{"id":"https://openalex.org/W1560282249","doi":"https://doi.org/10.1109/cicc.2005.1568797","title":"MOSFET harmonic distortion analysis up to the non-quasi-static frequency regime","display_name":"MOSFET harmonic distortion analysis up to the non-quasi-static frequency regime","publication_year":2006,"publication_date":"2006-01-18","ids":{"openalex":"https://openalex.org/W1560282249","doi":"https://doi.org/10.1109/cicc.2005.1568797","mag":"1560282249"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2005.1568797","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2005.1568797","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046860598","display_name":"Yoichi Takeda","orcid":"https://orcid.org/0000-0002-7146-3585"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Takeda","raw_affiliation_strings":["Graduate School of Advanced Sciences of Matter","Graduate School of Advanced Sciences of Matter, Hiroshima University, Higashihiroshima, Hiroshima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Advanced Sciences of Matter","institution_ids":[]},{"raw_affiliation_string":"Graduate School of Advanced Sciences of Matter, Hiroshima University, Higashihiroshima, Hiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077533238","display_name":"D. Navarro","orcid":"https://orcid.org/0000-0001-6167-9617"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"D. Navarro","raw_affiliation_strings":["Graduate School of Advanced Sciences of Matter","Graduate School of Advanced Sciences of Matter, Hiroshima University, Higashihiroshima, Hiroshima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Advanced Sciences of Matter","institution_ids":[]},{"raw_affiliation_string":"Graduate School of Advanced Sciences of Matter, Hiroshima University, Higashihiroshima, Hiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113780429","display_name":"Shinichi Chiba","orcid":null},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Chiba","raw_affiliation_strings":["Graduate School of Advanced Sciences of Matter","Graduate School of Advanced Sciences of Matter, Hiroshima University, Higashihiroshima, Hiroshima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Advanced Sciences of Matter","institution_ids":[]},{"raw_affiliation_string":"Graduate School of Advanced Sciences of Matter, Hiroshima University, Higashihiroshima, Hiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075171408","display_name":"M. Miura\u2013Mattausch","orcid":"https://orcid.org/0000-0002-9244-9539"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Miura-Mattausch","raw_affiliation_strings":["Graduate School of Advanced Sciences of Matter","Graduate School of Advanced Sciences of Matter, Hiroshima University, Higashihiroshima, Hiroshima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Advanced Sciences of Matter","institution_ids":[]},{"raw_affiliation_string":"Graduate School of Advanced Sciences of Matter, Hiroshima University, Higashihiroshima, Hiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086404781","display_name":"Hans J\u00fcrgen Mattausch","orcid":"https://orcid.org/0000-0001-5712-1020"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H.J. Mattausch","raw_affiliation_strings":["Graduate School of Advanced Sciences of Matter","Research Center for Nanodevices and Systems, Hiroshima University, Higashi-Hiroshima, Hiroshima, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Advanced Sciences of Matter","institution_ids":[]},{"raw_affiliation_string":"Research Center for Nanodevices and Systems, Hiroshima University, Higashi-Hiroshima, Hiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087517022","display_name":"T. Ohguro","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Ohguro","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091067358","display_name":"T. Iizuka","orcid":"https://orcid.org/0000-0003-0680-6737"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Iizuka","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023646619","display_name":"M. Taguchi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Taguchi","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075499776","display_name":"S. Kumashiro","orcid":"https://orcid.org/0000-0003-1729-1361"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Kumashiro","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210125918"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063547580","display_name":"Shunsuke Miyamoto","orcid":"https://orcid.org/0000-0001-8397-115X"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]},{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Miyamoto","raw_affiliation_strings":["Research Center for Nanodevices and Systems, Hiroshima University, Higashi-Hiroshima, Hiroshima, Japan","Semiconductor Technology Academic Research Center, Yokohama, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Center for Nanodevices and Systems, Hiroshima University, Higashi-Hiroshima, Hiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Yokohama, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210125918"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.9172,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.84923453,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"e86","issue":null,"first_page":"822","last_page":"825"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12898","display_name":"Induction Heating and Inverter Technology","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.690885066986084},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.6508877873420715},{"id":"https://openalex.org/keywords/harmonic-analysis","display_name":"Harmonic analysis","score":0.5779688358306885},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.5480260848999023},{"id":"https://openalex.org/keywords/harmonic","display_name":"Harmonic","score":0.44832271337509155},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4071803092956543},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38530057668685913},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38322556018829346},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3075186312198639},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2650109529495239},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21557840704917908},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.1883198618888855},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1823396384716034},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.06771501898765564}],"concepts":[{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.690885066986084},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.6508877873420715},{"id":"https://openalex.org/C131770355","wikidata":"https://www.wikidata.org/wiki/Q876215","display_name":"Harmonic analysis","level":2,"score":0.5779688358306885},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.5480260848999023},{"id":"https://openalex.org/C127934551","wikidata":"https://www.wikidata.org/wiki/Q1148098","display_name":"Harmonic","level":2,"score":0.44832271337509155},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4071803092956543},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38530057668685913},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38322556018829346},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3075186312198639},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2650109529495239},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21557840704917908},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1883198618888855},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1823396384716034},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.06771501898765564},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2005.1568797","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2005.1568797","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5699999928474426,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1965204410","https://openalex.org/W2031948980"],"related_works":["https://openalex.org/W2544509054","https://openalex.org/W1977430766","https://openalex.org/W2791161732","https://openalex.org/W2587667458","https://openalex.org/W2743779758","https://openalex.org/W1497667432","https://openalex.org/W2164070943","https://openalex.org/W1861882962","https://openalex.org/W2734931398","https://openalex.org/W2163128389"],"abstract_inverted_index":{"MOSFET":[0,20],"harmonic":[1],"distortion":[2,24],"characteristics":[3,25,34],"up":[4],"to":[5,46,61],"the":[6,19,41,48,64],"cutoff":[7],"frequency":[8,28,37],"(f":[9],"<sub":[10,83],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[11,84],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">T</sub>":[12,85],")":[13],"are":[14,29,38],"measured":[15],"and":[16],"analyzed":[17],"with":[18],"model":[21],"HiSIM.":[22],"While":[23],"at":[26,35,78],"low":[27,51],"determined":[30],"by":[31,40],"carrier":[32],"mobility,":[33],"high":[36],"influenced":[39],"time":[42],"delay":[43],"of":[44,67,72],"carriers":[45],"form":[47],"channel.":[49],"At":[50],"frequency,":[52],"IP3":[53],"values,":[54],"calculated":[55],"using":[56],"a":[57],"quasi-static":[58],"model,":[59],"correspond":[60],"values":[62],"from":[63],"conventional":[65],"method":[66],"extraction.":[68],"For":[69],"accurate":[70],"prediction":[71],"IP3,":[73],"non-quasi-static":[74],"effects":[75],"become":[76],"necessary":[77],"high-frequency":[79],"switching":[80],"above":[81],"f":[82],"/2":[86]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}