{"id":"https://openalex.org/W2133879971","doi":"https://doi.org/10.1109/cicc.2005.1568735","title":"A phase noise minimization of CMOS VCOs over wide tuning range and large PVT variations","display_name":"A phase noise minimization of CMOS VCOs over wide tuning range and large PVT variations","publication_year":2006,"publication_date":"2006-01-18","ids":{"openalex":"https://openalex.org/W2133879971","doi":"https://doi.org/10.1109/cicc.2005.1568735","mag":"2133879971"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2005.1568735","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2005.1568735","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024598865","display_name":"Daisuke Miyashita","orcid":"https://orcid.org/0000-0003-2108-3397"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"D. Miyashita","raw_affiliation_strings":["SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014272633","display_name":"Hiroki Ishikuro","orcid":"https://orcid.org/0000-0002-9919-9923"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Ishikuro","raw_affiliation_strings":["SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113313009","display_name":"S. Kousai","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Kousai","raw_affiliation_strings":["SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101591670","display_name":"Hiroyuki Kobayashi","orcid":"https://orcid.org/0000-0002-6313-5549"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Kobayashi","raw_affiliation_strings":["SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111752214","display_name":"H. Majima","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Majima","raw_affiliation_strings":["SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108405401","display_name":"K. Agawa","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Agawa","raw_affiliation_strings":["SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068257959","display_name":"Mototsugu Hamada","orcid":"https://orcid.org/0000-0002-0461-4208"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Hamada","raw_affiliation_strings":["SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","SoC R&D Center, Toshiba Corp., Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"SoC Research and Development Center, Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"SoC R&D Center, Toshiba Corp., Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5024598865"],"corresponding_institution_ids":["https://openalex.org/I1292669757"],"apc_list":null,"apc_paid":null,"fwci":3.3849,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.922568,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"35","issue":null,"first_page":"578","last_page":"581"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.7876873016357422},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7179670333862305},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6343612670898438},{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.5820094347000122},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.48734888434410095},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45821163058280945},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4490979313850403},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3646765947341919},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32466036081314087},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.31991761922836304},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.26527971029281616},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2247786819934845},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.21167993545532227},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.07965683937072754}],"concepts":[{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.7876873016357422},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7179670333862305},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6343612670898438},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.5820094347000122},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.48734888434410095},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45821163058280945},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4490979313850403},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3646765947341919},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32466036081314087},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.31991761922836304},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.26527971029281616},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2247786819934845},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.21167993545532227},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.07965683937072754},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2005.1568735","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2005.1568735","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8600000143051147}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1592039898","https://openalex.org/W1907766519","https://openalex.org/W2045153396","https://openalex.org/W2099064239","https://openalex.org/W2110144707","https://openalex.org/W2155367890","https://openalex.org/W2163630970","https://openalex.org/W2788472863","https://openalex.org/W6748995092"],"related_works":["https://openalex.org/W3129408886","https://openalex.org/W4233090067","https://openalex.org/W2365946217","https://openalex.org/W1964543336","https://openalex.org/W2368638770","https://openalex.org/W2365449259","https://openalex.org/W2057338677","https://openalex.org/W2105518569","https://openalex.org/W2285615337","https://openalex.org/W2539579532"],"abstract_inverted_index":{"An":[0],"automatic":[1],"amplitude":[2],"control":[3],"circuit":[4],"to":[5,41,57,65],"minimize":[6],"the":[7],"phase":[8,24],"noise":[9,25],"of":[10],"a":[11,18,35],"LC-VCO":[12],"is":[13,32],"proposed":[14],"and":[15,60],"implemented":[16],"by":[17],"0.18-/spl":[19],"mu/m":[20],"CMOS":[21],"process.":[22],"The":[23],"lower":[26],"than":[27],"-90dBc/Hz":[28],"at":[29],"100kHz":[30],"offset":[31],"achieved":[33],"over":[34],"wide":[36],"tuning":[37],"range":[38],"(from":[39,53,63],"2.2GHz":[40],"2.8GHz)":[42],"under":[43],"large":[44],"process":[45],"(/spl":[46],"Delta/V/sub":[47],"th/":[48],"=":[49],"/spl":[50,54],"plusmn/100mV),":[51],"temperature":[52],"sim/35/spl":[55],"deg/C":[56],"85/spl":[58],"deg/C),":[59],"power":[61],"supply":[62],"1.8V":[64],"3V)":[66],"variations.":[67]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}