{"id":"https://openalex.org/W2137297592","doi":"https://doi.org/10.1109/cicc.2007.4405727","title":"A Wide Range Spatial Frequency Analysis of Intra-Die Variations with 4-mm 4000 \u00d7 1 Transistor Arrays in 90nm CMOS","display_name":"A Wide Range Spatial Frequency Analysis of Intra-Die Variations with 4-mm 4000 \u00d7 1 Transistor Arrays in 90nm CMOS","publication_year":2007,"publication_date":"2007-09-01","ids":{"openalex":"https://openalex.org/W2137297592","doi":"https://doi.org/10.1109/cicc.2007.4405727","mag":"2137297592"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2007.4405727","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2007.4405727","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026369249","display_name":"David Levacq","orcid":"https://orcid.org/0000-0001-9121-7333"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"David Levacq","raw_affiliation_strings":["Center for Collaborative Research, University of Tokyo, Japan","Tokyo Univ., Tokyo"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Collaborative Research, University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"Tokyo Univ., Tokyo","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108516760","display_name":"Takuya Minakawa","orcid":null},"institutions":[{"id":"https://openalex.org/I1320697193","display_name":"Canon (Japan)","ror":"https://ror.org/05gg0gh87","country_code":"JP","type":"company","lineage":["https://openalex.org/I1320697193"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takuya Minakawa","raw_affiliation_strings":["Canon, Inc., Japan","Center for Collaborative Research, University of Tokyo, Japan; Canon Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Canon, Inc., Japan","institution_ids":["https://openalex.org/I1320697193"]},{"raw_affiliation_string":"Center for Collaborative Research, University of Tokyo, Japan; Canon Inc","institution_ids":["https://openalex.org/I1320697193"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003282110","display_name":"Makoto Takamiya","orcid":"https://orcid.org/0000-0003-0289-7790"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto Takamiya","raw_affiliation_strings":["VLSI Design and Education Center, University of Tokyo, Japan","Center for Collaborative Research, University of Tokyo, Japan; VLSI Design and Education Center, University of Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center, University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"Center for Collaborative Research, University of Tokyo, Japan; VLSI Design and Education Center, University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007151780","display_name":"Takayasu Sakurai","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayasu Sakurai","raw_affiliation_strings":["Center for Collaborative Research, University of Tokyo, Japan","Tokyo Univ., Tokyo"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Collaborative Research, University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"Tokyo Univ., Tokyo","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.9947,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.91429084,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"257","last_page":"260"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.7837050557136536},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7124131321907043},{"id":"https://openalex.org/keywords/die","display_name":"Die (integrated circuit)","score":0.6471364498138428},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.6361196041107178},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5184704661369324},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5094743371009827},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46154525876045227},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.4309881925582886},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4246480166912079},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4091297388076782},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15584751963615417},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.05815741419792175}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.7837050557136536},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7124131321907043},{"id":"https://openalex.org/C111106434","wikidata":"https://www.wikidata.org/wiki/Q1072430","display_name":"Die (integrated circuit)","level":2,"score":0.6471364498138428},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6361196041107178},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5184704661369324},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5094743371009827},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46154525876045227},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.4309881925582886},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4246480166912079},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4091297388076782},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15584751963615417},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.05815741419792175},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2007.4405727","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2007.4405727","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1607434217","https://openalex.org/W2073711779","https://openalex.org/W2099320289","https://openalex.org/W2104010258","https://openalex.org/W2134067926","https://openalex.org/W2140823559","https://openalex.org/W2142718365","https://openalex.org/W2150526221","https://openalex.org/W2163165699","https://openalex.org/W2171772964","https://openalex.org/W2461540999","https://openalex.org/W2532574515","https://openalex.org/W4252078645"],"related_works":["https://openalex.org/W2042913821","https://openalex.org/W2069427488","https://openalex.org/W4281694563","https://openalex.org/W2372289614","https://openalex.org/W2629813803","https://openalex.org/W2041067810","https://openalex.org/W2250518232","https://openalex.org/W2080696413","https://openalex.org/W4389383638","https://openalex.org/W4241238243"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,18],"investigate":[3],"the":[4,8,36,46,69,82],"systematic":[5],"intra-die":[6,9],"variations,":[7],"threshold":[10,72],"voltage":[11,73],"and":[12,68,75],"on-current":[13,76],"variations":[14,47,51,61,74,77],"are":[15,52,78],"measured":[16,67],"thanks":[17],"4-mm":[19],"4000":[20],"\u00d7":[21],"1":[22,26],"transistor":[23],"arrays":[24],"with":[25],"\u03bcm":[27],"transistor-pitch":[28],"in":[29],"a":[30],"90":[31],"nm":[32],"CMOS":[33],"technology,":[34],"achieving":[35],"widest":[37],"spatial":[38,42],"distribution":[39],"range.":[40],"The":[41,57],"frequency":[43],"analysis":[44],"of":[45,59],"indicates":[48],"that":[49],"both":[50,60],"random":[53],"across":[54],"4":[55],"mm.":[56],"dependence":[58],"on":[62],"body":[63],"bias":[64],"is":[65],"also":[66],"relationships":[70],"between":[71],"analyzed":[79],"by":[80],"using":[81],"alpha-power":[83],"law":[84],"model.":[85]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}