{"id":"https://openalex.org/W2161218227","doi":"https://doi.org/10.1109/cicc.2005.1568742","title":"Design guideline for resistive termination of on-chip high-speed interconnects","display_name":"Design guideline for resistive termination of on-chip high-speed interconnects","publication_year":2006,"publication_date":"2006-01-18","ids":{"openalex":"https://openalex.org/W2161218227","doi":"https://doi.org/10.1109/cicc.2005.1568742","mag":"2161218227"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2005.1568742","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2005.1568742","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102949919","display_name":"A. Tsuchiya","orcid":"https://orcid.org/0009-0004-5444-6910"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"A. Tsuchiya","raw_affiliation_strings":["Kyoto University, Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"Osaka University","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Hashimoto","raw_affiliation_strings":["Osaka University, Suita, Osaka, Japan"],"affiliations":[{"raw_affiliation_string":"Osaka University, Suita, Osaka, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026865951","display_name":"Hidetoshi Onodera","orcid":"https://orcid.org/0000-0001-5198-0668"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Onodera","raw_affiliation_strings":["Kyoto University, Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5102949919"],"corresponding_institution_ids":["https://openalex.org/I22299242"],"apc_list":null,"apc_paid":null,"fwci":3.761,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.93271719,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"608","last_page":"611"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.8142615556716919},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.7532497644424438},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.48424360156059265},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4752102792263031},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4590027332305908},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.4561651349067688},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4393481910228729},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3495689630508423},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22789344191551208},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11401939392089844},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10800009965896606}],"concepts":[{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.8142615556716919},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.7532497644424438},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.48424360156059265},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4752102792263031},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4590027332305908},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.4561651349067688},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4393481910228729},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3495689630508423},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22789344191551208},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11401939392089844},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10800009965896606},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2005.1568742","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2005.1568742","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6800000071525574,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1557812913","https://openalex.org/W1575192387","https://openalex.org/W2005846636","https://openalex.org/W2025607754","https://openalex.org/W2089414099","https://openalex.org/W2160799297","https://openalex.org/W3127394485","https://openalex.org/W6651687513"],"related_works":["https://openalex.org/W2347486132","https://openalex.org/W2316789606","https://openalex.org/W2350340797","https://openalex.org/W4293224283","https://openalex.org/W2950501077","https://openalex.org/W2368601041","https://openalex.org/W2079984045","https://openalex.org/W2582182843","https://openalex.org/W2360060283","https://openalex.org/W2744119985"],"abstract_inverted_index":{"This":[0],"paper":[1],"discusses":[2],"the":[3,14,20,24,45,54],"resistive":[4,32],"termination":[5,11,33,46,51],"of":[6,16,47],"on-chip":[7,17,48],"high-performance":[8],"interconnects.":[9,49],"Resistive":[10],"can":[12],"improve":[13],"bandwidth":[15],"interconnects,":[18],"on":[19],"other":[21],"hands,":[22],"increases":[23],"power":[25],"dissipation.":[26],"Therefore":[27],"a":[28,41],"design":[29],"guideline":[30],"for":[31],"is":[34],"necessary.":[35],"In":[36],"this":[37],"paper,":[38],"we":[39],"propose":[40],"method":[42,56],"to":[43,60],"determine":[44],"The":[50],"derived":[52],"by":[53],"proposed":[55],"provides":[57],"minimum":[58],"sensitivity":[59],"process":[61],"variation":[62],"as":[63,65],"well":[64],"maximum":[66],"eye-opening":[67],"in":[68],"voltage":[69]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}