{"id":"https://openalex.org/W2120506932","doi":"https://doi.org/10.1109/cicc.2007.4405704","title":"Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter","display_name":"Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter","publication_year":2007,"publication_date":"2007-09-01","ids":{"openalex":"https://openalex.org/W2120506932","doi":"https://doi.org/10.1109/cicc.2007.4405704","mag":"2120506932"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2007.4405704","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2007.4405704","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034107129","display_name":"Kiyotaka Ichiyama","orcid":null},"institutions":[{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kiyotaka Ichiyama","raw_affiliation_strings":["Advantest Lab. Ltd., Sendai"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Lab. Ltd., Sendai","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109203606","display_name":"Masahiro Ishida","orcid":"https://orcid.org/0009-0000-7712-4966"},"institutions":[{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Masahiro Ishida","raw_affiliation_strings":["Advantest Lab. Ltd., Sendai"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Lab. Ltd., Sendai","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010763159","display_name":"Takahiro Yamaguchi","orcid":"https://orcid.org/0000-0003-0325-8878"},"institutions":[{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Takahiro J. Yamaguchi","raw_affiliation_strings":["Advantest Lab. Ltd., Sendai"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Lab. Ltd., Sendai","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112265787","display_name":"M. Soma","orcid":null},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mani Soma","raw_affiliation_strings":["Dept. of Electrical Engg., University of Washington, Seattle, WA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engg., University of Washington, Seattle, WA#TAB#","institution_ids":["https://openalex.org/I201448701"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4991,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.61404944,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"161","last_page":"164"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9435842037200928},{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.6765280961990356},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6149536967277527},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6120938658714294},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5256001949310303},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5125260353088379},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46850091218948364},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.42473864555358887},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20429834723472595}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9435842037200928},{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.6765280961990356},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6149536967277527},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6120938658714294},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5256001949310303},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5125260353088379},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46850091218948364},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.42473864555358887},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20429834723472595}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2007.4405704","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2007.4405704","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Custom Integrated Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1604115488","https://openalex.org/W2127929773","https://openalex.org/W2145034317","https://openalex.org/W2161961203","https://openalex.org/W2174322375","https://openalex.org/W4251205657","https://openalex.org/W6685730544"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2155789024","https://openalex.org/W2315668284","https://openalex.org/W3213608175","https://openalex.org/W2109491806","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W2037276323","https://openalex.org/W3095633856","https://openalex.org/W2069664317"],"abstract_inverted_index":{"A":[0],"new":[1],"design":[2],"for":[3],"a":[4,22,32],"mismatch-tolerant":[5],"on-chip":[6],"data":[7],"jitter":[8,51],"measurement":[9],"circuit":[10,56],"in":[11,17,66],"0.11-mum":[12],"CMOS":[13],"is":[14,40,57],"experimentally":[15],"verified":[16,41],"this":[18],"paper.":[19],"It":[20],"utilizes":[21],"data-to-clock":[23],"converter,":[24],"pulse":[25],"generators,":[26],"and":[27,45],"an":[28],"integrator":[29],"followed":[30],"by":[31],"sample-&-hold.":[33],"The":[34,50],"circuit's":[35],"tolerance":[36],"to":[37,60,64],"data-rate":[38],"changes":[39],"using":[42],"2.5":[43],"Gbps":[44,47],"2.98":[46],"PRBS":[48],"signals.":[49],"gain":[52],"of":[53],"the":[54,67],"prototype":[55],"also":[58],"shown":[59],"be":[61],"less":[62],"sensitive":[63],"variations":[65],"supply":[68],"voltage.":[69]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}