[12,30,48],"performance":[13,31,49],"low":[15,43,76,110,138],"standby":[16,44,77,121,140],"power.":[17],"Setup":[18],"hold":[20],"times":[21],"are":[22,102,134],"controlled":[23],"by":[24],"the":[25,47,92,95,127],"master":[26],"latch":[27,38,117],"implemented":[28],"in":[29],"transistors,":[32],"while":[33],"slave":[37],"provides":[39],"state":[40,79],"retention":[41,107],"at":[42,109,125],"power":[45,51,78,139],"when":[46],"circuit":[50,60],"supply":[52,111,118],"is":[53],"gated":[54],"off.":[55],"The":[56,97],"design":[57],"has":[58],"reduced":[59,115],"power-down":[62],"control":[63],"complexity":[64],"compared":[65],"to":[66,104,129],"previously":[67],"described":[68],"circuits":[69],"shadow":[73,100,116],"latches":[74,101],"for":[75,137],"storage.":[80],"Measured":[81],"test":[82],"chip":[83],"results":[84],"on":[85],"foundry":[87],"130":[88],"nm":[89],"process":[90],"prove":[91],"viability":[93],"design.":[96],"shown":[103],"have":[105],"good":[106],"capability":[108],"voltages,":[112],"suggesting":[113],"that":[114,133],"voltage":[119],"during":[120],"will":[122],"be":[123],"effective":[124],"mitigating":[126],"drain":[128],"bulk":[130],"leakage":[131],"components":[132],"increasingly":[135],"limiting":[136],"modes.":[141]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}